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1. 发明授权

US11113543B2 Facility inspection system and facility inspection method 有权
公开(公告)号：US11113543B2
公开(公告)日：2021-09-07
申请号：US16465373
申请日：2017-12-01
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Nobuhiro Chihara , Masahiko Honda , Toshihide Kishi , Masashi Shinbo , Kiyotake Horie
IPC分类号： G06K9/00 , B60M1/28 , B61L15/00 , B61L23/00 , G01B11/00
摘要： A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a photographing device, storage device, separation unit, an alignment unit, and a extraction unit. The photographing device photographs the surrounding environment of the moving vehicle. The storage device stores a reference alignment point cloud and a reference difference-extraction point cloud for each position on the track. The separation unit separates the alignment point cloud from a three-dimensional point cloud. The alignment unit aligns the reference alignment point cloud and the alignment point cloud and outputs alignment information. The extraction unit extracts a difference between the three-dimensional point cloud deformed based on the alignment information and the reference difference-extraction point cloud.

2. 发明申请

US20190392225A1 FACILITY INSPECTION SYSTEM AND FACILITY INSPECTION METHOD 审中-公开
公开(公告)号：US20190392225A1
公开(公告)日：2019-12-26
申请号：US16465373
申请日：2017-12-01
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Nobuhiro CHIHARA , Masahiko HONDA , Toshihide KISHI , Masashi SHINBO , Kiyotake HORIE
IPC分类号： G06K9/00 , G01B11/00 , B60M1/28 , B61L15/00 , B61L23/00
摘要： A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a photographing device, storage device, separation unit, an alignment unit, and a extraction unit. The photographing device photographs the surrounding environment of the moving vehicle. The storage device stores a reference alignment point cloud and a reference difference-extraction point cloud for each position on the track. The separation unit separates the alignment point cloud from a three-dimensional point cloud. The alignment unit aligns the reference alignment point cloud and the alignment point cloud and outputs alignment information. The extraction unit extracts a difference between the three-dimensional point cloud deformed based on the alignment information and the reference difference-extraction point cloud.

3. 发明授权

US11044838B2 Railway equipment inspecting and measuring apparatus, and railway equipment inspecting and measuring method 有权
公开(公告)号：US11044838B2
公开(公告)日：2021-06-22
申请号：US16355539
申请日：2019-03-15
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Hideyasu Suzuki , Takeshi Kurokawa , Tomohiko Kai , Masaki Araki , Tomoya Sasaki , Takeshi Iga , Tomoharu Isozaki , Noritake Shizawa , Keishin Hamaoka , Takahiro Daikoku
IPC分类号： H05K7/20 , B60M1/13 , B60M1/28 , F25B21/02 , B60M1/12
摘要： Effectively control the temperature of a control unit of a railway equipment inspecting and measuring apparatus, and install the control unit of the railway equipment inspecting and measuring on the roof of the passenger car. The first space is formed between the control unit and the heat insulating case. The second space is formed between the heat insulating case and the cover. In the first space, heat is conducted between the air in the first space and the heat exchange element by the first heat conducting member, and the first fan causes circulation of the air in the first space. In the second space, heat is conducted between the air in the second space and the heat exchange element by the second heat conducting member, and the air inside the second space is diffused by blowing the air from a suction port into the second space with the second fan.

4. 发明授权

US10989694B2 Rail inspection system 有权
公开(公告)号：US10989694B2
公开(公告)日：2021-04-27
申请号：US16468632
申请日：2017-09-11
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Ryuzo Kawabata , Hiroshi Suzuki , Kenji Yamamoto , Akihiko Kandori
IPC分类号： G01N27/82 , G01N27/83 , B61K9/10 , B61L23/04
摘要： Provided is a rail inspection system capable of accurately detecting a defect of a railroad rail. The system includes: a sensor part group that has a plurality of sensor parts having receiver coils, and first oscillator coils and second oscillator coils corresponding to the receiver coils being arranged in a line parallel in a width direction of a railroad rail to be inspected; an oscillation part that supplies an oscillation signal to each of the first oscillator coils and the second oscillator coils; and a detection part group that has a plurality of detection parts to detect, with respect to an output signal from each of the receiver coils when the sensor part group moves in a laying direction of the railroad rail, a first inspection signal corresponding to a first phase of the output signal and a second inspection signal corresponding to a second phase of the output signal.

