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    • 8. 发明申请
    • Semiconductor device and method of producing same
    • 半导体装置及其制造方法
    • US20060275990A1
    • 2006-12-07
    • US11432264
    • 2006-05-11
    • Kazuichiro Itonaga
    • Kazuichiro Itonaga
    • H01L21/00H01L21/336H01L23/58
    • H01L29/6656H01L29/6659H01L29/7833H01L29/7838H04N5/3741Y10S438/945
    • A semiconductor device suitable for a source-follower circuit, provided with a gate electrode formed on a semiconductor substrate via a gate insulation film, a first conductivity type layer formed in the semiconductor substrate under a conductive portion of the gate electrode and containing a first conductivity type impurity, first source/drain regions of the first conductivity type impurity formed in the semiconductor substrate and extended from edge portions of the gate electrode, and second source/drain regions having a first conductivity type impurity concentration lower than that in the first source/drain regions and formed adjoining the gate insulation film and the first source/drain regions in the semiconductor substrate so as to overlap portions of the conductive portion of the gate electrode.
    • 一种适用于源极跟随器电路的半导体器件,其设置有通过栅极绝缘膜形成在半导体衬底上的栅极电极,形成在半导体衬底中的栅极电极的导电部分下方并且包含第一导电性的第一导电型层 形成在半导体衬底中并从栅电极的边缘部分延伸的第一导电类型杂质的第一源极/漏极区域,以及具有比第一源极/漏极区域低的第一导电类型杂质浓度的第二源极/ 漏区,并且与半导体衬底中的栅极绝缘膜和第一源极/漏极区相邻地形成,以与栅电极的导电部分重叠。