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    • 9. 发明授权
    • Microwave probe for furnace refractory material
    • 炉用耐火材料微波探头
    • US09255794B2
    • 2016-02-09
    • US13706787
    • 2012-12-06
    • PaneraTech, Inc.
    • Eric WaltonYakup Bayram
    • G06F15/00G01B15/02F27D21/00G01N22/02
    • G01B15/02F27D21/0021G01N22/02G06F15/00
    • Disclosed is a system and method to aid in these inspections that avoid the disadvantages of the prior art. The system and method are operative to take thickness measurements of, and thus evaluate the condition of, materials including but not limited to refractory materials, operating in frequency bands that result in less loss than previously known technologies, and utilizing a system configuration and signal processing techniques that isolate the reflected signal of interest from other spurious antenna reflections, particularly by creating (through the configuration of the antenna assembly) a time delay between such spurious reflections and the actual reflected signal of interest, thus enabling better isolation of the signal of interest. Still further, the antenna assembly is intrinsically matched to the material to be probed, such as by impedance matching the antenna to the particular material (through knowledge of the dielectric and magnetic properties of the material to be evaluated) to even further suppress spurious reflections.
    • 公开了一种帮助这些检查的系统和方法,以避免现有技术的缺点。 该系统和方法可操作以进行厚度测量,并且因此评价包括但不限于耐火材料的材料的状态,其在频带中操作,导致比先前已知技术更少的损耗,并且利用系统配置和信号处理 特别是通过产生(通过天线组合的配置)这种寄生反射与感兴趣的实际反射信号之间的时间延迟,从而使感兴趣的信号更好地隔离,从而将感兴趣的反射信号与其他假天线反射隔离开来的技术 。 此外,天线组件本质上与要探测的材料匹配,例如通过将天线与特定材料的阻抗匹配(通过了解待评估材料的介电和磁特性),以进一步抑制寄生反射。
    • 10. 发明申请
    • DEVICE AND METHOD FOR EVALUATION OF A MATERIAL
    • 用于评估材料的装置和方法
    • US20150362439A1
    • 2015-12-17
    • US14732831
    • 2015-06-08
    • PaneraTech, Inc.
    • Yakup BayramAlexander RuegeEric WaltonPeter Hagan
    • G01N22/00G01M3/00G01N22/02
    • G01N22/02G01M3/16G01M3/40
    • Disclosed is an improved device and method to evaluate the status of a material by scanning an area that overlaps a region of the material under evaluation. The device and method are operative to identify a leakage of a first material into a second material, such as a molten material surrounded by a refractory material, to measure the thickness of the second material, using electromagnetic waves, and to generate images. The device is designed to reduce a plurality of reflections associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities present in between the device and the enclosed material. Furthermore, the device can be configured to scan areas of interest in either a portable or fixed configuration, manually in a standalone mode or as part of an automated system.
    • 公开了一种通过扫描与被评估材料的区域重叠的区域来评估材料状态的改进的装置和方法。 该装置和方法用于识别第一材料泄漏到第二材料(例如由耐火材料包围的熔融材料)中,以使用电磁波测量第二材料的厚度并产生图像。 该装置被设计成减少与发射到被评估材料中的电磁波的传播相关联的多个反射足够的程度,以便能够检测出存在于装置和封闭件之间的远程不连续性的感兴趣的电磁波 材料。 此外,该设备可以被配置为以便携式或固定配置扫描感兴趣的区域,手动地以独立模式或作为自动化系统的一部分。