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    • 9. 发明申请
    • Methods and apparatuses for programming flash memory using modulated pulses
    • 使用调制脉冲编程闪存的方法和装置
    • US20090273981A1
    • 2009-11-05
    • US12151265
    • 2008-05-05
    • Violante MoschianoTommaso ValiGiovanni SantinWalter Di Francesco
    • Violante MoschianoTommaso ValiGiovanni SantinWalter Di Francesco
    • G11C16/12
    • G11C16/10G11C16/12
    • Methods and apparatuses for programming non-volatile semiconductor memory devices by using modulated pulses are disclosed. Embodiments generally comprise a pulse generator, to create a sequence of pulses and set a threshold voltage of a non-volatile memory cell, and a pulse coupler. Alternative embodiments may include a threshold verifier capable of verifying that the threshold voltage is set within an acceptable voltage range of a target threshold voltage. A pulse width modulator in some apparatus embodiments may modulate the pulse durations early in the sequence when programming fast bits and late in the sequence when programming slow bits. Method embodiments generally comprise generating a sequence of pulses, applying the sequence of pulses to a memory cell to set a threshold voltage of the memory cell, and modulating among pulses in the sequence the parameters of pulse duration, pulse separation time, and step voltage magnitude.
    • 公开了通过使用调制脉冲来编程非易失性半导体存储器件的方法和装置。 实施例通常包括脉冲发生器,以产生脉冲序列并设置非易失性存储单元的阈值电压和脉冲耦合器。 替代实施例可以包括能够验证阈值电压被设置在目标阈值电压的可接受电压范围内的阈值校验器。 某些设备实施例中的脉冲宽度调制器可以在编程快速位时在序列的早期调制脉冲持续时间,而在编程慢位​​时可以在序列的后期调制脉冲持续时间。 方法实施例通常包括产生脉冲序列,将脉冲序列应用于存储器单元以设置存储器单元的阈值电压,以及在该序列中的脉冲之间调制脉冲持续时间,脉冲间隔时间和步进电压幅度的参数 。