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1. 发明授权

US08108942B2 Probe microscope 失效
标题翻译：探头显微镜
公开(公告)号：US08108942B2
公开(公告)日：2012-01-31
申请号：US12699321
申请日：2010-02-03
申请人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
发明人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
IPC分类号： G01N12/16 , G01Q20/02 , G01B7/34
CPC分类号： G01Q20/02
摘要： A probe microscope includes a cantilever having a probe, a displacement detecting optical system, an observation optical system, an objective lens, and a parallel glass. The displacement detecting optical system includes a first light source and a light detecting element. The observation optical system includes a second light source, an image forming lens, and a camera. The objective lens is disposed between the cantilever and the first and second light sources, and is commonly used by the displacement detecting optical system and the observation optical system. The parallel glass is capable of being inserted and retracted freely between the cantilever and the objective lens to adjust a focal point of the objective lens.
摘要翻译：探针显微镜包括具有探针的悬臂，位移检测光学系统，观察光学系统，物镜和平行玻璃。位移检测光学系统包括第一光源和光检测元件。观察光学系统包括第二光源，图像形成透镜和照相机。物镜设置在悬臂与第一和第二光源之间，并且通常由位移检测光学系统和观察光学系统使用。平行玻璃能够在悬臂和物镜之间自由地插入和缩回以调节物镜的焦点。

2. 发明申请

US20100164165A1 Sheet-Supplying Device 有权
标题翻译：供纸装置
公开(公告)号：US20100164165A1
公开(公告)日：2010-07-01
申请号：US12720111
申请日：2010-03-09
申请人： Satoshi Ueda , Shingo Takai , Tatsuo Matsuda , Kazuhiko Kawasaki
发明人： Satoshi Ueda , Shingo Takai , Tatsuo Matsuda , Kazuhiko Kawasaki
IPC分类号： B65H5/22 , B65H7/02 , B65H1/04
CPC分类号： B65H1/14 , B65H3/128 , B65H3/48
摘要： A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.
摘要翻译：片材供应装置具有片材容纳托盘，升降单元，第一位置传感器，第二位置传感器，控制单元。升降单元基本上升和降低纸张收纳托盘。第一位置传感器检测指示堆叠在片材容纳盘中的最上面片材的一个端部的层叠方向上的位置的第一位置。第二位置传感器检测表示最顶片的另一端部的层叠方向上的位置的第二位置。控制单元基于由第一位置传感器检测到的第一位置和由第二位置传感器检测到的第二位置两者来控制升降单元升高或降低纸张收纳托盘，使得最上面的纸张的一端堆叠状态位于层叠方向上的规定位置。

