会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Cooling apparatus for electronic device
    • 电子设备冷却装置
    • US08307885B2
    • 2012-11-13
    • US12390201
    • 2009-02-20
    • Ye-Yong KimYoung-Don Choi
    • Ye-Yong KimYoung-Don Choi
    • F28D15/00F25B9/02
    • F25B9/04F25B2500/01F28D15/02F28D15/0266F28D2021/0031F28F13/12
    • The present invention relates to a cooling apparatus for an electronic device. In the present invention, a coolant passing through a condenser 10 is introduced into and s filled in a compensator 15. The coolant passing through the compensator 15 is introduced into a vaporizer 20 and vaporized through heat exchange with an auxiliary heat source H2 provided outside of the vaporizer. In addition, a vaporizing unit 22 made of a porous material is provided in the vaporizer 20. The coolant passing through the vaporizer 20 and a liquid coolant supplied from the condenser 10 are mixed in a vortex generating unit 30 to form a coolant spray, and the coolant spray moves along a spiral trajectory to be formed into a vortex. Meanwhile, the coolant spray of a vortex is injected to be in close contact with the inner wall of an evaporator 50 to be heat-exchanged with a main heat source H1 positioned outside of the evaporator, thereby cooling the main heat source H1. According to the present invention as mentioned above, the main heat source adjacent to the evaporator is heat-exchanged with the coolant more actively to thereby improve the cooling performance of the electronic device. Also, a pressure loss of the coolant spouted from the venturi tube is further reduced.
    • 本发明涉及电子设备的冷却装置。 在本发明中,通过冷凝器10的冷却剂被引入并填充在补偿器15中。通过补偿器15的冷却剂被引入蒸发器20中,并通过与外部设置的辅助热源H2的热交换而蒸发 蒸发器。 此外,在蒸发器20中设置由多孔材料制成的蒸发单元22.通过蒸发器20的冷却剂和从冷凝器10供应的液体冷却剂在涡流发生单元30中混合以形成冷却剂喷雾,并且 冷却剂喷雾沿着螺旋轨迹移动以形成涡流。 同时,将涡流的冷却剂喷雾注入与蒸发器50的内壁紧密接触,以与位于蒸发器外部的主热源H1进行热交换,从而冷却主热源H1。 根据如上所述的本发明,与蒸发器相邻的主热源更积极地与冷却剂进行热交换,从而提高电子设备的冷却性能。 此外,从文丘里管喷出的冷却剂的压力损失进一步降低。
    • 4. 发明授权
    • Deskewing method and apparatus, and data reception apparatus using the deskewing method and apparatus
    • 脱色方法和装置以及使用该偏移校正方法和装置的数据接收装置
    • US08116417B2
    • 2012-02-14
    • US12820824
    • 2010-06-22
    • Young-don Choi
    • Young-don Choi
    • H04L7/00H04L25/00H04L25/40
    • H04L7/033H04L7/0337
    • An up/down detection unit samples a received data signal and determines in which of first through third areas of the data signal the logic level of the data signal transitions, wherein the data sampling clock signal, the first edge sampling clock signal, and the second edge sampling clock signal are sequentially activated. A lower limit detection unit detects a lower limit of the first area if the logic level of the data signal transitions in the first area. An upper limit detection unit detects an upper limit of the third area if the logic level of the data signal transitions in the third area. A phase detection unit determines a delay amount indicating the amount by which the data signal is to be delayed according to the upper limit and lower limit detected. A buffer unit delays the data signal by the delay amount determined by the phase detection unit.
    • 上/下检测单元对接收到的数据信号进行采样,并确定数据信号的第一至第三区域中的哪个数据信号的逻辑电平转换,其中数据采样时钟信号,第一边沿采样时钟信号和第二 边沿采样时钟信号被依次激活。 如果数据信号的逻辑电平在第一区域中转变,则下限检测单元检测第一区域的下限。 如果数据信号的逻辑电平在第三区域中转变,则上限检测单元检测第三区域的上限。 相位检测单元根据检测到的上限和下限来确定指示数据信号被延迟的量的延迟量。 缓冲单元将数据信号延迟由相位检测单元确定的延迟量。
    • 6. 发明授权
    • Semiconductor device having ESD protection circuit and method of testing the same
    • 具有ESD保护电路的半导体器件及其测试方法
    • US07960984B2
    • 2011-06-14
    • US12232592
    • 2008-09-19
    • Young-Don ChoiHoe-Ju Chung
    • Young-Don ChoiHoe-Ju Chung
    • G01R31/3187
    • G01R31/2884H01L23/60H01L27/0251H01L2924/0002H01L2924/00
    • A semiconductor device having an electrostatic discharge (ESD) protection circuit and a method of testing the same may provided. The semiconductor device may include one or more stacked chips, each stacked chip may include a test circuit configured to output a test control signal and a selection control signal in response to a test enable signal, an internal circuit configured to perform an operation and output a plurality of test signals in response to the test control signal, at least one multiplexer (MUX) configured to select and output one of the plurality of test signals based on the selection control signal, at least one test pad configured to receive the selected test signal, and at least one electrostatic discharge (ESD) protection circuit configured to discharge static electricity applied through the test pad externally.
