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    • 1. 发明申请
    • KNOWN GOOD DIE TESTING FOR HIGH FREQUENCY APPLICATIONS
    • 已知的高频应用的良好的测试
    • US20160327590A1
    • 2016-11-10
    • US14703677
    • 2015-05-04
    • QUALCOMM Incorporated
    • Young Kyu SongKyu-Pyung Hwang
    • G01R1/073G01R29/08G01R31/28
    • G01R1/045G01R1/06722G01R1/06772G01R1/07314G01R29/08G01R31/2822
    • Embodiments contained in the disclosure provide a method and apparatus for testing an electronic device. An electronic device is installed in a test socket guide. A pusher tip applies a load to the guided coaxial spring probes and forces contact with pads on the device. Test and ground signals are routed through the device and test socket. The apparatus includes a socket having at least one guided coaxial spring probe pin. A socket guide shim is positioned between the receptacle for the electronic device and the socket. A socket guide aids positioning. A pusher tip is placed on the side opposite that of the guided coaxial spring probe pins. The pusher tip mates with a pusher shim and the pusher spring. A top is then placed on the assembly and acts to compress the pusher spring and engage the guided coaxial spring probe pins with the pads on the device.
    • 本公开内容的实施例提供了一种用于测试电子设备的方法和装置。 电子设备安装在测试插座导轨中。 推动器尖端对被引导的同轴弹簧探针施加负载,并强制与设备上的焊盘接触。 测试和接地信号通过设备和测试插座进行路由。 该装置包括具有至少一个被引导的同轴弹簧探针销的插座。 插座引导垫片位于电子设备的插座和插座之间。 插座导轨辅助定位。 推动器尖端放置在与所引导的同轴弹簧探针的相对侧的一侧。 推杆与推动垫片和推杆弹簧配合。 然后将顶部放置在组件上并且用于压缩推动器弹簧并且将引导的同轴弹簧探针针与装置上的垫接合。
    • 2. 发明授权
    • High bandwidth differential lead with device connection
    • 高带宽差分引线与设备连接
    • US09482695B2
    • 2016-11-01
    • US13724344
    • 2012-12-21
    • TEKTRONIX, INC.
    • James H. McGrath, Jr.
    • G01R1/067H01B1/00G01R1/04
    • G01R1/06722G01R1/0416G01R1/045G01R1/067G01R1/06772G01R31/2889H01B1/00
    • A high bandwidth solder-less lead may be connected to an electrical device having land patterns so that signals on the device may be more easily measured through the lead. The lead includes an attachment mechanism to mount the lead on the device, a microspring housing and at least one microspring. The microspring connects one of the particular land patterns on the device to the lead where it may be easier to couple to a measurement device than to the electrical device itself. The lead may be coupled to a flexible electrical conduit to make attaching to the testing device even easier. In other versions, a uniform connector may be temporarily attached to the solder-less lead to test the device. Then the connector may be disconnected from the first lead and connected to another lead to test another area of the device.
    • 高带宽无焊接引线可以连接到具有焊盘图案的电气设备,使得可以通过引线更容易地测量设备上的信号。 引线包括用于将引线安装在器件上的附接机构,微管壳体和至少一个微小弹簧。 微管将设备上的特定焊盘图案之一连接到引线,其中可以更容易地耦合到测量装置而不是电气装置本身。 引线可以耦合到柔性电导管,以使连接到测试装置更加容易。 在其他版本中,可以将均匀的连接器临时连接到无焊锡导线以测试该装置。 然后,连接器可以与第一引线断开并连接到另一引线以测试该设备的另一个区域。
    • 4. 发明申请
    • TEST SOCKET AND TEST DEVICE HAVING THE SAME
    • 测试插座及其测试装置
    • US20120025861A1
    • 2012-02-02
    • US13196380
    • 2011-08-02
    • Hwan Wook PARKWoo Seop KIMSung Bum CHO
    • Hwan Wook PARKWoo Seop KIMSung Bum CHO
    • G01R31/00
    • G01R1/045G01R1/0466
    • A test device is provided. The test device includes a first via which transmits a supply voltage, a second via which transmits a ground voltage, a test board including a plurality of test signal vias for transmitting a plurality of test signals, a capacitor disposed on an upper part of the test board and connected between the first via and the second via, and a test socket which electrically connects a device under test (DUT) with the test board. The test socket includes a first region including a flat lower surface bordering the test board, a second region including an uneven lower surface, a plurality of first contactors which are disposed in the first region and which are connected to the plurality of vias, and two second contactors which are disposed in the second region and which are connected to two terminals of the capacitor.