5. 发明授权

US09304145B2 Inspection method and its apparatus for thermal assist type magnetic head element 有权
标题翻译：检测方法及其热辅助型磁头元件装置
公开(公告)号：US09304145B2
公开(公告)日：2016-04-05
申请号：US14813306
申请日：2015-07-30
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Kaifeng Zhang , Takenori Hirose , Masahiro Watanabe , Toshinori Sugiyama , Akira Tobita
IPC分类号： G01Q20/02
CPC分类号： G01Q20/02 , G01Q60/06 , G01Q60/08
摘要： To detect near-field light, which is generated by a thermal assist type magnetic head element, and leaking light with high sensitivity and to more accurately obtain the spatial intensity distribution of a near-field light generation area, an inspection apparatus for a thermal assist type magnetic head element is adapted so that a distance between a cantilever and the surface of a specimen and the excitation amplitude of the cantilever are set to be small to detect near-field light with high sensitivity by the suppression of an influence of other light components, a distance between the cantilever and the surface of the specimen and the excitation amplitude of the cantilever are set to be large to detect other light components present in the vicinity of near-field light with high sensitivity by the suppression of an influence of the amount of detected near-field light when other light components are measured.
摘要翻译：为了检测由热辅助型磁头元件产生的近场光和具有高灵敏度的泄漏光并且更精确地获得近场光产生区域的空间强度分布，用于热辅助的检查装置适于使悬臂与样品表面之间的距离和悬臂的激发振幅设定得较小，以便通过抑制其它光成分的影响来检测具有高灵敏度的近场光将悬臂与试样的表面之间的距离和悬臂的激发振幅设定得较大，以通过抑制量的影响来高灵敏度地检测存在于近场光附近的其他光分量当测量其他光分量时，检测到的近场光。

6. 发明申请

US20160033548A1 INSPECTION METHOD AND ITS APPARATUS FOR THERMAL ASSIST TYPE MAGNETIC HEAD ELEMENT 有权
标题翻译：检验方法及其辅助类型磁头元件的设备
公开(公告)号：US20160033548A1
公开(公告)日：2016-02-04
申请号：US14813306
申请日：2015-07-30
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Kaifeng ZHANG , Takenori HIROSE , Masahiro WATANABE , Toshinori SUGIYAMA , Akira TOBITA
IPC分类号： G01Q20/02
CPC分类号： G01Q20/02 , G01Q60/06 , G01Q60/08
摘要： To detect near-field light, which is generated by a thermal assist type magnetic head element, and leaking light with high sensitivity and to more accurately obtain the spatial intensity distribution of a near-field light generation area, an inspection apparatus for a thermal assist type magnetic head element is adapted so that a distance between a cantilever and the surface of a specimen and the excitation amplitude of the cantilever are set to be small to detect near-field light with high sensitivity by the suppression of an influence of other light components, a distance between the cantilever and the surface of the specimen and the excitation amplitude of the cantilever are set to be large to detect other light components present in the vicinity of near-field light with high sensitivity by the suppression of an influence of the amount of detected near-field light when other light components are measured.
摘要翻译：为了检测由热辅助型磁头元件产生的近场光和具有高灵敏度的泄漏光并且更精确地获得近场光产生区域的空间强度分布，用于热辅助的检查装置适于使悬臂与样品表面之间的距离和悬臂的激发振幅设定得较小，以便通过抑制其它光成分的影响来检测具有高灵敏度的近场光将悬臂与试样的表面之间的距离和悬臂的激发振幅设定得较大，以通过抑制量的影响来高灵敏度地检测存在于近场光附近的其他光分量当测量其他光分量时，检测到的近场光。

7. 发明申请

US20200047779A1 Vehicle size measurement apparatus and vehicle size measuring method 审中-公开
公开(公告)号：US20200047779A1
公开(公告)日：2020-02-13
申请号：US16534848
申请日：2019-08-07
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： UENO TAKETO
IPC分类号： B61K9/02 , G01B11/02 , G01B9/02 , G01B11/10 , G01B11/24 , B61K9/12
摘要： An object of the invention is to measure an outside size of the vehicle accurately while running the vehicle. A plurality of the 1st sensors 25, 26 irradiate inspection lights to a plurality of places (4a) of the vehicle 4 of a railroad and output measurement signals which show positions and distances by receiving lights from a plurality of the places of the vehicle 4. The 2nd sensor 27, 28 or 29 irradiates an inspection light to an outside surface of the vehicle 4 and outputs a measurement signal which shows a position and a distance by receiving a light from the outside surface of the vehicle 4. The control equipment 30 or the processing equipment 41 processes the measurement signals outputted from a plurality of the 1st sensors 25, 26, detects positions and heights of a plurality of the places of the vehicle 4, processes the measurement signal outputted from the 2nd sensor 27, 28 or 29, and detects the outside size of the vehicle 4. And the control equipment 30 or the processing equipment 41 calculates amounts of a deviation of the outside surface of the vehicle 4 due to a swing of the vehicle 4 based on amounts of fluctuations of the detected positions and heights of a plurality of the places of the vehicle 4, and corrects the detected outside size of the vehicle 4 according to the calculated amounts of the deviation.

