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1. 发明授权

US09270012B2 Electronic device with calibrated tunable antenna 有权
标题翻译：具有校准可调谐天线的电子设备
公开(公告)号：US09270012B2
公开(公告)日：2016-02-23
申请号：US13363743
申请日：2012-02-01
申请人： Joshua G. Nickel , Mattia Pascolini
发明人： Joshua G. Nickel , Mattia Pascolini
IPC分类号： H01Q9/00 , H01Q1/24 , H01Q9/42 , H01Q5/328
CPC分类号： H01Q1/243 , H01Q5/328 , H01Q9/42
摘要： An electronic device may have tunable antenna structures. A tunable antenna may have an antenna resonating element and an antenna ground. An adjustable electronic component such as an adjustable capacitor, adjustable inductor, or adjustable phase-shift element may be used in tuning the antenna. An impedance matching circuit may be coupled between the tunable antenna and a radio-frequency transceiver. The adjustable electronic component may be coupled to the antenna resonating element or other structures in the antenna or may form part of the impedance matching circuit, a transmission line, a parasitic antenna element, or other antenna structures. During manufacturing, manufacturing variations may cause the performance of the tunable antenna to deviate from desired specifications. Calibration operations may be performed to identify compensating adjustments to be made with the adjustable electronic component. Calibration data for the adjustable component may be stored in control circuitry in the electronic device.
摘要翻译：电子设备可以具有可调谐的天线结构。可调谐天线可以具有天线谐振元件和天线接地。可调电子部件，例如可调电容器，可调电感器或可调相移元件可用于调谐天线。阻抗匹配电路可以耦合在可调谐天线和射频收发器之间。可调电子部件可以耦合到天线谐振元件或天线中的其他结构，或者可以形成阻抗匹配电路，传输线，寄生天线元件或其他天线结构的一部分。在制造过程中，制造变化可能导致可调谐天线的性能偏离所需规格。可以执行校准操作以识别要用可调电子部件进行的补偿调整。可调组件的校准数据可以存储在电子设备中的控制电路中。

2. 发明授权

US08947113B2 Methods for modeling tunable radio-frequency elements 有权
标题翻译：可调谐射频元件建模方法
公开(公告)号：US08947113B2
公开(公告)日：2015-02-03
申请号：US13466017
申请日：2012-05-07
申请人： Liang Han , Jayesh Nath , Matthew A. Mow , Peter Bevelacqua , Joshua G. Nickel , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
发明人： Liang Han , Jayesh Nath , Matthew A. Mow , Peter Bevelacqua , Joshua G. Nickel , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
IPC分类号： G01R31/00
CPC分类号： G01R1/045 , G01R31/2822 , G01R35/005
摘要： A test system for characterizing an antenna tuning element is provided. The test system may include a test host, a radio-frequency tester, and a test fixture. The test system may calibrate the radio-frequency tester using known coaxial standards. The test system may then calibrate transmission line effects associated with the test fixture using a THRU-REFLECT-LINE calibration algorithm. The antenna tuning element may be mounted on a test socket that is part of the test fixture. While the antenna tuning element is mounted on the test socket, scattering parameter measurements may be obtained using the radio-frequency tester. An equivalent circuit model for the test socket can be obtained based on the measured scattering parameters and known characteristics of the antenna tuning element. Once the test socket has been characterized, an equivalent circuit model for the antenna tuning element can be obtained by extracting suitable modeling parameters from the measured scattering parameters.
摘要翻译：提供了一种用于表征天线调谐元件的测试系统。测试系统可以包括测试主机，射频测试仪和测试夹具。测试系统可以使用已知的同轴标准校准射频测试仪。然后，测试系统可以使用THRU-REFLECT-LINE校准算法来校准与测试夹具相关联的传输线效应。天线调谐元件可以安装在作为测试夹具的一部分的测试插座上。当天线调谐元件安装在测试插座上时，可以使用射频测试仪获得散射参数测量值。基于测量的散射参数和天线调谐元件的已知特性，可以获得用于测试插座的等效电路模型。一旦测试插座被表征，可以通过从测量的散射参数中提取合适的建模参数来获得天线调谐元件的等效电路模型。