    • 可以提供具有静电放电(ESD)保护电路的半导体器件及其测试方法。 半导体器件可以包括一个或多个堆叠的芯片,每个堆叠的芯片可以包括测试电路,其被配置为响应于测试使能信号输出测试控制信号和选择控制信号,内部电路被配置为执行操作并输出 响应于测试控制信号的多个测试信号,至少一个多路复用器(MUX),被配置为基于选择控制信号选择并输出多个测试信号中的一个;至少一个测试板,被配置为接收所选择的测试信号 以及至少一个静电放电(ESD)保护电路,其被配置为从外部排出通过测试焊盘施加的静电。
    • 7. 发明授权
    • Loop filter, phase-locked loop, and method of operating the loop filter
    • 环路滤波器,锁相环路和环路滤波器的操作方法
    • US07928785B2
    • 2011-04-19
    • US12267116
    • 2008-11-07
    • Young-don ChoiHoon Lee
    • Young-don ChoiHoon Lee
    • H03K3/017H03K5/04H03K7/08
    • H03L7/0893H03L7/0891H03L7/093
    • A loop filter capable of controlling a charge sharing point in time, a phase locked loop, and a method of operating the loop filter are provided. The loop filter includes a duty control unit and a variable capacitor unit. The duty control unit generates a duty control clock signal of which an activation section is shorter than an inactivation section, by controlling a duty of an input clock signal. The variable capacitor unit is charged by an input current and has a capacitance that varies according to the duty control clock signal. The variable capacitor unit may include a switch, a first capacitor, and a second capacitor. The switch is turned on or off in response to the duty control clock signal. The first capacitor is serially connected to the switch and charged by the input current when the switch is turned on. The second capacitor is connected in parallel to the switch and the first capacitor and charged by the input current.
    • 提供了能够控制电荷共享时间点的环路滤波器,锁相环以及环路滤波器的操作方法。 环路滤波器包括占空比控制单元和可变电容器单元。 占空比控制部通过控制输入时钟信号的占空比,生成启动部比灭活部短的占空比控制时钟信号。 可变电容器单元由输入电流充电并且具有根据占空比控制时钟信号而变化的电容。 可变电容器单元可以包括开关,第一电容器和第二电容器。 响应于占空比控制时钟信号,开关导通或关断。 当开关打开时,第一个电容器串联连接到开关并由输入电流充电。 第二电容器并联连接到开关和第一个电容器,并由输入电流充电。
    • 8. 发明申请
    • STACKED SEMICONDUCTOR DEVICE AND METHOD OF FORMING SERIAL PATH THEREOF
    • 堆叠式半导体器件及其串联路径的形成方法
    • US20110031601A1
    • 2011-02-10
    • US12906592
    • 2010-10-18
    • Young-Don Choi
    • Young-Don Choi
    • H01L23/48H01L21/50
    • H01L25/0657H01L23/481H01L24/06H01L24/14H01L24/17H01L2224/0401H01L2224/0615H01L2224/1416H01L2224/16145H01L2225/06513H01L2225/06541H01L2225/06562H01L2924/01021H01L2924/01033H01L2924/01058H01L2924/01082H01L2924/01322H01L2924/30107
    • A stacked semiconductor device and a method of forming a serial path of the stacked semiconductor device are provided. The stacked semiconductor device includes a plurality of chips each having a first internal circuit for receiving an input signal, performing a designated operation and outputting an output signal. Each of the chips includes a serial bump disposed at the same position on one surface of each of the chips, receiving the input signal and transferring the input signal to the first internal circuit, and a serial through-silicon via (TSV) disposed at a position symmetrical to the serial bump with respect to a center of the chip to penetrate the chip, and receiving and transferring the output signal. Here, the chips are alternately rotated and stacked, so that the serial TSV and the serial bumps of adjacent chips contact each other. According to the stacked semiconductor device and method, a plurality of chips having the same pattern are rotated about the center of the chips and stacked, so that a parallel path and a serial path can be formed.
