会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • METHOD FOR PRODUCING ELECTRICALLY-CONDUCTING MATERIAL WITH MODIFIED SURFACE
    • 用改性表面生产导电材料的方法
    • US20140144782A1
    • 2014-05-29
    • US13819121
    • 2011-08-26
    • Masayasu NagoshiKaoru SatoSeiichi WatanabeSouki Yoshida
    • Masayasu NagoshiKaoru SatoSeiichi WatanabeSouki Yoshida
    • C25D5/16
    • C25D5/16C23C26/00C25F1/00C25F3/00
    • A method to inexpensively and efficiently produce conductive materials on the surface of which a nano-level fine structure is formed includes surface modification including immersing a stable anode electrode and a workpiece as a cathode electrode, the workpiece including a conductive material with a work surface, in an electrolytic solution, then applying a voltage not less than a first voltage and less than a second voltage between the stable anode electrode and the workpiece as the cathode electrode immersed in the electrolytic solution, thereby modifying the work surface, the first voltage being a voltage corresponding to a current value that is ½ of the sum of a first maximum current value appearing first in a positive voltage region and a first minimum current value appearing first in the positive voltage region with respect to voltage-current characteristics of a surface modification treatment system, the second voltage exhibiting a complete-state plasma.
    • 在其上形成纳米级精细结构的表面上廉价有效地制造导电材料的方法包括表面改性,包括浸渍稳定的阳极电极和工件作为阴极,工件包括具有工作表面的导电材料, 在电解液中,在浸渍在电解液中的阴极电极之间施加稳定的阳极和工件之间的不小于第一电压和小于第二电压的电压,从而改变工作表面,第一电压为 对应于相对于表面改性处理的电压 - 电流特性,正电压区域中首先出现的第一最大电流值和正电压区域中首先出现的第一最小电流值之和的电流值的1/2的电压 系统,第二电压呈现完全状态的等离子体。
    • 2. 发明授权
    • Plasma processing method
    • 等离子体处理方法
    • US08497213B2
    • 2013-07-30
    • US12013537
    • 2008-01-14
    • Naoki YasuiSeiichi Watanabe
    • Naoki YasuiSeiichi Watanabe
    • H01L21/302
    • H01L21/32139H01L21/0273H01L21/28035
    • The invention provides a method for subjecting laminated thin films disposed below a photoresist mask pattern to plasma processing, wherein the roughness on the side walls of the formed pattern is reduced, and the LER and LWR are reduced. When etching a material to be processed to form a gate electrode including thin films such as a gate insulating film 205, a conducting layer 204, a mask layer 203 and an antireflection film 202 laminated on a semiconductor substrate 206 and a photoresist mask pattern 201 disposed on the antireflection film, prior to etching the mask pattern 201, plasma is generated from nitrogen gas or a mixed gas including nitrogen gas and deposition gas to subject the mask pattern 201 to a plasma curing process so as to reduce the roughness on the surface and side walls of the mask pattern 201, and then the laminated thin films 202, 203 and 204 disposed below the mask pattern 201 are subjected to a plasma etching process.
