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    • 1. 发明申请
    • One transistor memory cell having strained electrically floating body region, and method of operating same
    • 具有应变电浮动体区域的一个晶体管存储单元及其操作方法
    • US20070085140A1
    • 2007-04-19
    • US11580169
    • 2006-10-12
    • Cedric Bassin
    • Cedric Bassin
    • H01L27/12
    • H01L29/7841H01L27/108H01L27/10802
    • A semiconductor memory cell comprising a transistor having (i) an electrically floating body region and (ii) semiconductor source, drain and/or body regions that are “locally” or “globally” under mechanical strain (for example, strain introduced via tensile or compressive forces). The semiconductor memory cell includes (1) a first data state which corresponds to a first charge in the electrically floating body region of the transistor of the memory cell, and (2) a second data state which corresponds to a second charge in the electrically floating body region of the transistor of the memory cell. The semiconductor memory cell may comprise a portion of an integrated circuit device, for example, logic device (such as, a microcontroller or microprocessor) or a portion of a memory device (such as, a discrete memory). A plurality of such memory cells may be arranged to form a memory cell array.
    • 一种半导体存储单元,包括晶体管,其具有(i)电浮动体区域和(ii)在机械应变(例如通过拉伸或拉伸或拉伸)引入的应变的情况下“局部地”或“全局地”的半导体源,漏极和/或主体区域 压缩力)。 半导体存储单元包括(1)对应于存储单元的晶体管的电浮体区域中的第一电荷的第一数据状态,和(2)对应于电浮置中的第二电荷的第二数据状态 存储单元晶体管的体区。 半导体存储单元可以包括集成电路器件的一部分,例如逻辑器件(诸如微控制器或微处理器)或存储器件(例如,分立存储器)的一部分。 可以布置多个这样的存储单元以形成存储单元阵列。