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    • 4. 发明授权
    • Accommodative intraocular lens
    • 适应性眼内镜
    • US09023103B2
    • 2015-05-05
    • US13577200
    • 2011-02-14
    • Luis Olcina Portilla
    • Luis Olcina Portilla
    • A61F2/16
    • A61F2/1613A61F2/1629A61F2/1635A61F2/1648A61F2/1694A61F2002/16901
    • Accommodative intraocular lens comprising an optic part (1), which in turn comprises at least one incurving notch (3) and a peripheral edge of the optic (2); a haptic part (8), which in turn comprises at least one central branch (9), one lateral branch (10) and one angular branch of the haptic (11); an incomplete incurving ring (6) that in turn comprises at least one angled branch of the ring (17); an incurving tab (5); and means for sliding and/or stopping and/or amplifying the moving parts. The new accommodative intraocular lens accommodates in near vision by a posteroanterior displacement of the optic, changes in its curvature and changes in its thickness. The design of the incomplete incurving ring allows keeping the capsular bag open and tense to allow a greater displacement of the optic, and the incurving tabs (5) provide a greater accommodation power by curving the optic and increasing its thickness.
    • 包含光学部件(1)的适应性眼内透镜,所述光学部件又包括至少一个弯曲切口(3)和光学部件(2)的外围边缘; 触觉部分(8),其又包括至少一个中心支路(9),一个横向分支(10)和触觉件(11)的一个角分支; 一个不完整的弯曲环(6),其又包括环(17)的至少一个成角度的分支; (5); 以及用于滑动和/或停止和/或放大运动部件的装置。 新的调节性眼内透镜通过光学元件的后视位移,其曲率的变化和其厚度的变化容纳在近视觉中。 不完整的弯曲环的设计允许保持囊袋开放和紧张以允许光学元件的更大的位移,并且通过弯曲光学元件并增加其厚度,弯曲突片(5)提供更大的调节力。
    • 7. 发明授权
    • Control of minimum current in output transistors of an amplifier output stage
    • 控制放大器输出级输出晶体管中的最小电流
    • US08665024B2
    • 2014-03-04
    • US13443024
    • 2012-04-10
    • Alexandre HuffenusSerge Pontarollo
    • Alexandre HuffenusSerge Pontarollo
    • H03F3/26
    • H03F3/265H03F3/3001
    • An amplifier including: an output stage having two first power supply terminals capable of receiving a first voltage defined by first positive and negative variable potentials with respect to a reference potential; and a circuit for controlling the current in transistors of the output stage with a reference value, wherein the output stage includes a first and a second MOS transistors in series between the first two terminals, the junction point of this series association defining an output terminal of the amplifier; the control circuit includes two measurement MOS transistors having their respective sources and gates coupled to the respective sources and gates of the first and second transistors of the output stage; at least one control branch, comprising transistors in series between two terminals of application of a second voltage, defines nodes connected to the gates of the output transistors, said second voltage being greater than the first one.
    • 一种放大器,包括:输出级,具有两个第一电源端子,能够接收相对于参考电位的第一正和负可变电位限定的第一电压; 以及用于以参考值控制所述输出级的晶体管中的电流的电路,其中所述输出级包括串联在所述前两个端子之间的第一和第二MOS晶体管,所述串联关联限定了输出端的输出端 放大器; 控制电路包括两个测量MOS晶体管,它们各自的源极和栅极耦合到输出级的第一和第二晶体管的各个源极和栅极; 包括施加第二电压的两个端子之间串联的晶体管的至少一个控制分支限定连接到输出晶体管的栅极的节点,所述第二电压大于第一电压。
    • 9. 发明授权
    • Analog circuit test device
    • 模拟电路测试装置
    • US08446155B2
    • 2013-05-21
    • US12672612
    • 2008-08-05
    • Florian EspalieuPaul GilettiFrédéric Poullet
    • Florian EspalieuPaul GilettiFrédéric Poullet
    • G01R29/26
    • G01R31/3167G01R31/2841G01R31/3004H03K3/84
    • The invention relates to a test device for an analog circuit to be mounted on a mixed circuit including said analog circuit and a synchronous digital circuit. The test device includes a disturbance emulator connected to a first supply source (UrefD) capable of disturbing a second supply source (UrefA) of the analog circuit, the first and second supply sources being optionally merged, the emulator being adapted for receiving data representative of the evolution, during a given duration, of the average (μI) and the typical deviation (σI) of a first inrush current (I) that would be applied to the first supply source by the digital circuit, and being adapted for applying to the first supply source during successive intervals, each successive interval having said duration, a second inrush current (Irep) equal to the sum of the average and of the product of the typical deviation and of a pseudo-random signal varying according to a Gaussian law.
    • 本发明涉及一种用于将模拟电路安装在包括所述模拟电路和同步数字电路的混合电路上的测试装置。 测试装置包括连接到能够干扰模拟电路的第二电源(UrefA)的第一电源(UrefD)的干扰仿真器,所述第一和第二电源可选地被合并,所述仿真器适于接收代表 在给定持续时间内,由数字电路施加到第一电源的第一浪涌电流(I)的平均值(μI)和典型偏差(sigma)的演化,并适用于 在连续间隔期间的第一供电源,每个连续间隔具有所述持续时间,第二涌入电流(Irep)等于典型偏差的平均值乘积和根据高斯定律变化的伪随机信号的乘积之和。