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    • 3. 发明授权
    • Semiconductor memory cell and array using punch-through to program and read same
    • 半导体存储单元和阵列使用穿通来编程和读取相同
    • US07933142B2
    • 2011-04-26
    • US11796935
    • 2007-04-30
    • Serguei OkhoninMikhail Nagoga
    • Serguei OkhoninMikhail Nagoga
    • G11C11/34
    • G11C11/404G11C2211/4016H01L27/108H01L27/10802H01L29/7841
    • An integrated circuit device (for example, logic or discrete memory device) comprising a memory cell including a punch-through mode transistor, wherein the transistor includes a source region, a drain region, a gate, a gate insulator, and a body region having a storage node which is located, at least in part, immediately beneath the gate insulator. The memory cell includes at least two data states which are representative of an amount of charge in the storage node in the body region. First circuitry is coupled to the punch-through mode transistor of the memory cell to: (1) generate first and second sets of write control signals, and (2a) apply the first set of write control signals to the transistor to write a first data state in the memory cell and (2b) apply the second set of write control signals to the transistor to write a second data state in the memory cell. In response to the first set of write control signals, the punch-through mode transistor provides at least the first charge in the body region via impact ionization. The transistor may be disposed on a bulk-type substrate or SOI-type substrate.
    • 一种集成电路器件(例如逻辑或分立存储器件),包括一个包括穿通型晶体管的存储单元,其中该晶体管包括一个源极区,一个漏极区,一个栅极,一个栅极绝缘体,以及一个具有 存储节点至少部分地位于栅极绝缘体的正下方。 存储单元包括代表身体区域中的存储节点中的电荷量的至少两个数据状态。 第一电路耦合到存储单元的穿通模式晶体管,以:(1)产生第一和第二组写入控制信号,以及(2a)将第一组写入控制信号施加到晶体管以写入第一数据 状态,并且(2b)将第二组写入控制信号施加到晶体管以在存储器单元中写入第二数据状态。 响应于第一组写入控制信号,穿通模式晶体管经由冲击电离至少提供身体区域中的第一电荷。 晶体管可以设置在体型衬底或SOI型衬底上。
    • 5. 发明授权
    • Memory cell and memory cell array having an electrically floating body transistor, and methods of operating same
    • 具有电浮体晶体管的存储单元和存储单元阵列及其操作方法
    • US07606066B2
    • 2009-10-20
    • US11509188
    • 2006-08-24
    • Serguei OkhoninMikhail Nagoga
    • Serguei OkhoninMikhail Nagoga
    • G11C11/34
    • G11C11/409G11C11/404G11C11/4067G11C11/4076H01L27/108H01L27/10802H01L27/1203H01L29/7841
    • A technique of writing, programming, holding, maintaining, sampling, sensing, reading and/or determining the data state of a memory cell of a memory cell array (for example, a memory cell array having a plurality of memory cells which consist of an electrically floating body transistor). In one aspect, the present inventions are directed to techniques to control and/or operate a semiconductor memory cell (and memory cell array having a plurality of such memory cells as well as an integrated circuit device including a memory cell array) having one or more electrically floating body transistors in which an electrical charge is stored in the body region of the electrically floating body transistor. The techniques of the present inventions may employ bipolar transistor currents to control, write and/or read a data state in such a memory cell. In this regard, the present inventions may employ a bipolar transistor current to control, write and/or read a data state in/of the electrically floating body transistor of the memory cell.
    • 写入,编程,保持,维护,采样,感测,读取和/或确定存储器单元阵列的存储器单元的数据状态(例如,具有多个存储器单元的存储器单元阵列的技术) 电浮体晶体管)。 一方面,本发明涉及用于控制和/或操作半导体存储单元(以及具有多个这样的存储单元的存储单元阵列以及包括存储单元阵列的集成电路器件)的技术,该半导体存储单元具有一个或多个 电浮动体晶体管,其中电荷存储在电浮体晶体管的体区中。 本发明的技术可以采用双极晶体管电流来控制,写入和/或读取这种存储单元中的数据状态。 在这方面,本发明可以采用双极晶体管电流来控制,写入和/或读取存储单元的电浮体晶体管中的数据状态。
    • 6. 发明申请
    • Semiconductor memory device and method of operating same
    • 半导体存储器件及其操作方法
    • US20070159911A1
    • 2007-07-12
    • US11713284
    • 2007-03-02
    • Richard FerrantSerguei OkhoninEric CarmanMichel Bron
    • Richard FerrantSerguei OkhoninEric CarmanMichel Bron
    • G11C8/00
    • G11C11/404G11C7/18G11C8/08G11C11/406G11C11/40618G11C11/4097G11C2211/4016G11C2211/4065H01L21/84H01L27/10802H01L27/10844H01L27/1203H01L29/7841
    • There are many inventions described and illustrated herein. In a first aspect, the present invention is directed to a memory device and technique of reading data from and writing data into memory cells of the memory device. In this regard, in one embodiment of this aspect of the invention, the memory device and technique for operating that device that minimizes, reduces and/or eliminates the debilitating affects of the charge pumping phenomenon. This embodiment of the present invention employs control signals that minimize, reduce and/or eliminate transitions of the amplitudes and/or polarities. In another embodiment, the present invention is a semiconductor memory device including a memory array comprising a plurality of semiconductor dynamic random access memory cells arranged in a matrix of rows and columns. Each semiconductor dynamic random access memory cell includes a transistor having a source region, a drain region, a electrically floating body region disposed between and adjacent to the source region and the drain region, and a gate spaced apart from, and capacitively coupled to, the body region. Each transistor includes a first state representative of a first charge in the body region, and a second data state representative of a second charge in the body region. Further, each row of semiconductor dynamic random access memory cells includes an associated source line which is connected to only the semiconductor dynamic random access memory cells of the associated row.
    • 这里描述和说明了许多发明。 在第一方面,本发明涉及一种从数据读取和将数据写入存储器件的存储单元的存储器件和技术。 在这方面,在本发明的这个方面的一个实施例中,用于操作该装置的存储器件和技术使得最小化,减少和/或消除电荷泵送现象的衰弱影响。 本发明的该实施例采用最小化,减少和/或消除幅度和/或极性的转变的控制信号。 在另一个实施例中,本发明是一种包括存储阵列的半导体存储器件,该存储器阵列包括以行和列的矩阵排列的多个半导体动态随机存取存储器单元。 每个半导体动态随机存取存储单元包括晶体管,其具有源极区,漏极区,设置在源极区和漏极区之间且与源极区和漏极区相邻的电浮动体区域,以及与该区域和漏极区域间隔开并电容耦合的栅极 身体区域。 每个晶体管包括代表身体区域中的第一电荷的第一状态和代表身体区域中的第二电荷的第二数据状态。 此外,每排半导体动态随机存取存储器单元包括仅与相关行的半导体动态随机存取存储单元连接的相关联的源极线。