会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Command paths, apparatuses and methods for providing a command to a data block
    • 用于向数据块提供命令的命令路径,装置和方法
    • US08984320B2
    • 2015-03-17
    • US13074972
    • 2011-03-29
    • Venkatraghavan Bringivijayaraghavan
    • Venkatraghavan Bringivijayaraghavan
    • G06F1/12G11C7/22G11C7/10
    • G11C7/222G11C7/109G11C7/1093
    • Command paths, apparatuses, and methods for providing a command to a data block are described. In an example command path, a command receiver is configured to receive a command and a command buffer is coupled to the command receiver and configured to receive the command and provide a buffered command. A command block is coupled to the command buffer to receive the buffered command. The command block is configured to provide the buffered command responsive to a clock signal and is further configured to add a delay before to the buffered command, the delay based at least in part on a shift count. A command tree is coupled to the command block to receive the buffered command and configured to distribute the buffered command to a data block.
    • 描述用于向数据块提供命令的命令路径,设备和方法。 在示例命令路径中,命令接收器被配置为接收命令,并且命令缓冲器耦合到命令接收器并且被配置为接收命令并提供缓冲的命令。 一个命令块连接到命令缓冲区以接收缓冲命令。 命令块被配置为响应于时钟信号提供缓冲的命令,并且还被配置为在缓冲的命令之前添加延迟,所述延迟至少部分地基于移位计数。 命令树耦合到命令块以接收缓冲命令并且被配置为将缓冲的命令分发到数据块。
    • 5. 发明授权
    • Through-substrate via (TSV) testing
    • 通过基板通孔(TSV)测试
    • US09157960B2
    • 2015-10-13
    • US13411167
    • 2012-03-02
    • Venkatraghavan BringivijayaraghavanJason M. Brown
    • Venkatraghavan BringivijayaraghavanJason M. Brown
    • G01R31/3185H01L21/66G01R31/317
    • H01L22/22G01R31/31717G01R31/318513H01L23/481H01L2924/0002H01L2924/00
    • Various embodiments comprise apparatuses and methods for testing and repairing through-substrate vias in a stack of interconnected dice. In various embodiments, an apparatus is provided that includes a number of through-substrate vias to couple to one or more devices, at least one redundant through-substrate via to allow a repair of the apparatus, and a pair of pull-up devices coupled to the through-substrate vias and the redundant through-substrate via to provide a high-data value to the first end of the respective through-substrate vias. A test register is coupled the second end of each of the through-substrate vias and the redundant through-substrate via to store a received version of the high-data value. A comparator compares the high-data value with the received version of the high-data value to test the through-substrate vias for short-circuit connections.
    • 各种实施例包括用于在相互连接的骰子的堆叠中测试和修复穿过衬底通孔的装置和方法。 在各种实施例中,提供了一种装置,其包括多个穿过基板通孔以耦合到一个或多个设备,至少一个冗余的通过基板通孔以允许修复该设备,以及一对上拉设备耦合 通过衬底通孔和冗余通过衬底通孔,以提供相应贯穿衬底通孔的第一端的高数据值。 测试寄存器耦合每个贯穿衬底通孔的第二端和冗余通过衬底通孔以存储高数据值的接收版本。 比较器将高数据值与高数据值的接收版本进行比较,以测试用于短路连接的贯穿衬底通孔。
    • 6. 发明授权
    • Systems, circuits, and methods for charge sharing
    • 用于电荷共享的系统,电路和方法
    • US08582380B2
    • 2013-11-12
    • US13333822
    • 2011-12-21
    • Venkatraghavan Bringivijayaraghavan
    • Venkatraghavan Bringivijayaraghavan
    • G11C7/12
    • G11C7/12G11C7/1048
    • Systems, circuits, and methods are disclosed for charge sharing. In one such example system, a first line is configured to be driven to a first voltage representative of data to be placed on the first line and then precharged to a first precharge voltage. A second line is configured to be driven to a second voltage representative of data to be placed on the second line and then precharged to a second precharge voltage. A charge sharing device is coupled between the first line and the second line. The charge sharing device is configured to selectively allow charge from the first line to flow to the second line after the first and second lines are driven to the respective first and second voltages representative of data to be placed on the respective lines.
