会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Refrigerating apparatus and method of controlling the same
    • 制冷装置及其控制方法
    • US08745993B2
    • 2014-06-10
    • US12801022
    • 2010-05-17
    • Sang Hoon LeeJi Young LeeMasatoshi Inatani
    • Sang Hoon LeeJi Young LeeMasatoshi Inatani
    • F25D25/00
    • F25D29/00F25D17/045F25D17/065F25D2700/122F25D2700/16
    • Disclosed herein are a refrigerating apparatus and a method of controlling the same. The method includes lowering a temperature in a storage chamber to a freezing point temperature zone by adjusting cold air supplied to the storage chamber, and lowering the temperature in the storage chamber to a temperature below a freezing point by increasing an amount of the cold air supplied to the storage chamber, when it is determined that a temperature of articles stored in the storage chamber is stabilized in the freezing point temperature zone by the cold air. When the surface temperature and the center temperature of the stored articles are cooled close to the freezing point and are then cooled again to the freezing temperature below the freezing point, super-cooling of the stored articles is carried out for a short time, the surfaces and the centers of the stored articles start to freeze simultaneously.
    • 本文公开了一种制冷装置及其控制方法。 该方法包括通过调节供给储存室的冷空气将储存室内的温度降低到冰点温度区域,并且通过增加供应的冷空气量将储存室中的温度降低到低于冰点的温度 当确定存储在储藏室中的物品的温度在冷冻温度区域中稳定在储存室时。 当将储存物品的表面温度和中心温度冷却到冰点附近,然后再次冷却到低于冰点的冷冻温度时,储存物品的过冷却进行很短时间,表面 存储物品的中心开始同时冻结。
    • 7. 发明授权
    • Semiconductor device having fine contacts and method of fabricating the same
    • 具有微细接触的半导体器件及其制造方法
    • US08242018B2
    • 2012-08-14
    • US12943142
    • 2010-11-10
    • Ji-young LeeHyun-jae KangSang-gyun Woo
    • Ji-young LeeHyun-jae KangSang-gyun Woo
    • H01L21/44
    • H01L21/76816H01L21/76897
    • A semiconductor device has a structure of contacts whose size and pitch are finer that those that can be produced under the resolution provided by conventional photolithography. The contact structure includes a semiconductor substrate, an interlayer insulating layer disposed on the substrate, annular spacers situated in the interlayer insulating layer, first contacts surrounded by the spacers, and a second contact buried in the interlayer insulating layer between each adjacent pair of the first spacers. The contact structure is formed by forming first contact holes in the interlayer insulating layer, forming the spacers over the sides of the first contact holes to leave second contact holes within the first contact holes, etching the interlayer insulating layer from between the spacers using the first spacers as an etch mask to form third contact holes, and filling the first and second contact holes with conductive material. In this way, the pitch of the contacts can be half that of the first contact holes.
    • 半导体器件具有接触的结构,其尺寸和间距比通过常规光刻提供的分辨率可以产生的那些更小。 所述接触结构包括半导体衬底,设置在所述衬底上的层间绝缘层,位于所述层间绝缘层中的环形间隔物,被所述间隔物包围的第一接触部以及埋在所述层间绝缘层中的每个相邻的所述第一接触层 间隔物 接触结构通过在层间绝缘层中形成第一接触孔而形成,在第一接触孔的侧面上形成间隔物以在第一接触孔内留下第二接触孔,使用第一接触孔从间隔物之间​​蚀刻层间绝缘层 间隔物作为蚀刻掩模以形成第三接触孔,并且用导电材料填充第一和第二接触孔。 以这种方式,触点的间距可以是第一接触孔的间距的一半。
    • 10. 发明申请
    • APPARATUS AND METHOD OF DETECTING A DEFECTIVE SECTOR IN A DISK DRIVE
    • 检测磁盘驱动器中缺陷部分的装置和方法
    • US20110249358A1
    • 2011-10-13
    • US13085657
    • 2011-04-13
    • Ji-young LEEMan-sik Sim
    • Ji-young LEEMan-sik Sim
    • G11B5/02
    • G11B20/1816G11B2220/2516
    • A method and apparatus to detect a defective sector include features of determining a first error value by counting the number of error symbols in first data read from a sector by using a head in an on-track state, and reading second data from the sector by off-tracking the head in a positive direction and third data from the sector by off-tracking the head in a negative direction in response to the first error value being equal to or greater than a first threshold value. Additionally, a second error value is determined based on the number of error symbols in the read second data and a third error value is determined based on the number of error symbols in the read third data. Accordingly, the sector is determined to have a defect by comparing an average of the second and third error values to a second threshold value.
    • 用于检测缺陷扇区的方法和装置包括通过使用在轨道状态下的头从扇区读取的第一数据中的误差符号的数量进行计数来确定第一误差值的特征,以及从扇区读取第二数据, 响应于第一误差值等于或大于第一阈值,通过以负方向偏移磁头来从正向切向磁头和来自扇区的第三数据。 此外,基于读取的第二数据中的错误符号的数量确定第二错误值,并且基于读取的第三数据中的错误符号的数量来确定第三错误值。 因此,通过将第二和第三误差值的平均值与第二阈值进行比较来确定扇区具有缺陷。