8. 发明申请

US20200378750A1 OVERHEAD WIRE MUTUAL SEPARATING SITUATION MEASURING APPARATUS AND OVERHEAD WIRE MUTUAL SEPARATING SITUATION MEASURING METHOD 审中-公开
公开(公告)号：US20200378750A1
公开(公告)日：2020-12-03
申请号：US16886739
申请日：2020-05-28
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Masahisa WATANABE , Masaki ARAKI , Shusaku UTSUGI , Toshio EIFUKU
IPC分类号： G01B11/14 , B60L9/00 , B60M1/12
摘要： An overhead wire mutual separating situation measuring apparatus detects separation of overhead wires with high accuracy in a manner that the overhead wires are placed with a predetermined amount of deviation. A light projecting unit irradiates overhead wires above a railway with a measuring light spreading in a strip shape in the width direction of the railway. Light receiving units receive light reflected by all or a portion of the overhead wires from the measuring light to output a measurement signal indicative of a contour of the overhead wires. Each light receiving unit mutually partially overlaps a measurement area such that the overhead wires within a predetermined measurement area fall within the measurement visual area of at least one light receiving unit. The processing device processes the measurement signal from each light receiving unit to detect a mutual separation of the overhead wires and the positional deviation thereof.

9. 发明申请

US20190297750A1 RAILWAY EQUIPMENT INSPECTING AND MEASURING APPARATUS, AND RAILWAY EQUIPMENT INSPECTING AND MEASURING METHOD 审中-公开
公开(公告)号：US20190297750A1
公开(公告)日：2019-09-26
申请号：US16355539
申请日：2019-03-15
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Hideyasu SUZUKI , Takeshi KUROKAWA , Tomohiko KAI , Masaki ARAKI , Tomoya SASAKI , Takeshi IGA , Tomoharu ISOZAKI , Noritake SHIZAWA , Keishin HAMAOKA , Takahiro DAIKOKU
IPC分类号： H05K7/20 , F25B21/02 , B60M1/28 , B60M1/13
摘要： Effectively control the temperature of a control unit of a railway equipment inspecting and measuring apparatus, and install the control unit of the railway equipment inspecting and measuring on the roof of the passenger car. The first space is formed between the control unit and the heat insulating case. The second space is formed between the heat insulating case and the cover. In the first space, heat is conducted between the air in the first space and the heat exchange element by the first heat conducting member, and the first fan causes circulation of the air in the first space. In the second space, heat is conducted between the air in the second space and the heat exchange element by the second heat conducting member, and the air inside the second space is diffused by blowing the air from a suction port into the second space with the second fan.

10. 发明申请

US20160216216A1 MAGNETIC DISK INSPECTION DEVICE AND MAGNETIC DISK INSPECTION METHOD 审中-公开
标题翻译：磁盘检查装置和磁盘检查方法
公开(公告)号：US20160216216A1
公开(公告)日：2016-07-28
申请号：US14917701
申请日：2014-09-11
申请人： HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
发明人： Shigeru SERIKAWA , Takayuki ISHIGURO
IPC分类号： G01N21/95 , G01N21/88
CPC分类号： G01N21/95 , G01N21/8806 , G01N21/8851 , G01N2201/06113 , G01N2201/103 , G11B5/84
摘要： To increase horizontal resolution while preventing the depth of focus, a magnetic disk inspection device is configured: a table part which has a spindle shaft and a stage; a lighting system which irradiates a magnetic disk; a specularly reflected light detection optical system; a scattered light detection optical system; and a signal processing unit which processes outputs from the specularly reflected light detection optical system and the scattered light detection optical system and detects a defect, in which the scattered light detection optical system is provided with a lens system and a photoelectric converter having a plurality of photoelectric conversion elements arranged in an array, and using the lens system, forms an image of the scattered light on the photoelectric converter, which is long in one direction and thinner than the width of the photoelectric conversion element in a direction perpendicular to the direction of the arrangement in an array.
摘要翻译：为了在防止焦深的同时提高水平分辨率，磁盘检查装置被构造成：具有主轴和台的台部; 照射系统，照射磁盘; 镜面反射光检测光学系统; 散射光检测光学系统; 以及信号处理单元，其处理来自镜面反射光检测光学系统和散射光检测光学系统的输出，并且检测散射光检测光学系统设置有透镜系统的缺陷和具有多个以阵列布置的光电转换元件，并且使用透镜系统，在与光电转换元件的方向垂直的方向上在一个方向上长并且比光电转换元件的宽度更薄的光电转换器上形成散射光的图像阵列中的排列。

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