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    • 2. 发明申请
    • DETECTING CROSS-TALK ON PROCESSOR LINKS
    • 检测处理器链接的交叉口
    • US20130103354A1
    • 2013-04-25
    • US13281097
    • 2011-10-25
    • Robert W. Berry, JR.Anand HaridassPrasanna Jayaraman
    • Robert W. Berry, JR.Anand HaridassPrasanna Jayaraman
    • G06F11/30
    • G06F9/30145G06F9/30G06F11/3409G06F11/3414G06F11/3466G06F11/349
    • A first of a plurality of data lanes of a first of a plurality of processor links is determined to have a weakest of base performance measurements for the plurality of data lanes. A switching data pattern is transmitted via a first set of the remainder processor links and a quiet data pattern is transmitted via a second set of the remainder processor links. If performance of the first data lane increases vis-à-vis the corresponding base performance measurement, the first set of remainder processor links is eliminated from the remainder processor links. If performance of the first data lanes decreases vis-à-vis the corresponding base performance measurement, the second set of remainder processor links is eliminated from the remainder processor links. The above operations are repeatedly executed until an aggressor processor link that is determined to decrease performance of the first of the plurality of data lanes is identified.
    • 多个处理器链路中的第一个处理器链路的多个数据通路中的第一个被确定为对于多个数据通道具有最弱的基本性能测量。 经由剩余处理器链路的第一组发送切换数据模式,并且经由剩余处理器链路的第二组发送安静数据模式。 如果第一数据线的性能相对于相应的基本性能测量增加,则剩余处理器链路的第一组从剩余处理器链路中消除。 如果第一数据通道的性能相对于相应的基本性能测量值降低,则剩余处理器链路的第二组从剩余处理器链路中消除。 重复执行上述操作,直到识别出被确定为降低多个数据通道中的第一个数据通道的性能的攻击者处理器链路。
    • 4. 发明授权
    • Method and apparatus for memory dynamic burn-in and test
    • 用于记忆动态老化和测试的方法和装置
    • US5375091A
    • 1994-12-20
    • US163803
    • 1993-12-08
    • Robert W. Berry, Jr.Bernd K. F. KoenemannWilliam J. Scarpero, Jr.Philip G. Shephard, IIIKenneth D. WagnerGulsun Yasar
    • Robert W. Berry, Jr.Bernd K. F. KoenemannWilliam J. Scarpero, Jr.Philip G. Shephard, IIIKenneth D. WagnerGulsun Yasar
    • G11C29/10G11C29/50G11C13/00
    • G11C29/10G11C29/50
    • A memory embedded in a integrated processor chip is dynamically stressed tested by repeatedly writing a test pattern to the data locations of the memory in which a high percentage of the memory cells are sequentially written with complementary data in order to create a high stress on the memory devices. The test pattern is generated as a function of the number of address locations of the memory and the number of data bits of a memory data word. The test pattern is rotated each time the memory is addressed. The test pattern preferably has a contiguous group of digits with the number of digits in the contiguous group being a function of the number of address locations and the number of data bits in the memory word. The memory data input register is configured as a recirculating loop and additional dummy bits are added to provide recirculating loops longer than the data input register. A plurality of independent circulating loops may be created in the data input register or in combination with a number of dummy register bits.
    • 嵌入在集成处理器芯片中的存储器通过重复地将测试图案写入存储器的数据位置而被动态地受到压力测试,其中高百分比的存储器单元被顺序地写有补充数据,以便在存储器上产生高应力 设备。 作为存储器的地址位置的数量和存储器数据字的数据位的数量的函数产生测试图案。 每次存储器寻址时,测试模式都会旋转。 测试图案优选地具有连续的数字组,连续组中的位数是作为存储器字中的地址位置数和数据位数的函数。 存储器数据输入寄存器被配置为循环回路,并添加额外的虚拟位以提供比数据输入寄存器更长的再循环回路。 可以在数据输入寄存器中或与多个虚拟寄存器位组合地产生多个独立的循环回路。