3. 发明授权

US08847617B2 Non-contact test system for determining whether electronic device structures contain manufacturing faults 有权
标题翻译：用于确定电子设备结构是否包含制造故障的非接触测试系统
公开(公告)号：US08847617B2
公开(公告)日：2014-09-30
申请号：US13092808
申请日：2011-04-22
申请人： Joshua G. Nickel , Jonathan P. G. Gavin
发明人： Joshua G. Nickel , Jonathan P. G. Gavin
IPC分类号： G01R31/302
CPC分类号： G01R31/3025 , G01R31/265
摘要： Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
摘要翻译：可以使用非接触测试系统来测试诸如包含天线，连接器，焊缝，电子器件部件，导电壳体结构和其它结构的结构的电子器件结构。测试系统可以包括矢量网络分析器或其它测试单元，其产生频率范围内的射频测试信号。射频测试信号可以使用具有一个或多个测试天线的天线探针发射到被测电子设备结构。天线探头可以接收相应的射频信号。可以分析发送和接收的射频测试信号以确定被测电子设备结构是否包含故障。

4. 发明授权

US08742997B2 Testing system with electrically coupled and wirelessly coupled probes 有权
标题翻译：带电耦合和无线耦合探头的测试系统
公开(公告)号：US08742997B2
公开(公告)日：2014-06-03
申请号：US13111926
申请日：2011-05-19
申请人： Joshua G. Nickel , James L. McPeak , Jr-Yi Shen
发明人： Joshua G. Nickel , James L. McPeak , Jr-Yi Shen
IPC分类号： G01R29/10
CPC分类号： G01R31/2822 , G01R27/28 , H04B17/104
摘要： Conductive electronic device structures such as a conductive housing member that forms part of an antenna may be tested during manufacturing. A test system may be provided that has a pair of pins or other contacts. Test equipment such as a network analyzer may provide radio-frequency test signals in a range of frequencies. The radio-frequency test signals may be applied to the conductive housing member or other conductive structures under test using the test probe contacts. An antenna may be used to gather corresponding wireless radio-frequency signal data. Forward transfer coefficient data may be computed from the transmitted and received radio-frequency signals. The forward transfer coefficient data or other test data may be compared to reference data to determine whether the conductive electronic device structures contain a fault.
摘要翻译：可以在制造期间测试形成天线的一部分的诸如导电壳体构件的导电电子器件结构。可以提供具有一对引脚或其他触点的测试系统。诸如网络分析仪的测试设备可以在一定频率范围内提供射频测试信号。射频测试信号可以使用测试探针触点施加到导电外壳构件或其他测试导电结构。可以使用天线来收集相应的无线射频信号数据。可以从发射和接收的射频信号计算正向传输系数数据。可以将前向传输系数数据或其他测试数据与参考数据进行比较，以确定导电电子设备结构是否包含故障。

5. 发明申请

US20130194139A1 ELECTRONIC DEVICE WITH CALIBRATED TUNABLE ANTENNA 有权
标题翻译：带校准天线的电子设备
公开(公告)号：US20130194139A1
公开(公告)日：2013-08-01
申请号：US13363743
申请日：2012-02-01
申请人： Joshua G. Nickel , Mattia Pascolini
发明人： Joshua G. Nickel , Mattia Pascolini
IPC分类号： H01Q9/00 , G01R29/08
CPC分类号： H01Q1/243 , H01Q5/328 , H01Q9/42
摘要： An electronic device may have tunable antenna structures. A tunable antenna may have an antenna resonating element and an antenna ground. An adjustable electronic component such as an adjustable capacitor, adjustable inductor, or adjustable phase-shift element may be used in tuning the antenna. An impedance matching circuit may be coupled between the tunable antenna and a radio-frequency transceiver. The adjustable electronic component may be coupled to the antenna resonating element or other structures in the antenna or may form part of the impedance matching circuit, a transmission line, a parasitic antenna element, or other antenna structures. During manufacturing, manufacturing variations may cause the performance of the tunable antenna to deviate from desired specifications. Calibration operations may be performed to identify compensating adjustments to be made with the adjustable electronic component. Calibration data for the adjustable component may be stored in control circuitry in the electronic device.
摘要翻译：电子设备可以具有可调谐的天线结构。可调谐天线可以具有天线谐振元件和天线接地。可调电子部件，例如可调电容器，可调电感器或可调相移元件可用于调谐天线。阻抗匹配电路可以耦合在可调谐天线和射频收发器之间。可调电子部件可以耦合到天线谐振元件或天线中的其他结构，或者可以形成阻抗匹配电路，传输线，寄生天线元件或其他天线结构的一部分。在制造过程中，制造变化可能导致可调谐天线的性能偏离所需规格。可以执行校准操作以识别要用可调电子部件进行的补偿调整。可调组件的校准数据可以存储在电子设备中的控制电路中。

