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1. 发明授权

US07659711B2 Test handler including single-door-type stockers 有权
标题翻译：测试处理器，包括单门式储料器
公开(公告)号：US07659711B2
公开(公告)日：2010-02-09
申请号：US11723491
申请日：2007-03-20
申请人： Yeon-gyu Song , Ho-gyung Kim , Kyong-eob Eom , Seung-hee Lee , Jae-ho Song
发明人： Yeon-gyu Song , Ho-gyung Kim , Kyong-eob Eom , Seung-hee Lee , Jae-ho Song
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R31/2893 , G11C29/56016
摘要： A handler may include a handler system main body used for testing semiconductor devices; an open-type stocker portion on a front side of the handler system main body; and/or a plurality of single-door-type stockers in the open-type stocker portion. The single-door-type stockers may include windows on upper parts of front sides of the single-door-type stockers. The front sides of the single-door-type stockers may be protected. The handler also may include a front top door on an upper part of the front side of the handler system main body; locking stoppers below the windows of the single-door-type stockers; safety sensors on sides of the open-type stocker portion; and/or a working table in front of the open-type stocker portion. The open-type stocker portion may be below the front top door. The safety sensors may stop the handler when the single-door-type stockers are not closed.
摘要翻译：处理器可以包括用于测试半导体器件的处理器系统主体; 处理器系统主体的前侧的开放式储存器部; 和/或多个单门式储料器。单门式储料器可以包括单门式储料器前侧上部的窗户。单门式储料器的前侧可能受到保护。处理器还可以包括在处理器系统主体的正面的上部的前顶门; 在单门式储料器的窗户下面锁定塞子; 开式储料器部分侧面的安全传感器; 和/或在开放型储料机部分前面的工作台。开放式储料器部分可以在前顶门下方。当单门式储料器未关闭时，安全传感器可能会停止处理程序。

2. 发明申请

US20070221548A1 Test handler including single-door-type stockers 有权
标题翻译：测试处理器，包括单门式储料器
公开(公告)号：US20070221548A1
公开(公告)日：2007-09-27
申请号：US11723491
申请日：2007-03-20
申请人： Yeon-gyu Song , Ho-gyung Kim , Kyong-eob Eom , Seung-hee Lee , Jae-ho Song
发明人： Yeon-gyu Song , Ho-gyung Kim , Kyong-eob Eom , Seung-hee Lee , Jae-ho Song
IPC分类号： B07C5/02
CPC分类号： G01R31/2893 , G11C29/56016
摘要： A handler may include a handler system main body used for testing semiconductor devices; an open-type stocker portion on a front side of the handler system main body; and/or a plurality of single-door-type stockers in the open-type stocker portion. The single-door-type stockers may include windows on upper parts of front sides of the single-door-type stockers. The front sides of the single-door-type stockers may be protected. The handler also may include a front top door on an upper part of the front side of the handler system main body; locking stoppers below the windows of the single-door-type stockers; safety sensors on sides of the open-type stocker portion; and/or a working table in front of the open-type stocker portion. The open-type stocker portion may be below the front top door. The safety sensors may stop the handler when the single-door-type stockers are not closed.
摘要翻译：处理器可以包括用于测试半导体器件的处理器系统主体; 处理器系统主体的前侧的开放式储存器部; 和/或多个单门式储料器。单门式储料器可以包括单门式储料器前侧上部的窗户。单门式储料器的前侧可能受到保护。处理器还可以包括在处理器系统主体的正面的上部的前顶门; 在单门式储料器的窗户下面锁定塞子; 开式储料器部分侧面的安全传感器; 和/或在开放型储料机部分前面的工作台。开放式储料器部分可以在前顶门下方。当单门式储料器未关闭时，安全传感器可能会停止处理程序。

3. 发明申请

US20060197519A1 Test tray for handler 有权
标题翻译：托盘处理程序
公开(公告)号：US20060197519A1
公开(公告)日：2006-09-07
申请号：US11362291
申请日：2006-02-23
申请人： Yeon-Gyu Song
发明人： Yeon-Gyu Song
IPC分类号： G01R31/28 , B65D85/00
CPC分类号： G01R1/04 , G01R31/2893
摘要： A test tray includes a rectangular shaped frame and a plurality of transport modules to receive a plurality of semiconductor devices. A precise location-determining unit mounted on both sides of the frame to precisely determines and fixes the test tray location. According to one embodiments, the precise location-determining unit includes a locking hole to receive a positioner, a bushing to prevent locking hole wear, a protection bar to cover the frame and the bushing. The test tray prevents yield reduction and handler malfunction, e.g., sudden stopping of the handler, by precisely fixing tray and semiconductor device position during loading, unloading, and testing. The test tray can be extensively without repair or replacement because locking hole, with protective bushing therein, enjoys little or no wear.
摘要翻译：测试托盘包括矩形框架和用于接收多个半导体器件的多个传输模块。安装在框架两侧的精确定位单元精确地确定和固定测试托盘位置。根据一个实施例，精确位置确定单元包括用于接收定位器的锁定孔，用于防止锁定孔磨损的衬套，覆盖框架和衬套的保护杆。通过在装载，卸载和测试期间精确地固定托盘和半导体装置的位置，测试托架防止产量降低和处理器故障，例如处理器的突然停止。测试托盘可以广泛地进行维修或更换，因为带有保护套管的锁定孔很少或没有磨损。

4. 发明授权

US07208938B2 Test tray for handler 有权
标题翻译：托盘处理程序
公开(公告)号：US07208938B2
公开(公告)日：2007-04-24
申请号：US11362291
申请日：2006-02-23
申请人： Yeon-Gyu Song
发明人： Yeon-Gyu Song
IPC分类号： G01R31/28
CPC分类号： G01R1/04 , G01R31/2893
摘要： A test tray includes a rectangular shaped frame and a plurality of transport modules to receive a plurality of semiconductor devices. A precise location-determining unit mounted on both sides of the frame to precisely determines and fixes the test tray location. According to one embodiments, the precise location-determining unit includes a locking hole to receive a positioner, a bushing to prevent locking hole wear, a protection bar to cover the frame and the bushing. The test tray prevents yield reduction and handler malfunction, e.g., sudden stopping of the handler, by precisely fixing tray and semiconductor device position during loading, unloading, and testing. The test tray can be extensively without repair or replacement because locking hole, with protective bushing therein, enjoys little or no wear.
摘要翻译：测试托盘包括矩形框架和用于接收多个半导体器件的多个传输模块。安装在框架两侧的精确定位单元精确地确定和固定测试托盘位置。根据一个实施例，精确位置确定单元包括用于接收定位器的锁定孔，用于防止锁定孔磨损的衬套，覆盖框架和衬套的保护杆。通过在装载，卸载和测试期间精确地固定托盘和半导体装置的位置，测试托架防止产量降低和处理器故障，例如处理器的突然停止。测试托盘可以广泛地进行维修或更换，因为带有保护套管的锁定孔很少或没有磨损。

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