    • 公开了用于电荷共享的系统,电路和方法。 在一个这样的示例系统中,第一线被配置为被驱动到表示要放置在第一线上的数据的第一电压,然后预充电到第一预充电电压。 第二线被配置为被驱动到表示要放置在第二线上的数据的第二电压,然后预充电到第二预充电电压。 电荷共享装置耦合在第一线和第二线之间。 电荷共享装置被配置为在将第一和第二线路驱动到表示要放置在相应线路上的数据的相应第一和第二电压之后,选择性地允许来自第一线路的电荷流到第二线路。
    • 7. 发明授权
    • Write command and write data timing circuit and methods for timing the same
    • 写命令和写数据定时电路和定时方法相同
    • US08441888B2
    • 2013-05-14
    • US13149435
    • 2011-05-31
    • Venkatraghavan BringivijayaraghavanJason Brown
    • Venkatraghavan BringivijayaraghavanJason Brown
    • G11C8/00
    • G11C7/10G11C7/1078G11C7/109G11C7/22G11C7/222G11C8/18G11C2207/2272
    • Circuits, memories, and methods for latching a write command and later provided write data including write command and write data timing circuits. One such timing circuit includes internal write command latch to latch an internal write command in response to write command latch signal. The internal write command latch releases the latched write command in response to the write command latch signal after a latency delay. The timing circuit further includes a write leveling flip-flop (FF) circuit and a write data register. One such method includes generating and latching an internal write command. The latched internal write command is released after a latency delay responsive to the memory clock signal. The internal write command is propagated over an internal write command path. Write data is captured and internal write command latched in response to a write clock signal. The captured write data is released to be written to memory.
    • 用于锁存写命令的电路,存储器和方法,并且稍后提供包括写命令和写数据定时电路的写数据。 一个这样的定时电路包括内部写入命令锁存器,以响应写入命令锁存信号来锁存内部写入命令。 在延迟延迟之后,内部写命令锁存器响应于写命令锁存信号释放锁存的写命令。 定时电路还包括写平均触发器(FF)电路和写数据寄存器。 一种这样的方法包括产生和锁定内部写命令。 锁存的内部写入命令在响应于存储器时钟信号的延迟延迟之后被释放。 内部写入命令通过内部写命令路径进行传播。 写数据被捕获,并且内部写命令响应于写时钟信号而被锁存。 捕获的写入数据被释放以写入存储器。
    • 10. 发明授权
    • Bulk node biasing method and apparatus
    • 批量节点偏置方法和装置
    • US06965263B2
    • 2005-11-15
    • US10268313
    • 2002-10-10
    • Venkatraghavan Bringivijayaraghavan
    • Venkatraghavan Bringivijayaraghavan
    • H02M3/07H03K17/06G05F3/02
    • H03K17/063H02M3/073H03K2217/0018
    • A biasing circuit with application to a charge pump environment for coupling the appropriate terminal voltage potentials to the bulk node. Specifically, a pass gate, such as a transistor of an integrated circuit, operates to isolate a boosted voltage input from a boosting device such as a charge pump voltage doubler and to transfer or pass the related charge to an output that is coupled to a charge store. The input and output of the pass gate are subjected to variations in voltage levels creating transient voltage potential relationships between the input (e.g., source), the output (e.g., drain), and the pass gate substrate (e.g., bulk node). Such fluctuations are accommodated through continuous monitoring of the input and output terminals and, when appropriate, coupling the corresponding potential as exhibited at one of the input or output terminals to the substrate or bulk node of the pass gate.
    • 偏置电路,适用于电荷泵环境,用于将适当的端子电压电位耦合到体积节点。 具体地,诸如集成电路的晶体管的通过栅极操作以隔离来自诸如电荷泵倍压器的升压装置的升压电压输入,并将相关电荷转移或传递到耦合到电荷的输出 商店。 通过栅极的输入和输出受到电压电平变化,从而产生输入(例如,源极),输出(例如漏极)和通过栅极衬底(例如,体节点)之间的瞬态电压电位关系。 这种波动通过对输入和输出端子的连续监测以及适当时将在一个输入或输出端子处显示的相应电位耦合到通孔的基板或体积节点来适应。