6. 发明申请

US20120319697A1 METHODS FOR PROVIDING PROPER IMPEDANCE MATCHING DURING RADIO-FREQUENCY TESTING 有权
标题翻译：在无线电频率测试中提供适当阻抗匹配的方法
公开(公告)号：US20120319697A1
公开(公告)日：2012-12-20
申请号：US13163242
申请日：2011-06-17
申请人： Justin Gregg , Joshua G. Nickel
发明人： Justin Gregg , Joshua G. Nickel
IPC分类号： G01R31/28
CPC分类号： G01R31/2822
摘要： Wireless electronic devices may include a transceiver, an antenna resonating element coupled to the transceiver via a transmission line path, transceiver and antenna impedance matching circuits, and other circuitry. The transceiver and the impedance matching circuits may be formed on a first substrate. The antenna resonating element may be formed using a second substrate. The antenna resonating element may be decoupled from the first substrate during testing. First and second sets of test points may be formed at first and second locations long the transmission line path. During testing, a test probe may mate with the first set of test points, whereas an impedance adjustment circuit that serves to electrically isolate the antenna impedance matching circuit from the transceiver may mate with the second set of test points. The impedance adjustment circuit need not be used if the antenna impedance matching circuit is decoupled from the transceiver during testing.
摘要翻译：无线电子设备可以包括收发器，经由传输线路径耦合到收发器的天线谐振元件，收发器和天线阻抗匹配电路以及其它电路。收发器和阻抗匹配电路可以形成在第一衬底上。天线谐振元件可以使用第二基板形成。天线谐振元件可以在测试期间与第一基板分离。第一和第二组测试点可以在传输线路径的第一和第二位置处形成。在测试期间，测试探针可与第一组测试点配合，而用于将天线阻抗匹配电路与收发器电隔离的阻抗调节电路可与第二组测试点相配合。如果在测试期间天线阻抗匹配电路与收发器解耦，则不需要使用阻抗调节电路。

7. 发明申请

US20120287792A1 BIDIRECTIONAL RADIO-FREQUENCY PROBING 有权
标题翻译：双向无线电频率探测
公开(公告)号：US20120287792A1
公开(公告)日：2012-11-15
申请号：US13103892
申请日：2011-05-09
申请人： Joshua G. Nickel , Fernando Urioste , Justin Gregg , Adil Syed , Jason Sloey , Jonathan Haylock
发明人： Joshua G. Nickel , Fernando Urioste , Justin Gregg , Adil Syed , Jason Sloey , Jonathan Haylock
IPC分类号： H04L12/26 , G01R31/02
CPC分类号： G01R1/06772 , G01R31/2822 , H04B17/0085 , H04B17/12 , H04B17/16
摘要： Wireless electronic devices may include wireless communications circuitry such as a transceiver, antenna, and other wireless circuitry. The transceiver may be coupled to the antenna through a bidirectional switch connector. The switch connector may mate with a corresponding radio-frequency test probe that is connected to radio-frequency test equipment. When the test probe is mated with the switch connector, the transceiver may be decoupled from the antenna. During transceiver testing, radio-frequency test signals may be conveyed between the test unit and the transceiver using the test probe. During antenna testing, radio-frequency test signals may be conveyed between the test unit and the antenna using the test probe. Transceiver testing and antenna testing may, if desired, be conducted in parallel using the test probe.
摘要翻译：无线电子设备可以包括无线通信电路，例如收发器，天线和其他无线电路。收发器可以通过双向开关连接器耦合到天线。开关连接器可以与连接到射频测试设备的相应的射频测试探头配合使用。当测试探针与开关连接器配合时，收发器可以与天线分离。在收发器测试期间，可以使用测试探针在测试单元和收发器之间传送射频测试信号。在天线测试期间，可以使用测试探针在测试单元和天线之间传送射频测试信号。如果需要，收发器测试和天线测试可以使用测试探头并行进行。

8. 发明申请

US20120274346A1 TESTING SYSTEM WITH CAPACITIVELY COUPLED PROBE FOR EVALUATING ELECTRONIC DEVICE STRUCTURES 有权
标题翻译：具有用于评估电子设备结构的电容耦合探头的测试系统
公开(公告)号：US20120274346A1
公开(公告)日：2012-11-01
申请号：US13097847
申请日：2011-04-29
申请人： Joshua G. Nickel , Jr-yi Shen
发明人： Joshua G. Nickel , Jr-yi Shen
IPC分类号： G01R31/20
CPC分类号： G01R1/07 , G01R31/312
摘要： Conductive electronic device structures such as a conductive housing member that forms part of an antenna may be tested during manufacturing. A test system may be provided that has a capacitive coupling probe. The probe may have electrodes. The electrodes may be formed from patterned metal structures in a dielectric substrate. A test unit may provide radio-frequency test signals in a range of frequencies. The radio-frequency test signals may be applied to the conductive housing member or other conductive structures under test using the electrodes. Complex impedance data, forward transfer coefficient data, or other data may be used to determine whether the structures are faulty. A fixture may be used to hold the capacitive coupling probe in place against the conductive electronic device structures during testing.
摘要翻译：可以在制造期间测试形成天线的一部分的诸如导电壳体构件的导电电子器件结构。可以提供具有电容耦合探针的测试系统。探头可以具有电极。电极可以由介电衬底中的图案化金属结构形成。测试单元可以在一定频率范围内提供射频测试信号。可以使用电极将射频测试信号施加到导电壳体构件或其他待测导体结构。可以使用复阻抗数据，前向传输系数数据或其他数据来确定结构是否有故障。在测试期间，固定装置可用于将电容耦合探针固定在导电电子器件结构上。

