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1. 发明申请

US20180356374A1 DETECTION OF A SUSPECT COUNTERFEIT PART BY CHROMATOGRAPHY 审中-公开
公开(公告)号：US20180356374A1
公开(公告)日：2018-12-13
申请号：US15882473
申请日：2018-01-29
申请人： IEC Electronics Corp.
发明人： Mark Northrup
IPC分类号： G01N30/56 , G01R31/28 , H01L23/00
CPC分类号： G01N30/56 , G01R31/2896 , H01L23/57 , H01L24/01 , H01L2924/14
摘要： Parts are exposed to liquid chromatography to generate a corresponding chromatogram, wherein the chromatogram is compared to a chromatogram of a genuine part to determine if the tested part is suspect counterfeit. Depending on the selected predetermined target analytes, the generated chromatogram can be used to assess an associated manufacturing process as conforming or non-conforming.

2. 发明授权

US11102921B2 Electrically testing cleanliness of a panel having an electronic assembly 有权
公开(公告)号：US11102921B2
公开(公告)日：2021-08-24
申请号：US16279513
申请日：2019-02-19
申请人： IEC Electronics Corp.
发明人： Mark Northrup
IPC分类号： G01R31/28 , H01L21/66 , H05K13/08
摘要： A method of assessing a cleanliness of an assembly in a panel during a manufacturing process is provided, wherein an electrical signal of at least one of a predetermined voltage, current or frequency is applied across a first subset and a second subset of nonconnected electrical contacts in a test coupon associated with the assembly, such that the first subset and the second subset have different pitches. In one configuration, the test coupon is tested at higher voltages, currents or frequencies to a point of failure or above a predetermined threshold.

3. 发明申请

US20200267880A1 ELECTRICALLY TESTING CLEANLINESS OF A PANEL HAVING AN ELECTRONIC ASSEMBLY 审中-公开
公开(公告)号：US20200267880A1
公开(公告)日：2020-08-20
申请号：US16279513
申请日：2019-02-19
申请人： IEC Electronics Corp.
发明人： Mark Northrup
IPC分类号： H05K13/08 , H01L21/66 , G01R31/28
摘要： A method of assessing a cleanliness of an assembly in a panel during a manufacturing process is provided, wherein an electrical signal of at least one of a predetermined voltage, current or frequency is applied across a first subset and a second subset of nonconnected electrical contacts in a test coupon associated with the assembly, such that the first subset and the second subset have different pitches. In one configuration, the test coupon is tested at higher voltages, currents or frequencies to a point of failure or above a predetermined threshold.

4. 发明申请

US20150078518A1 SYSTEM AND METHOD FOR COUNTERFEIT IC DETECTION 有权
标题翻译：用于计数器IC检测的系统和方法
公开(公告)号：US20150078518A1
公开(公告)日：2015-03-19
申请号：US14488553
申请日：2014-09-17
申请人： IEC Electronics Corp.
发明人： Achilleas Tziazas , Mark Northrup , Daniel F. Martinelli
IPC分类号： G06T7/00 , G01N23/223 , G01N23/203 , G01N23/04 , G01N21/84
CPC分类号： G06T7/001 , G01N21/84 , G01N23/046 , G01N23/203 , G01N23/223 , G01N2021/95638 , G06K9/6202 , G06T2207/10116 , G06T2207/30148
摘要： A method for counterfeit IC detection includes: providing a computer, an optical and an X-ray imager; optically imaging a package of one or more ICs; pattern matching the package image to identify an IC type; selecting one or more reference images from a reference library; X-ray imaging one or more ICs; performing in any order: comparing an internal lead frame structure of the one or more ICs to images from the reference library to determine a first numerical indicator; and determining a composition of the lead frame of the one or more ICs and to a corresponding composition from the reference library to determine a second numerical indicator; calculating an indication of authenticity based on the first numerical indicator and the second numerical indicator; and accepting or rejecting the one or more ICs based on the indication of authenticity. A system for counterfeit IC detection is also described.
摘要翻译：一种用于伪造IC检测的方法包括：提供计算机，光学和X射线成像仪; 对一个或多个IC的封装进行光学成像; 模式匹配包图像以识别IC类型; 从参考库中选择一个或多个参考图像; 一个或多个IC的X射线成像; 以任何顺序执行：将一个或多个IC的内部引线框架结构与来自参考库的图像进行比较以确定第一数字指示符; 以及确定所述一个或多个IC的引线框架的组成和来自所述参考库的相应组合物以确定第二数字指示器; 基于第一数字指示符和第二数字指示器计算真实性的指示; 并基于真实性的指示接受或拒绝一个或多个IC。还描述了用于伪造IC检测的系统。

5. 发明授权

US11125731B2 Detection of a suspect counterfeit part by chromatography 有权
公开(公告)号：US11125731B2
公开(公告)日：2021-09-21
申请号：US15882473
申请日：2018-01-29
申请人： IEC Electronics Corp.
发明人： Mark Northrup
IPC分类号： G01R31/28 , H01L23/00 , G01N30/88 , G01N30/86 , B01D15/36 , G01N30/06 , G01N30/96 , G01N30/04 , G01N30/56
摘要： Parts are exposed to liquid chromatography to generate a corresponding chromatogram, wherein the chromatogram is compared to a chromatogram of a genuine part to determine if the tested part is suspect counterfeit. Depending on the selected predetermined target analytes, the generated chromatogram can be used to assess an associated manufacturing process as conforming or non-conforming.

6. 发明授权

US09646373B2 System and method for counterfeit IC detection 有权
公开(公告)号：US09646373B2
公开(公告)日：2017-05-09
申请号：US14488553
申请日：2014-09-17
申请人： IEC Electronics Corp.
发明人： Achilleas Tziazas , Mark Northrup , Daniel F. Martinelli
IPC分类号： G01N23/04 , G06T7/00 , G01N21/84 , G06K9/62 , G01N23/203 , G01N23/223 , G01N21/956
CPC分类号： G06T7/001 , G01N21/84 , G01N23/046 , G01N23/203 , G01N23/223 , G01N2021/95638 , G06K9/6202 , G06T2207/10116 , G06T2207/30148
摘要： A method for counterfeit IC detection includes: providing a computer, an optical and an X-ray imager; optically imaging a package of one or more ICs; pattern matching the package image to identify an IC type; selecting one or more reference images from a reference library; X-ray imaging one or more ICs; performing in any order: comparing an internal lead frame structure of the one or more ICs to images from the reference library to determine a first numerical indicator; and determining a composition of the lead frame of the one or more ICs and to a corresponding composition from the reference library to determine a second numerical indicator; calculating an indication of authenticity based on the first numerical indicator and the second numerical indicator; and accepting or rejecting the one or more ICs based on the indication of authenticity. A system for counterfeit IC detection is also described.

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