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    • 2. 发明授权
    • Amplifier circuit for optical disk drive
    • 用于光盘驱动器的放大器电路
    • US07476839B2
    • 2009-01-13
    • US10983737
    • 2004-11-09
    • Hiroshi YamaguchiMasaki Taniguchi
    • Hiroshi YamaguchiMasaki Taniguchi
    • H03F3/06H03F3/45H03G3/00G11B11/00
    • H03F3/08H03F3/45085H03F2203/45466H03G3/3084
    • An operational amplifier including a pair of differential input transistors is provided with a feedback resistor switching circuit and a variable current source. When a loaded optical disk is a DVD-ROM, the feedback resistor switching circuit reduces a gain of the operational amplifier and the variable current source selects a large current (of, for example, 1 mA) as a common bias current supplied to the differential input transistors. When the loaded optical disk is a DVD-RAM with low reflectance and low recording/reproducing speed, the feedback resistor switching circuit enhances the gain of the operational amplifier and the variable current source selects a small current (of, for example, 0.5 mA) as the common bias current.
    • 包括一对差分输入晶体管的运算放大器设置有反馈电阻器切换电路和可变电流源。 当加载的光盘是DVD-ROM时,反馈电阻器开关电路降低运算放大器的增益,并且可变电流源选择大电流(例如,1mA)作为提供给差分器的公共偏置电流 输入晶体管。 当装载的光盘是具有低反射率和低记录/再现速度的DVD-RAM时,反馈电阻器切换电路增强了运算放大器的增益,并且可变电流源选择小电流(例如,0.5mA) 作为常见的偏置电流。
    • 5. 发明授权
    • Amplifier unit and optical disc drive
    • 放大器单元和光盘驱动器
    • US07391265B2
    • 2008-06-24
    • US11430241
    • 2006-05-09
    • Shinichi MiyamotoYousuke KuroiwaMasaya UedaHideo FukudaHiroshi YamaguchiMasaki Taniguchi
    • Shinichi MiyamotoYousuke KuroiwaMasaya UedaHideo FukudaHiroshi YamaguchiMasaki Taniguchi
    • H03F3/45H03F3/08
    • H03F3/3432H03F3/08H03F2200/78
    • An amplifier unit is provided, with which the need for manufacturing a photoelectric conversion IC in Bi-CMOS process is eliminated, and relatively low process cost of the photoelectric conversion IC is achieved. The input section of a buffer (the base of a transistor Q5) is connected with a plurality of patterns of phase compensation circuits each including a resistor and a capacitor connected in series. A bipolar transistor (Q6) is interposed between a positive power supply line and a capacitor (C2) forming a capacitance of the phase compensation circuit. By switching on/off the bipolar transistor (Q6), the capacitance value and resistance value of the phase compensation circuit are switched. Since the bipolar transistor (Q6) is interposed between the capacitor (C2) and the positive power supply line, base current (Isw) acting as a switch signal does not affect the amplifier unit.
    • 提供放大器单元,消除了在Bi-CMOS工艺中制造光电转换IC的需要,并且实现了光电转换IC的相对低的处理成本。 缓冲器(晶体管Q 5的基极)的输入部分与多个相位补偿电路相连,每个相位补偿电路均包括串联连接的电阻器和电容器。 在正电源线和形成相位补偿电路的电容的电容器(C 2)之间插入双极晶体管(Q6)。 通过接通/关断双极晶体管(Q 6),相位补偿电路的电容值和电阻值被切换。 由于双极晶体管(Q 6)插在电容器(C 2)和正电源线之间,所以作为开关信号的基极电流(Isw)不影响放大器单元。
    • 6. 发明申请
    • TEST CIRCUIT AND TEST METHOD
    • 测试电路和测试方法
    • US20070252602A1
    • 2007-11-01
    • US11677077
    • 2007-02-21
    • Yousuke KUROIWAHideo FUKUDAHiroshi YAMAGUCHITetsuo CHATOYuzo SHIMIZUMasaki TANIGUCHI
    • Yousuke KUROIWAHideo FUKUDAHiroshi YAMAGUCHITetsuo CHATOYuzo SHIMIZUMasaki TANIGUCHI
    • G01R23/02
    • H03F3/087G01R31/025H03F3/45475H03F2200/252H03F2203/45564
    • The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the light-receiving elements and each of the amplifiers. In this test circuit, the electric current supplying unit selectively supplies an electric current to a first group of light-receiving elements and to a second group of light-receiving elements, the first group of light-receiving elements including light-receiving elements, out of the plurality of light-receiving elements, which are neither vertically nor horizontally adjacent to each other, and the second group of light-receiving elements including light-receiving elements, out of is the plurality of light-receiving elements, which are vertically or horizontally adjacent to the light-receiving elements of the first group of light-receiving elements.
    • 根据本发明的测试电路包括:多个光接收元件; 多个放大器,每个放大器将从一个光接收元件提供的光电流转换成电压; 以及电流供应单元,其向每个光接收元件和每个放大器提供电流。 在该测试电路中,电流供给单元选择性地将电流提供给第一组光接收元件和第二组光接收元件,第一组光接收元件包括光接收元件 多个光接收元件彼此不垂直或水平相邻,并且包括光接收元件的第二组光接收元件是多个光接收元件,多个光接收元件是垂直或 水平地邻近第一组光接收元件的光接收元件。