    • 本发明提供了一种用于对设置在光致抗蚀剂掩模图案下方的层叠薄膜进行等离子体处理的方法,其中形成图案的侧壁上的粗糙度减小,并且LER和LWR减小。 当蚀刻待处理的材料以形成包括诸如栅极绝缘膜205,导电层204,掩模层203和层叠在半导体衬底206上的抗反射膜202和设置的光刻胶掩模图案201的薄膜的栅电极时 在防反射膜上,在蚀刻掩模图案201之前,从氮气或包括氮气和沉积气体的混合气体产生等离子体,以使掩模图案201进行等离子体固化处理,以减少表面上的粗糙度, 掩模图案201的侧壁,然后设置在掩模图案201下方的层叠薄膜202,203和204进行等离子体蚀刻处理。
    • 4. 发明申请
    • Plasma Processing Apparatus and Plasma Processing Method
    • 等离子体处理装置和等离子体处理方法
    • US20120145323A1
    • 2012-06-14
    • US13399465
    • 2012-02-17
    • Hitoshi TamuraNaoki YasuiSeiichi Watanabe
    • Hitoshi TamuraNaoki YasuiSeiichi Watanabe
    • B05C11/00
    • H01L21/6833H01J37/32706
    • A plasma processing apparatus for subjecting a substrate to be processed to plasma processing includes a processing chamber, a substrate electrode having an electrostatic chuck mechanism, a plasma generator, a high-frequency bias power supply which applies a high-frequency bias voltage to the substrate electrode, a voltage monitor which monitors the high-frequency bias voltage, a current monitor which monitors a high-frequency bias current, a measurement storage unit which stores a resistance component, an induction component and a capacity component of the electrostatic chuck mechanism, which have been calculated beforehand as fitting parameters of an expression V w = V esc - R esc  I esc - L esc   I esc  t - 1 C esc  ∫ I esc   t + A , ( A ) that is an approximate curve of a correlation among a voltage of the substrate, a computing unit which estimates the voltage of the substrate according to the expression, and a control unit that generates a control signal for the high-frequency bias power supply based on the voltage of the substrate.
    • 用于对待处理的基板进行等离子体处理的等离子体处理装置包括处理室,具有静电卡盘机构的基板电极,等离子体发生器,向基板施加高频偏置电压的高频偏置电源 电极,监视高频偏置电压的电压监视器,监视高频偏置电流的电流监视器,存储电阻分量的测量存储单元,静电卡盘机构的感应部件和电容分量,其中 预先计算出的表达式的拟合参数V w = V esc - R esc I I I - - - - - - - ( - 衬底的电压,根据表达式估计衬底的电压的计算单元和产生t的控制信号的控制单元之间的相关性的近似曲线 他基于基板电压的高频偏置电源。
    • 10. 发明申请
    • PLASMA PROCESSING METHOD
    • 等离子体处理方法
    • US20080182419A1
    • 2008-07-31
    • US12013537
    • 2008-01-14
    • Naoki YasuiSeiichi Watanabe
    • Naoki YasuiSeiichi Watanabe
    • H01L21/3065
    • H01L21/32139H01L21/0273H01L21/28035
    • The invention provides a method for subjecting laminated thin films disposed below a photoresist mask pattern to plasma processing, wherein the roughness on the side walls of the formed pattern is reduced, and the LER and LWR are reduced. When etching a material to be processed to form a gate electrode including thin films such as a gate insulating film 205, a conducting layer 204, a mask layer 203 and an antireflection film 202 laminated on a semiconductor substrate 206 and a photoresist mask pattern 201 disposed on the antireflection film, prior to etching the mask pattern 201, plasma is generated from nitrogen gas or a mixed gas including nitrogen gas and deposition gas to subject the mask pattern 201 to a plasma curing process so as to reduce the roughness on the surface and side walls of the mask pattern 201, and then the laminated thin films 202, 203 and 204 disposed below the mask pattern 201 are subjected to a plasma etching process.
    • 本发明提供了一种用于对设置在光致抗蚀剂掩模图案下方的层叠薄膜进行等离子体处理的方法,其中形成图案的侧壁上的粗糙度减小,并且LER和LWR减小。 当蚀刻待处理的材料以形成包括诸如栅极绝缘膜205,导电层204,掩模层203和层叠在半导体衬底206上的抗反射膜202和设置的光刻胶掩模图案201的薄膜的栅电极时 在防反射膜上,在蚀刻掩模图案201之前,从氮气或包括氮气和沉积气体的混合气体产生等离子体,以使掩模图案201进行等离子体固化处理,以减少表面上的粗糙度, 掩模图案201的侧壁,然后设置在掩模图案201下方的层叠薄膜202,203和204进行等离子体蚀刻处理。