3. 发明申请

US20090072741A1 CERAMIC METAL HALIDE LAMP HAVING RATED LAMP WATTAGE OF GREATER THAN OR EQUAL TO 450 W 有权
标题翻译：陶瓷金属卤化物灯具有大于或等于450瓦的额定灯泡
公开(公告)号：US20090072741A1
公开(公告)日：2009-03-19
申请号：US11816198
申请日：2006-02-17
申请人： Kazuhiko Kawasaki , Shinji Taniguchi , Kuniaki Nakano
发明人： Kazuhiko Kawasaki , Shinji Taniguchi , Kuniaki Nakano
IPC分类号： H01J61/04
CPC分类号： H01J61/827
摘要： To provide a ceramic metal halide lamp having a rated lamp wattage of not less than 450 W, which will not cause flicker due to instable arc during operating of the lamp and early blacking of an arc tube. In a metal halide lamp having a rated lamp wattage of greater than or equal to 450 W, which includes: a translucent ceramic arc tube enclosure including: a main tube inside which a discharge space is formed; and two narrow tubes having smaller diameter than the main tube, each connected to either end of the main tube; two electrodes; and a metal halide provided inside the arc tube enclosure, in which one of the two electrodes is disposed so that it protrudes inside the main tube from inside of one of the two narrow tubes, and the other one of the two electrodes is disposed so that it protrudes inside the main tube from the other one of the two narrow tubes, and when the rated lamp wattage is denoted by W (watt), an inside diameter of the main tube by D (mm), an electrode protruding length which is the distance from boundary between the main tube and the narrow tubes to an end of the electrode by L (mm), and the distance between ends of the two electrodes by E (mm), a bulb wall loading G (watt/cm2) represented by G=W/(3.14×D×E×0.01) falls within the range of 15≦G≦40, and a relationship 0.32≦L/D≦0.0003×W+0.465 is established.
摘要翻译：提供具有不小于450W的额定灯功率的陶瓷金属卤化物灯，其不会在灯操作期间由于不稳定的电弧和电弧管的早期黑化而引起闪烁。在具有大于或等于450W的额定灯功率的金属卤化物灯中，其包括：半透明陶瓷电弧管外壳，包括：主管，其内形成有放电空间; 和两根细管，其直径小于主管，每根细管连接到主管的任一端; 两个电极以及设置在所述电弧管外壳内的金属卤化物，其中所述两个电极中的一个设置成使得其从所述两个窄管中的一个的内部突出到所述主管的内部，并且所述两个电极中的另一个设置成使得它从两个窄管中的另一个突出在主管内，当额定灯功率用W（瓦特）表示时，主管的内径为D（mm），电极突出长度为从主管和窄管之间的距离到电极的端部的距离为L（mm），两个电极的端部之间的距离为E（mm），灯泡壁负载G（瓦/ cm 2）由 G = W /（3.14xDxEx 0.01）落在15≤G≤40的范围内，建立了关系0.32 <= L / D <= 0.0003×W + 0.465。

4. 发明申请

US20060262320A1 Interferometer and shape measuring method 有权
标题翻译：干涉仪和形状测量方法
公开(公告)号：US20060262320A1
公开(公告)日：2006-11-23
申请号：US11433485
申请日：2006-05-15
申请人： Kazuhiko Kawasaki , Yoshimasa Suzuki , David Sesko
发明人： Kazuhiko Kawasaki , Yoshimasa Suzuki , David Sesko
IPC分类号： G01B9/02
CPC分类号： G01B9/02048 , G01B9/02004 , G01B9/02081 , G01B2290/45 , G01B2290/70
摘要： A wavelength-variable light source is configured to emit a light with a wavelength (λ), which is variable within a scan width (Δλ). An interferometer has a coherent length (ΔL), which is determinable from (Δλ) and (λ). A controller determines an appropriate magnitude of the scan width (Δλ) while a CCD camera captures a fringe image in an exposure time (Te), which is set longer than a time for wavelength scanning.
摘要翻译：波长可变光源被配置为发射波长（λ）的光，其在扫描宽度（Deltalambda）内是可变的。干涉仪具有相干长度（DeltaL），其可以从（Deltalambda）和（λ）确定。控制器确定扫描宽度（Deltalambda）的合适幅度，而CCD照相机在曝光时间（Te）中拍摄条纹图像，曝光时间（Te）设置为比波长扫描时间长。

5. 发明申请

US20060012107A1 Sheet-supplying device 有权
公开(公告)号：US20060012107A1
公开(公告)日：2006-01-19
申请号：US11223697
申请日：2005-09-12
申请人： Satoshi Ueda , Shingo Takai , Tatsuo Matsuda , Kazuhiko Kawasaki
发明人： Satoshi Ueda , Shingo Takai , Tatsuo Matsuda , Kazuhiko Kawasaki
IPC分类号： B65H3/14 , B65H1/08
CPC分类号： B65H1/14 , B65H3/128 , B65H3/48
摘要： A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.

