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    • 2. 发明授权
    • Image sensor with floating diffusion gate capacitor
    • 具有浮动扩散栅极电容器的图像传感器
    • US07498623B2
    • 2009-03-03
    • US11399311
    • 2006-04-07
    • Sungkwon C. Hong
    • Sungkwon C. Hong
    • H01L31/062
    • H01L27/14609H04N5/335H04N5/3559H04N5/3591
    • Pixel cells are provided which employ a gate capacitor associated with the floating diffusion node to selectively increase the storage capacity of the floating diffusion node. The gate capacitor can be formed at the same time as the same process steps used to form other gates of the pixel cells. The inherent capacity of the storage node alone may be sufficient under low light conditions. Higher light conditions may result in selective activation of the gate capacitor, thus increasing the capacity of the storage node with the additional capacity provided by the gate capacitor. The invention produces high dynamic range and high output signal without charge sharing or lag output signal. Methods of forming such pixel cells can be applied in CMOS and CCD imaging devices, image pixel arrays in CMOS and CCD imaging devices, and CMOS and CCD imager systems.
    • 提供像素单元,其使用与浮动扩散节点相关联的栅极电容器来选择性地增加浮动扩散节点的存储容量。 栅极电容器可以与用于形成像素单元的其它栅极的相同的工艺步骤同时形成。 存储节点单独的固有容量在低光条件下可能是足够的。 较高的光照条件可能导致栅极电容器的选择性激活,从而通过栅极电容器提供的附加容量增加存储节点的容量。 本发明产生高动态范围和高输出信号,无电荷共享或滞后输出信号。 形成这种像素单元的方法可以应用于CMOS和CCD成像器件,CMOS和CCD成像器件中的图像像素阵列以及CMOS和CCD成像器系统。
    • 7. 发明申请
    • 4T CMOS IMAGE SENSOR WITH FLOATING DIFFUSION GATE CAPACITOR
    • 4T CMOS图像传感器,带浮动扩散门电容器
    • US20090134313A1
    • 2009-05-28
    • US12362944
    • 2009-01-30
    • Sungkwon C. Hong
    • Sungkwon C. Hong
    • H01L31/08
    • H01L27/14609H04N5/335H04N5/3559H04N5/3591
    • Pixel cells are provided which employ a gate capacitor associated with the floating diffusion node to selectively increase the storage capacity of the floating diffusion node. The gate capacitor can be formed at the same time as the same process steps used to form other gates of the pixel cells. The inherent capacity of the storage node alone may be sufficient under low light conditions. Higher light conditions may result in selective activation of the gate capacitor, thus increasing the capacity of the storage node with the additional capacity provided by the gate capacitor. The invention produces high dynamic range and high output signal without charge sharing or lag output signal. Methods of forming such pixel cells can be applied in CMOS and CCD imaging devices, image pixel arrays in CMOS and CCD imaging devices, and CMOS and CCD imager systems.
    • 提供像素单元,其使用与浮动扩散节点相关联的栅极电容器来选择性地增加浮动扩散节点的存储容量。 栅极电容器可以与用于形成像素单元的其它栅极的相同的工艺步骤同时形成。 存储节点单独的固有容量在低光条件下可能是足够的。 较高的光照条件可能导致栅极电容器的选择性激活,从而通过栅极电容器提供的附加容量增加存储节点的容量。 本发明产生高动态范围和高输出信号,无电荷共享或滞后输出信号。 形成这种像素单元的方法可以应用于CMOS和CCD成像器件,CMOS和CCD成像器件中的图像像素阵列以及CMOS和CCD成像器系统。
    • 9. 发明授权
    • Apparatus with silicide on conductive structures
    • 具有硅化物导电结构的装置
    • US06900507B1
    • 2005-05-31
    • US10751941
    • 2004-01-07
    • Sungkwon C. Hong
    • Sungkwon C. Hong
    • H01L27/146H01L27/148H01L29/72
    • H01L27/0629H01L27/14603H01L27/14609H01L27/14643H01L27/14683H01L27/14689H01L28/60
    • Exemplary embodiments of the invention provide pixel circuits having transistors with silicide on top of their gate stacks. In the exemplary embodiments, silicide forming material does not contaminate other components such as the photoconversion devices of an imager integrated circuit (IC). The photoconversion devices are blocked during silicide formation and are therefore not contaminated with silicide or metallic components. In other exemplary embodiments, each pixel of an imager also includes an optional in-pixel capacitor that has stabilized capacitance versus voltage characteristics due to its metal-dielectric-polysilicon structure, where the metal is a metal silicide over a conductive silicon layer.
    • 本发明的示例性实施例提供了具有在其栅极堆叠顶部具有硅化物的晶体管的像素电路。 在示例性实施例中,硅化物形成材料不会污染诸如成像器集成电路(IC)的光电转换器件的其它部件。 在硅化物形成期间,光电转换器件被阻塞,因此不会被硅化物或金属元件污染。 在其他示例性实施例中,成像器的每个像素还包括可选的像素内电容器,其由于其金属 - 电介质 - 多晶硅结构而具有稳定的电容对电压特性,其中金属是导电硅层上的金属硅化物。