    • 提供叠层半导体器件和形成层叠半导体器件的串行路径的方法。 叠层半导体器件包括多个芯片,每个芯片具有用于接收输入信号的第一内部电路,执行指定的操作并输出输出信号。 每个芯片包括设置在每个芯片的一个表面上的相同位置处的串行凸块,接收输入信号并将输入信号传送到第一内部电路,以及串联穿通硅通孔(TSV) 相对于芯片的中心与串联凸起对称的位置以穿透芯片,以及接收和传送输出信号。 这里,芯片交替地旋转和堆叠,使得相邻芯片的串行TSV和串联凸块彼此接触。 根据叠层半导体器件和方法,具有相同图案的多个芯片围绕芯片的中心旋转并堆叠,从而可以形成平行路径和串行路径。
    • 9. 发明申请
    • DESKEWING METHOD AND APPARATUS, AND DATA RECEPTION APPARATUS USING THE DESKEWING METHOD AND APPARATUS
    • 使用方法和装置的装置和装置以及数据接收装置
    • US20100260299A1
    • 2010-10-14
    • US12820824
    • 2010-06-22
    • Young-don Choi
    • Young-don Choi
    • H04L7/00
    • H04L7/033H04L7/0337
    • Deskewing method and apparatus, and a data reception apparatus using the deskewing method and apparatus, in which the deskewing apparatus includes an up/down detection unit, a lower limit detection unit, an upper limit detection unit, a phase detection unit, and a buffer unit. The up/down detection unit samples a received data signal in response to a data sampling clock signal, a first edge sampling clock signal, and a second edge sampling clock signal and determines in which of first through third areas of the data signal the logic level of the data signal transitions by using the result of the sampling, wherein the data sampling clock signal, the first edge sampling clock signal, and the second edge sampling clock signal are sequentially activated. The lower limit detection unit detects a lower limit of the first area if the logic level of the data signal transitions in the first area. The upper limit detection unit detects an upper limit of the third area if the logic level of the data signal transitions in the third area. The phase detection unit determines a delay amount indicating the amount by which the data signal is to be delayed according to the upper limit detected by the upper limit detection unit and the lower limit detected by the lower limit detection unit. The buffer unit delays the data signal by the delay amount determined by the phase detection unit. The deskewing apparatus can optimize data sampling by efficiently reducing data skew. In addition, the deskewing apparatus can minimize data restoration errors by reducing an accumulation of jitter.
    • 偏移校正方法和装置以及使用该偏移校正方法和装置的数据接收装置,其中该偏移校正装置包括上/下检测单元,下限检测单元,上限检测单元,相位检测单元和缓冲器 单元。 上/下检测单元响应于数据采样时钟信号,第一边沿采样时钟信号和第二边缘采样时钟信号对接收到的数据信号进行采样,并确定数据信号的第一至第三区域中的哪一个是逻辑电平 通过使用采样的结果进行数据信号转换,其中数据采样时钟信号,第一边沿采样时钟信号和第二边缘采样时钟信号被顺序地激活。 如果数据信号的逻辑电平在第一区域中转变,则下限检测单元检测第一区域的下限。 如果数据信号的逻辑电平在第三区域中转变,则上限检测单元检测第三区域的上限。 相位检测单元根据由上限检测单元检测到的上限和由下限检测单元检测到的下限来确定表示数据信号要延迟的量的延迟量。 缓冲单元将数据信号延迟由相位检测单元确定的延迟量。 去歪斜设备可以通过有效减少数据偏移来优化数据采样。 此外,通过减少抖动的累积,该脱色设备可以最小化数据恢复错误。
    • 10. 发明授权
    • Voltage controlled oscillator and PLL having the same
    • 压控振荡器和PLL具有相同的功能
    • US07659785B2
    • 2010-02-09
    • US11769114
    • 2007-06-27
    • Jung SunwooYoung-Don Choi
    • Jung SunwooYoung-Don Choi
    • H03K3/03
    • H03K3/0315H03L7/0995H03L2207/06
    • A Voltage Controlled Oscillator (VCO) includes a plurality of oscillation units connected in cascade to form a chain; and a plurality of current source sections operatively connected to the oscillation units, the current source sections each being configured to control current provided to the oscillation units, wherein each of the current source sections includes: at least one fixed current source configured to perform a current control of a corresponding oscillation unit by using a fixed voltage; and at least one variable current source configured to perform a current control of the corresponding oscillation unit by using a variable voltage.
    • 压控振荡器(VCO)包括串联连接以形成链的多个振荡单元; 以及可操作地连接到所述振荡单元的多个电流源部分,所述电流源部分被配置为控制提供给所述振荡单元的电流,其中每个电流源部分包括:至少一个固定电流源,被配置为执行电流 通过使用固定电压控制相应的振荡单元; 以及至少一个可变电流源,被配置为通过使用可变电压来执行对应的振荡单元的电流控制。