6. 发明授权

US5555439A Learning system and a learning pattern showing method for a neural network 失效
标题翻译：学习系统和显示神经网络方法的学习模式
公开(公告)号：US5555439A
公开(公告)日：1996-09-10
申请号：US895928
申请日：1992-06-09
申请人： Junichi Higashino , Kazuhiko Kawasaki , Miyuki Hara
发明人： Junichi Higashino , Kazuhiko Kawasaki , Miyuki Hara
IPC分类号： G06F15/18 , G06G7/60 , G06N3/08 , G06N99/00
CPC分类号： G06N3/084
摘要： A neural network learning system using back propagation and a method of learning pattern showing are disclosed. In the case where a supervised signal contains an error or a pattern difficult to learn, the error is detected and the particular pattern is automatically removed during calculations of learning iterations to conduct rightly and accelerate the learning. The learning history for each pattern is stored to detect inconsistent and difficult-to-learn patterns, which are prevented from being shown to the network by a pattern showing control during the next learning iteration. As a result, an inconsistent or difficult-to-learn pattern which may be contained in a learning pattern set of input and supervised patterns is removed during learning iterations thereby to permit early completion of the learning process.
摘要翻译：公开了一种使用反向传播的神经网络学习系统和学习模式显示方法。在监督信号包含错误或难以学习的模式的情况下，检测到错误，并且在计算学习迭代期间自动去除特定模式以正确地行进并加速学习。存储每个模式的学习历史以检测不一致和难以学习的模式，这些模式通过在下一次学习迭代期间显示控制的模式被阻止显示给网络。因此，在学习迭代期间，消除了可能包含在输入和监督模式的学习模式集合中的不一致或难以学习的模式，从而允许学习过程的早期完成。

7. 发明授权

US08314940B2 Probe microscope 有权
标题翻译：探头显微镜
公开(公告)号：US08314940B2
公开(公告)日：2012-11-20
申请号：US12831651
申请日：2010-07-07
申请人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
发明人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
IPC分类号： G01B11/24
CPC分类号： G01B9/02027 , G01B9/02007 , G01B2290/45 , G01Q20/02
摘要： A probe microscope includes a cantilever having a probe for contact with an object, first and second displacement detection optical systems, and an object lens. The first displacement detection optical system includes a first light source and a first displacement detecting section that detects displacement of the cantilever. The second displacement detection optical system includes a second light source and a second displacement detecting section that detects displacement of the object. The object lens is provided between the cantilever and the first light source and between the cantilever and the second light source. The object lens has a focal position for the light that is emitted from the first light source and has a first wavelength at the position of the cantilever and has a focal position for the light that is emitted from the second light source and has a second wavelength at the position of the object.
摘要翻译：探针显微镜包括具有用于与物体接触的探针的悬臂，第一和第二位移检测光学系统以及物镜。第一位移检测光学系统包括检测悬臂的位移的第一光源和第一位移检测部。第二位移检测光学系统包括第二光源和检测物体的位移的第二位移检测部。物镜设置在悬臂与第一光源之间以及悬臂与第二光源之间。物镜具有用于从第一光源发出的光的焦点位置，并且在悬臂的位置处具有第一波长，并且具有用于从第二光源发射的光的焦点位置，并具有第二波长在对象的位置。

8. 发明授权

US07841591B2 Sheet-supplying device 有权
标题翻译：供纸装置
公开(公告)号：US07841591B2
公开(公告)日：2010-11-30
申请号：US12262386
申请日：2008-10-31
申请人： Satoshi Ueda , Shingo Takai , Tatsuo Matsuda , Kazuhiko Kawasaki
发明人： Satoshi Ueda , Shingo Takai , Tatsuo Matsuda , Kazuhiko Kawasaki
IPC分类号： B65H3/14
CPC分类号： B65H1/14 , B65H3/128 , B65H3/48
摘要： A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.
摘要翻译：片材供应装置具有片材容纳托盘，升降单元，第一位置传感器，第二位置传感器，控制单元。升降单元基本上升和降低纸张收纳托盘。第一位置传感器检测指示堆叠在片材容纳盘中的最上面片材的一个端部的层叠方向上的位置的第一位置。第二位置传感器检测表示最顶片的另一端部的层叠方向上的位置的第二位置。控制单元基于由第一位置传感器检测到的第一位置和由第二位置传感器检测到的第二位置两者来控制升降单元升高或降低纸张收纳托盘，使得最上面的纸张的一端堆叠状态位于层叠方向上的规定位置。