    • 提供测试设备。 测试装置包括发送电源电压的第一通孔,发送接地电压的第二通孔,包括用于发送多个测试信号的多个测试信号通孔的测试板,设置在测试的上部的电容器 并连接在第一通孔和第二通孔之间,以及将被测器件(DUT)与测试板电连接的测试插座。 测试插座包括:第一区域,包括与测试板邻接的平坦的下表面,包括不平坦的下表面的第二区域;多个第一接触器,其布置在第一区域中并连接到多个通孔;以及两个 第二接触器,其布置在第二区域中并且连接到电容器的两个端子。
    • 5. 发明授权
    • Radiofrequency contactor
    • 射频接触器
    • US08058892B2
    • 2011-11-15
    • US12480810
    • 2009-06-09
    • Kunihiro SatouTomoyuki Kamiyama
    • Kunihiro SatouTomoyuki Kamiyama
    • G01R31/26
    • G01R31/2822G01R1/045
    • A radiofrequency contactor includes a testing circuit board having a dielectric substrate, a lower ground conductor on a lower surface of the dielectric substrate, and a radiofrequency signal wiring conductor on an upper surface of the dielectric substrate, a radiofrequency signal pin contactor located on the upper surface of the dielectric substrate and connected to the radiofrequency signal wiring conductor, a ground block located on the upper surface of the dielectric substrate and spaced apart from the radiofrequency signal wiring conductor and the radiofrequency signal pin contactor, and a first side ground conductor and a second side ground conductor provided on the upper surface of the dielectric substrate and spaced apart from the radiofrequency signal wiring conductor and the radiofrequency signal pin contactor.
    • 射频接触器包括具有电介质基底的测试电路板,介电基片下表面上的下接地导体和介质基片上表面上的射频信号布线导体,位于上层的射频信号针接触器 电介质基板的表面并连接到射频信号布线导体,位于电介质基板的上表面并与射频信号布线导体和射频信号针接触器间隔开的接地块,以及第一侧接地导体和 设置在电介质基板的上表面上并与射频信号布线导体和射频信号针接触器隔开的第二侧接地导体。
    • 6. 发明申请
    • MEDICAL CONSULTATION MANAGEMENT SYSTEM
    • US20100287000A1
    • 2010-11-11
    • US12839878
    • 2010-07-20
    • Kenneth H. FalchukJose A. Halperin
    • Kenneth H. FalchukJose A. Halperin
    • G06Q50/00G09B7/00
    • G06Q50/24G01R1/045G01R1/0466G01R1/0483G06F19/325G06F19/3418G06Q50/22G16H10/60G16H15/00G16H40/20G16H80/00H05K7/1069
    • A medical consultation support system in which a client computer, such as a personal computer or a terminal of an existing medical support system, is employed to transfer a structured request for consultation from a primary care physician to a supervisory host computer. The structured request may be accompanied by additional information related to the request, such as existing data files containing patient history information, medical image data, laboratory results, pathologies, etc., forming a transmittable, machine-readable collection of information relating to the consultation request. At the supervisory computer, the request is displayed for preliminary review by a receiving staff physician who designates a specialist and retrieves and assembles selected tutorial and background information, including related published articles, tutorial background lessons, practice and protocol documentation, and records of prior consultations which are related to the current consultation request, all of which are stored in one or more databases of medical information accessible to the supervisory host computer. The supervisory computer then transmits the request for consultation, together with at least the identification of the assembled supporting documentation, to the selected specialist for review, and thereafter receives the responsive comment from the selected specialist. The supervisory computer further stores the request for consultation, including the specialist's responsive comment and an identification of the cited supporting material, as a structured case history item in the database of medical information where it may be accessed for future reference. Each consultation is further stored as a recorded learning event associated with the requesting primary care physician, and used to generate a report of continuing legal education credits earned by the requesting physician while participating in the managed consultation sessions.
