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    • 2. 发明申请
    • Spectral Measuring System
    • 光谱测量系统
    • US20100072368A1
    • 2010-03-25
    • US12525425
    • 2008-01-28
    • Urs BoegliPhilipp BachmannDieter Lubkoll
    • Urs BoegliPhilipp BachmannDieter Lubkoll
    • H01L27/14
    • G01N21/3581G01J3/10G01J3/42G01J3/4338G01N21/3563
    • A spectral measuring system for determining substance properties using terahertz radiation comprises: one or more radiation sources of which at least one radiation source is adjustable or configurable with regard to its wavelength, wherein the first radiation source emits first radiation at a predetermined first wavelength; and is characterised by a sensor which responds to further radiation which is based on the radiation of the at least one radiation source; a control unit which is connected to the at least one radiation source and the sensor; wherein the control unit is configured to trigger at least one radiation source and to adjust the wavelength of the at least one adjustable radiation source as well as to read out the sensor.
    • 用于使用太赫兹辐射确定物质性质的光谱测量系统包括:一个或多个辐射源,其至少一个辐射源相对于其波长是可调节的或可配置的,其中第一辐射源以预定的第一波长发射第一辐射; 并且其特征在于响应于基于所述至少一个辐射源的辐射的另外的辐射的传感器; 连接到所述至少一个辐射源和所述传感器的控制单元; 其中所述控制单元被配置为触发至少一个辐射源并且调整所述至少一个可调节辐射源的波长以及读出所述传感器。