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    • 7. 发明申请
    • Wafer holder for wafer prober and wafer prober equipped with same
    • 用于晶圆探针和晶圆探测器的晶片支架配备相同
    • US20090045829A1
    • 2009-02-19
    • US11496019
    • 2006-07-31
    • Tomoyuki AwazuKatsuhiro ItakuraMasuhiro NatsuharaHirohiko Nakata
    • Tomoyuki AwazuKatsuhiro ItakuraMasuhiro NatsuharaHirohiko Nakata
    • G01R31/26H05B3/68
    • G01R31/2865G01R31/2875
    • It is an object of the present invention to provide a wafer prober wafer holder that is highly rigid and increases the heat insulating effect, thereby improving positional accuracy, thermal uniformity, and chip temperature ramp-up and cooling rates, as well as a wafer prober device equipped therewith.A wafer holder of the present invention includes a chuck top that mounts a wafer, and a support member that supports the chuck top, wherein, a restricting member is provided that covers an interface between the chuck top and the support member. By covering the gap between the chuck top and the support member with the restricting member, the heat insulating effect can be increased by preventing the flow of outside air through the gap into the support member, and the cooling rate can be particularly improved if cooling to a temperature below room temperature.
    • 本发明的目的是提供一种高度刚性的晶片探针晶片保持器,并且增加隔热效果,从而提高位置精度,热均匀性以及芯片温度升高和冷却速度,以及晶片探测器 装备的装置。 本发明的晶片保持器包括安装晶片的卡盘顶部和支撑卡盘顶部的支撑构件,其中设置有限制构件,该限制构件覆盖卡盘顶部和支撑构件之间的界面。 通过用限制构件覆盖卡盘顶部和支撑构件之间的间隙,可以通过防止外部空气通过间隙流入支撑构件而提高隔热效果,并且如果冷却至 温度低于室温。