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    • 2. 发明申请
    • Automatic Detection of a CMOS Device in Latch-Up and Cycling of Power Thereto
    • 自动检测CMOS器件的锁存和循环功率
    • US20080151456A1
    • 2008-06-26
    • US12044315
    • 2008-03-07
    • Joseph Harry Julicher
    • Joseph Harry Julicher
    • H02H9/02
    • G06F1/28G06F1/305H01L27/0251H01L27/0921
    • A monitoring and protection circuit associated with a voltage regulator supplying power to a CMOS device can sense over current levels precisely enough for determining if a fault has occurred in a circuit of the CMOS device, e.g., latch-up, failed or shorted transistor, etc., then this monitoring and protection circuit may automatically generate a fault alert signal and/or cycle power to the CMOS device when an unexpected over current may occur, e.g., CMOS circuit latch-up. The monitoring and protection circuit may be integrated with a voltage regulator, e.g., low drop-out (LDO) voltage regulator on a single integrated circuit substrate. The monitoring and protection circuit and voltage regulator may be fabricated with a CMOS device, e.g., digital processor on a single integrated circuit substrate.
    • 与向CMOS器件供电的电压调节器相关联的监控和保护电路可以精确地感测超过电流水平,以确定CMOS器件的电路中是否发生故障,例如闩锁,故障或短路晶体管等 那么当出现意外的过电流(例如,CMOS电路闭锁)时,该监控和保护电路可以自动产生故障报警信号和/或向CMOS器件循环供电。 监控和保护电路可以与单个集成电路基板上的电压调节器(例如,低压降(LDO))稳压器集成。 监控和保护电路和电压调节器可以用CMOS器件制造,例如在单个集成电路基板上的数字处理器。
    • 3. 发明授权
    • USB eye pattern test mode
    • USB眼图测试模式
    • US07103512B2
    • 2006-09-05
    • US11028377
    • 2005-01-03
    • Joseph Harry JulicherDaniel William ButlerReston A. Condit
    • Joseph Harry JulicherDaniel William ButlerReston A. Condit
    • G01R27/28
    • G06F11/221
    • A special test mode is incorporated within a USB transceiver of a digital system, and when the special test mode is activated, USB eye pattern test data signal waveforms, e.g., a continuous stream of USB state transitions (defined by the USB specification) are transmitted on the USB data lines connected to the USB transceiver. Conventional test equipment may be attached to the USB data lines and the signal quality monitored. Circuit changes can be made to the digital system and the results easily measured. When the USB eye pattern test data signal waveforms on the USB data lines of the digital system are of satisfactory quality, the special test mode may be turned off and the USB transceiver will resume operation as a normal USB device.
    • 特殊测试模式被并入数字系统的USB收发器中,并且当激活特殊测试模式时,传输USB眼图测试数据信号波形,例如连续的USB状态转换流(由USB规范定义) 在连接到USB收发器的USB数据线上。 传统的测试设备可以连接到USB数据线,监测信号质量。 可以对数字系统进行电路改变,并且可以轻松测量结果。 当数字系统的USB数据线上的USB眼图测试数据信号波形质量令人满意时,特殊测试模式可能会被关闭,USB收发器将恢复正常的USB设备。
    • 4. 发明授权
    • Automatic detection of a CMOS device in latch-up and cycling of power thereto
    • 自动检测CMOS器件,以锁定和循环电源
    • US07907378B2
    • 2011-03-15
    • US12044315
    • 2008-03-07
    • Joseph Harry Julicher
    • Joseph Harry Julicher
    • H02H3/08
    • G06F1/28G06F1/305H01L27/0251H01L27/0921
    • A monitoring and protection circuit associated with a voltage regulator supplying power to a CMOS device can sense over current levels precisely enough for determining if a fault has occurred in a circuit of the CMOS device, e.g., latch-up, failed or shorted transistor, etc., then this monitoring and protection circuit may automatically generate a fault alert signal and/or cycle power to the CMOS device when an unexpected over current may occur, e.g., CMOS circuit latch-up. The monitoring and protection circuit may be integrated with a voltage regulator, e.g., low drop-out (LDO) voltage regulator on a single integrated circuit substrate. The monitoring and protection circuit and voltage regulator may be fabricated with a CMOS device, e.g., digital processor on a single integrated circuit substrate.
    • 与向CMOS器件供电的电压调节器相关联的监控和保护电路可以精确地感测超过电流水平,以确定CMOS器件的电路中是否发生故障,例如闩锁,故障或短路晶体管等 那么当出现意外的过电流(例如,CMOS电路闭锁)时,该监控和保护电路可以自动产生故障报警信号和/或向CMOS器件循环供电。 监控和保护电路可以与单个集成电路基板上的电压调节器(例如,低压降(LDO))稳压器集成。 监控和保护电路和电压调节器可以用CMOS器件制造,例如在单个集成电路基板上的数字处理器。