9. 发明申请

US20100027028A1 Oblique incidence interferometer 审中-公开
标题翻译：倾斜入射干涉仪
公开(公告)号：US20100027028A1
公开(公告)日：2010-02-04
申请号：US12458461
申请日：2009-07-13
申请人： Yutaka Kuriyama , Kazuhiko Kawasaki
发明人： Yutaka Kuriyama , Kazuhiko Kawasaki
IPC分类号： G01B9/02
CPC分类号： G01B9/02081 , G01B9/02022 , G01B2290/45 , G01B2290/70
摘要： An oblique incidence interferometer has favorable measurement accuracy while achieving miniaturization. The oblique incidence interferometer includes a light source that emits coherent light; a beam dividing unit that divides the coherent light from the light source into a measurement beam and a reference beam, polarizing directions of both beams being perpendicular to each other; a first beam folding unit that folds the measurement beam divided by the beam dividing unit to cause the folded measurement beam to be incident on the measurement object surface at a predetermined angle relative to the measurement object surface; a second beam folding unit that folds the measurement beam reflected by the measurement object surface; and a beam combining unit that combines the measurement beam folded by the second beam folding unit with the reference beam.
摘要翻译：倾斜入射干涉仪在实现小型化的同时具有良好的测量精度。倾斜入射干涉仪包括发射相干光的光源; 光束分割单元，其将来自光源的相干光分成测量光束和参考光束，两个光束的偏振方向彼此垂直; 第一光束折叠单元，折叠由所述光束分割单元分割的所述测量光束，以使所述折叠的测量光束相对于所述测量对象表面以预定角度入射在所述测量对象表面上; 第二光束折叠单元，折叠由测量对象表面反射的测量光束; 以及光束组合单元，其将由第二光束折叠单元折叠的测量光束与参考光束组合。

10. 发明申请

US20100026983A1 LIGHTWAVE INTERFEROMETRIC DISTANCE MEASURING METHOD AND APPARATUS 有权
标题翻译：光线干涉测距方法和装置
公开(公告)号：US20100026983A1
公开(公告)日：2010-02-04
申请号：US12511406
申请日：2009-07-29
申请人： Kazuhiko KAWASAKI , Kaoru MIYATA
发明人： Kazuhiko KAWASAKI , Kaoru MIYATA
IPC分类号： G01C3/08 , G01C3/00
CPC分类号： G01B9/02008 , G01B9/02005 , G01B9/02069 , G01B2290/60
摘要： When the geometric distance L from the body of an interferometer to a target 110 is accurately measured from distance measurement values D1, D2 which are obtained by a lightwave interferometric measurement using laser beams of plural wavelengths λ1, λ2, while correcting the refractive index of air, the wavelengths of the laser beams are measured by using an optical comb generated from an optical comb generator 104. In this case, the oscillation wavelength of a variable wavelength laser 101 is measured by using the optical comb, and a feedback control is performed, whereby laser beams of plural predetermined wavelengths are obtained, or a variable wavelength laser is caused to oscillate at plural arbitrary wavelengths to obtain plural distance measurement values. The wavelengths (frequencies) of laser beams when the respective distance measurement values are obtained are measured by the optical comb, and used in calculation of the geometric distance. Plural lasers 416, 417 are used, and the geometric distance is obtained while the wavelengths of laser beams oscillated from the lasers are measured by the optical comb.
摘要翻译：当从通过使用多个波长λ1，λ2的激光的光波干涉测量获得的距离测量值D1，D2精确地测量从干涉仪的主体到目标110的几何距离L时，同时校正空气的折射率通过使用从光梳发生器104产生的光梳来测量激光束的波长。在这种情况下，通过使用光梳来测量可变波长激光器101的振荡波长，并进行反馈控制，从而获得多个预定波长的激光束，或者使可变波长激光器以多个任意波长振荡，以获得多个距离测量值。获得各距离测量值时激光束的波长（频率）通过光梳测量，并用于计算几何距离。使用多个激光器416,471，并且通过光梳测量从激光器振荡的激光束的波长，获得几何距离。

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