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    • 7. 发明申请
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US20060083046A1
    • 2006-04-20
    • US11245075
    • 2005-10-07
    • Masashi AgataMasanori ShirahamaToshiaki KawasakiRyuji Nishihara
    • Masashi AgataMasanori ShirahamaToshiaki KawasakiRyuji Nishihara
    • G11C17/00
    • G11C17/18
    • A fuse device and a program transistor are connected in series with each other. A flip-flop turns ON, in response to a start signal, the program transistor to start program of the fuse device. A 2-input NAND circuit outputs an end signal at a time point where change in a resistance value of the fuse device is increased to reach a predetermined level while monitoring change in the resistance value of the fuse device through change in a voltage at a junction point of the fuse device and the program transistor. The flip-flop turns OFF, in response to the end signal, the program transistor to automatically terminate the program of the fuse device. Thus, the resistance value of the fuse device is increased to the predetermined level in a minimum program time.
    • 熔丝器件和程序晶体管彼此串联连接。 触发器响应于启动信号而导通,程序晶体管开始保险丝装置的编程。 2输入NAND电路在熔断器件的电阻值的变化增加以达到预定值的时间点输出结束信号,同时通过接点处的电压变化来监测熔丝器件的电阻值的变化 保险丝装置和程序晶体管的点。 触发器关闭,响应于结束信号,程序晶体管自动终止保险丝装置的程序。 因此,保险丝装置的电阻值在最小程序时间内增加到预定电平。
    • 9. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US06995436B2
    • 2006-02-07
    • US10860112
    • 2004-06-04
    • Toshiaki Kawasaki
    • Toshiaki Kawasaki
    • H01L29/76
    • G11C16/0416G11C2216/10H01L27/115H01L27/11558Y10S257/909
    • In a memory cell, the substrate contact region of an NMOS transistor and the well contact region of a PMOS transistor are arranged perpendicularly to a floating gate. In a cell array, the memory cell and another memory cell arranged axisymmetrically with respect to the memory cell are alternately arranged in the column direction to constitute a sub array, and the sub arrays arranged in the column direction are arranged in parallel or axisymmetically in the row direction. With this arrangement, the substrate contact region, the well contact region, and the diffusion region of the PMOS transistor can be shared between the adjacent memory cells, thereby reducing the area of the cell array.
    • 在存储单元中,NMOS晶体管的衬底接触区域和PMOS晶体管的阱接触区域垂直于浮置栅极布置。 在单元阵列中,存储单元和相对于存储单元轴对称布置的另一个存储单元在列方向上交替布置以构成子阵列,并且沿列方向排列的子阵列平行或轴对称地布置在 行方向。 利用这种布置,可以在相邻的存储单元之间共享衬底接触区域,阱接触区域和PMOS晶体管的扩散区域,从而减小单元阵列的面积。