9. 发明申请

US20110282593A1 WELD CHECK STATIONS 失效
标题翻译：焊接检查站
公开(公告)号：US20110282593A1
公开(公告)日：2011-11-17
申请号：US12869617
申请日：2010-08-26
申请人： Joshua G. Nickel , Ruben Caballero , Jason Flickinger , Scott A. Myers , Mattia Pascolini , Robert W. Schlub , Trent Weber
发明人： Joshua G. Nickel , Ruben Caballero , Jason Flickinger , Scott A. Myers , Mattia Pascolini , Robert W. Schlub , Trent Weber
IPC分类号： G01R31/11 , G06F19/00 , G01R35/00
CPC分类号： G01R31/04
摘要： A method of manufacture for a portable computing device is described. In particular, methods and apparatus for assessing a quality of weld joints used to connect one or more components of the portable computing device are described. The weld joints can include one or more weld points. At a weld check station, using a vector network analyzer, a test signal generated can be passed through the weld joint and a response signal can be measured. The measured characteristics can be used to assess a quality of the weld joint. In one embodiment, the vector network analyzer can be used to generate a number of high frequency test signals that are passed through the weld to perform a time domain reflectometry measurement where the weld joint can be accepted or rejected based upon the measurement.
摘要翻译：描述了便携式计算设备的制造方法。特别地，描述了用于评估用于连接便携式计算设备的一个或多个部件的焊接接头的质量的方法和设备。焊缝可以包括一个或多个焊接点。在焊接检查站，使用矢量网络分析仪，产生的测试信号可以通过焊接接头，并且可以测量响应信号。测量的特性可用于评估焊缝的质量。在一个实施例中，矢量网络分析器可以用于产生通过焊缝的多个高频测试信号，以执行时域反射测量，其中基于测量能够接受或拒绝焊接接头。

10. 发明授权

US09310422B2 Methods and apparatus for testing small form factor antenna tuning elements 有权
标题翻译：用于测试小尺寸天线调谐元件的方法和装置
公开(公告)号：US09310422B2
公开(公告)日：2016-04-12
申请号：US13487149
申请日：2012-06-01
申请人： Jayesh Nath , Liang Han , Matthew A. Mow , Hagan O'Connor , Joshua G. Nickel , Peter Bevelacqua , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
发明人： Jayesh Nath , Liang Han , Matthew A. Mow , Hagan O'Connor , Joshua G. Nickel , Peter Bevelacqua , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
IPC分类号： G01R31/00 , G01R31/28 , G01R1/04
CPC分类号： G01R31/2808 , G01R1/0408 , G01R31/2822 , G01R31/2837
摘要： A test system for testing a device under test (DUT) is provided. The test system may include a DUT receiving structure configured to receive the DUT during testing and a DUT retention structure that is configured to press the DUT against the DUT receiving structure so that DUT cannot inadvertently shift around during testing. The DUT retention structure may include a pressure sensor operable to detect an amount of pressure that is applied to the DUT. The DUT retention structure may be raised and lowered vertically using a manually-controlled or a computer-controlled positioner. The positioner may be adjusted using a coarse tuning knob and a fine tuning knob. The positioner may be calibrated such that the DUT retention structure applies a sufficient amount of pressure on the DUT during production testing.
摘要翻译：提供了一种用于测试被测器件（DUT）的测试系统。测试系统可以包括被配置为在测试期间接收DUT的DUT接收结构和被配置成将DUT抵抗DUT接收结构按压的DUT保持结构，使得DUT在测试期间不会无意中移动。 DUT保持结构可以包括可操作以检测施加到DUT的压力量的压力传感器。 DUT保持结构可以使用手动控制或计算机控制的定位器垂直升高和降低。可以使用粗调节旋钮和微调旋钮调节定位器。可以对定位器进行校准，使得DUT保持结构在生产测试期间在DUT上施加足够的压力。

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