    • 7. 发明申请
    • INSPECTION SOCKET
    • 检查插座
    • US20100188112A1
    • 2010-07-29
    • US12695714
    • 2010-01-28
    • Takuto Yoshida
    • Takuto Yoshida
    • G01R31/02
    • G01R1/045
    • An inspection socket connects electrode terminals of an object to be inspected to wirings of a wiring board. The inspection socket includes: a metal block formed with first holes; contact probes provided in the first holes and including at least a contact probe for RF signals, the contact probes provided with plungers capable of moving in an axial direction at distal ends of the contact probes; and an insulating board securing the contact probes and formed with second holes through which the plungers are passed, the insulating board provided with a GND member around the contact probe for RF signals.
    • 检查插座将要检查的物体的电极端子连接到布线板的布线。 检查插座包括:形成有第一孔的金属块; 提供在第一孔中的接触探针并且至少包括用于RF信号的接触探针,所述接触探针设置有能够在接触探针的远端处沿轴向移动的柱塞; 以及绝缘板,固定所述接触探针并形成有所述柱塞通过的第二孔,所述绝缘板在所述接触探针周围设置有用于RF信号的GND构件。
    • 8. 发明申请
    • RADIOFREQUENCY CONTACTOR
    • 无线电接触器
    • US20100178778A1
    • 2010-07-15
    • US12480810
    • 2009-06-09
    • Kunihiro SatouTomoyuki Kamiyama
    • Kunihiro SatouTomoyuki Kamiyama
    • H01R12/00
    • G01R31/2822G01R1/045
    • A radiofrequency contactor includes a testing circuit board having a dielectric substrate, a lower ground conductor on a lower surface of the dielectric substrate, and a radiofrequency signal wiring conductor on an upper surface of the dielectric substrate, a radiofrequency signal pin contactor located on the upper surface of the dielectric substrate and connected to the radiofrequency signal wiring conductor, a ground block located on the upper surface of the dielectric substrate and spaced apart from the radiofrequency signal wiring conductor and the radiofrequency signal pin contactor, and a first side ground conductor and a second side ground conductor provided on the upper surface of the dielectric substrate and spaced apart from the radiofrequency signal wiring conductor and the radiofrequency signal pin contactor.
    • 射频接触器包括具有电介质基底的测试电路板,介电基片下表面上的下接地导体和介质基片上表面上的射频信号布线导体,位于上层的射频信号针接触器 电介质基板的表面并连接到射频信号布线导体,位于电介质基板的上表面并与射频信号布线导体和射频信号针接触器间隔开的接地块,以及第一侧接地导体和 设置在电介质基板的上表面上并与射频信号布线导体和射频信号针接触器隔开的第二侧接地导体。
    • 10. 发明申请
    • Inspection unit
    • 检验单位
    • US20070145991A1
    • 2007-06-28
    • US11644974
    • 2006-12-26
    • Takuto Yoshida
    • Takuto Yoshida
    • G01R31/02
    • G01R1/045G01R31/3167
    • An insulative block has a first face adapted to oppose a board on which an inspection circuit is arranged and a second face adapted to oppose a device to be inspected. The insulative block is formed with through holes each of which communicates the first face and the second face. A conductive plating layer is formed on the first face, the second face, and an inner face of at least one of the through holes. Each of contact probes includes a conductive tubular body held in an associated one of the through holes and a plunger which is retractably projected from one end of the tubular body and is adapted to come in contact with a terminal of the device. The contact probes includes a first group of contact probes adapted to come in contact with terminals of a first circuit in the device, and a second group of contact probes adapted to come in contact with terminals of a second circuit in the device. The plating layer is divided by a groove into a first region including the first group of the contact probes and a second region including the second group of the contact probes, so that the first region and the second region are electrically insulated from one another.
    • 绝缘块具有适于与设置有检查电路的电路板对准的第一面,以及适于与被检查装置相对的第二面。 绝缘块形成有各自与第一面和第二面连​​通的贯通孔。 导电镀层形成在至少一个通孔的第一面,第二面和内面上。 每个接触探针包括保持在相关联的一个通孔中的导电管状体和从管状体的一端可伸缩地突出并适于与装置的端子接触的柱塞。 接触探针包括适于与设备中的第一电路的端子接触的第一组接触探针和适于与设备中的第二电路的端子接触的第二组接触探针。 电镀层由凹槽划分成包括第一组接触探针的第一区域和包括第二组接触探针的第二区域,使得第一区域和第二区域彼此电绝缘。