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    • 4. 发明授权
    • Organic electroluminescent device
    • 有机电致发光器件
    • US07227313B2
    • 2007-06-05
    • US11080883
    • 2005-03-15
    • Johannes N. HuibertsLoic C. A. MourierPeter Van De WeijerCoen T. H. F. LiedenbaumMartinus H. W. M. Van Delden
    • Johannes N. HuibertsLoic C. A. MourierPeter Van De WeijerCoen T. H. F. LiedenbaumMartinus H. W. M. Van Delden
    • G09G3/10
    • H01L51/5012G01R31/2642
    • The invention provides a tool to select reliable organic LED devices, where the risk for failure before the end of its lifetime is low. This tool comprises the steps of: i) subjecting the device to a high electric field over the electroluminescent layer. This leads to a division of the devices into two, clearly separated, populations, namely one population with a low leakage current (current through the electroluminescent layer in reverse voltage operation) and one population with a high leakage current. In this step, the first population is selected in accordance with a current criterion. ii) detecting instabilities in the leakage current, referred to as noise. It has been established that these instabilities arise in particular at reverse driving voltages between 1 and 10 Volts. These instabilities are a measure of the occurrence of early failures during operation. In this step, the devices are selected in accordance with a noise criterion.
    • 本发明提供了一种用于选择可靠的有机LED器件的工具,其中在其寿命结束之前故障的风险低。 该工具包括以下步骤:i)使器件在电致发光层上经受高电场。 这导致将器件分成两个明确分离的群体,即具有低泄漏电流的一个群体(反向电压操作中通过电致发光层的电流)和具有高泄漏电流的一个群体。 在该步骤中,根据当前标准选择第一群体。 ii)检测泄漏电流的不稳定性,称为噪声。 已经确定,这些不稳定性特别地在1至10伏之间的反向驱动电压下产生。 这些不稳定性是测量手术期间早期失败的发生。 在该步骤中,根据噪声标准来选择装置。
    • 6. 发明授权
    • Organic electroluminescent device
    • 有机电致发光器件
    • US06525484B1
    • 2003-02-25
    • US09666888
    • 2000-09-22
    • Johannes N. HuibertsLoic C. A. MourierPeter Van De WeijerCoen T. H. F. LiedenbaumMartinus H. W. M. Van Delden
    • Johannes N. HuibertsLoic C. A. MourierPeter Van De WeijerCoen T. H. F. LiedenbaumMartinus H. W. M. Van Delden
    • G09G310
    • H01L51/5012G01R31/2642
    • The invention provides a tool to select reliable organic LED devices, where the risk for failure before the end of its lifetime is low. This tool comprises the steps of: i) subjecting the device to a high electric field over the electroluminescent layer. This leads to a division of the devices into two, clearly separated, populations, namely one population with a low leakage current (current through the electroluminescent layer in reverse voltage operation) and one population with a high leakage current. In this step, the first population is selected in accordance with a current criterion. ii) detecting instabilities in the leakage current, referred to as noise. It has been established that these instabilities arise in particular at reverse driving voltages between 1 and 10 Volts. These instabilities are a measure of the occurrence of early failures during operation. In this step, the devices are selected in accordance with a noise criterion.
    • 本发明提供了一种用于选择可靠的有机LED器件的工具,其中在其寿命结束之前故障的风险低。 该工具包括以下步骤:i)使器件在电致发光层上经受高电场。 这导致将器件分成两个明确分离的群体,即具有低泄漏电流的一个群体(反向电压操作中通过电致发光层的电流)和具有高泄漏电流的一个群体。 在该步骤中,根据当前标准选择第一群体.ii)检测泄漏电流的不稳定性,称为噪声。 已经确定,这些不稳定性特别地在1至10伏之间的反向驱动电压下产生。 这些不稳定性是测量手术期间早期失败的发生。 在该步骤中,根据噪声标准来选择装置。
    • 9. 发明申请
    • ENCAPSULATION FOR AN ELECTRONIC THIN FILM DEVICE
    • 电子薄膜装置的封装
    • US20100155709A1
    • 2010-06-24
    • US12600707
    • 2008-05-21
    • Martinus Jacobus Johannes HackThomas Nicolaas Maria BernardsPeter Van De Weijer
    • Martinus Jacobus Johannes HackThomas Nicolaas Maria BernardsPeter Van De Weijer
    • H01L51/52H01L51/56
    • H01L51/5256
    • The present invention relates to an encapsulation for an electronic thin film device, comprising a first barrier layer (108), a second barrier layer (112), and a first planarization layer (110′) for reducing the formation of pinholes in a subsequent barrier layer, said first planarization layer (110′) arranged between the first barrier layer (108) and the second barrier layer (112), wherein the first planarization layer (110′) is composed of a first plurality of planarization segment (114) having areas formed between each other, and the encapsulation further comprises a second planarization layer (116) arranged between the second barrier layer (112) and a third barrier layer (120), wherein the second planarization layer (116) is composed of a second plurality of planarization segments (118) arranged to extend over the areas between the first plurality of planarization segments (114), thereby further reducing the number of pinholes providing passageways through the encapsulation. According to the invention, by arranging the barrier layers and the planarization layers in a horizontal multi-layer encapsulation stack, where planarization segments in each of the layers are essentially decoupled from each other and in practice non-interconnecting with each other, it is possible to limit the lateral transportation of water and oxygen through the planarization layer. Instead, if water/oxygen enters the top barrier layer, and eventually a planarization segment, it is contained in the “sphere” of a planarization segment, having a minimized possibility of entering a pinhole in a subsequent barrier layer. The present invention also relates to corresponding method for the formation of an encapsulation for an electronic thin film device.
    • 本发明涉及一种用于电子薄膜器件的封装,其包括第一阻挡层(108),第二阻挡层(112)和用于减少随后屏障中针孔形成的第一平坦化层(110') 层,所述第一平坦化层(110')布置在所述第一阻挡层(108)和所述第二阻挡层(112)之间,其中所述第一平坦化层(110')由第一多个平坦化段(114) 所述封装还包括布置在所述第二阻挡层(112)和第三阻挡层(120)之间的第二平坦化层(116),其中所述第二平坦化层(116)由第二多层 布置成在第一多个平坦化段(114)之间的区域上延伸的平坦化段(118),从而进一步减少提供通过封装的通路的针孔的数量。 根据本发明,通过在水平多层封装堆叠中布置势垒层和平坦化层,其中每个层中的平坦化部分基本上彼此分离并且实际上彼此不互连,这是可能的 以限制通过平坦化层的水和氧的横向运输。 相反,如果水/氧进入顶部阻挡层,并且最终进入平坦化段,则其被包含在平坦化段的“球体”中,具有在随后的阻挡层中进入针孔的最小可能性。 本发明还涉及用于形成电子薄膜器件封装的相应方法。