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    • 1. 发明申请
    • Non-Volatile Memory With High Reliability
    • 非易失性存储器具有高可靠性
    • US20080291729A1
    • 2008-11-27
    • US12106777
    • 2008-04-21
    • A. Peter CosminSorin S. GeorgescuGeorge SmarandoiuAdrian M. Tache
    • A. Peter CosminSorin S. GeorgescuGeorge SmarandoiuAdrian M. Tache
    • G11C16/04
    • G11C16/0433
    • A non-volatile memory (NVM) system includes a set of NVM cells, each including: a NVM transistor; an access transistor coupling the NVM transistor to a corresponding bit line; and a source select transistor coupling the NVM transistor to a common source. The NVM cells are written by a two-phase operation that includes an erase phase and a program phase. A common set of bit line voltages are applied to the bit lines during both the erase and programming phases. The access transistors are turned on and the source select transistors are turned off during the erase and programming phases. A first control voltage is applied to the control gates of the NVM transistors during the erase phase, and a second control voltage is applied to the control gates of the NVM transistors during the program phase. Under these conditions, the average required number of Fowler-Nordheim tunneling operations is reduced.
    • 非易失性存储器(NVM)系统包括一组NVM单元,每个NVM单元包括:NVM晶体管; 将NVM晶体管耦合到对应的位线的存取晶体管; 以及将NVM晶体管耦合到公共源的源极选择晶体管。 NVM单元由包括擦除阶段和程序阶段的两相操作来写入。 在擦除和编程阶段期间,将一组常见的位线电压施加到位线。 接入晶体管导通,并且在擦除和编程阶段期间,源选择晶体管截止。 在擦除阶段期间,将第一控制电压施加到NVM晶体管的控制栅极,并且在编程阶段期间将第二控制电压施加到NVM晶体管的控制栅极。 在这些条件下,Fowler-Nordheim隧道掘进作业的平均要求数量减少了。
    • 2. 发明授权
    • Non-volatile memory with high reliability
    • 非易失性存储器具有高可靠性
    • US07830714B2
    • 2010-11-09
    • US12106777
    • 2008-04-21
    • A. Peter CosminSorin S. GeorgescuGeorge SmarandoiuAdrian M. Tache
    • A. Peter CosminSorin S. GeorgescuGeorge SmarandoiuAdrian M. Tache
    • G11C16/04
    • G11C16/0433
    • A non-volatile memory (NVM) system includes a set of NVM cells, each including: a NVM transistor; an access transistor coupling the NVM transistor to a corresponding bit line; and a source select transistor coupling the NVM transistor to a common source. The NVM cells are written by a two-phase operation that includes an erase phase and a program phase. A common set of bit line voltages are applied to the bit lines during both the erase and programming phases. The access transistors are turned on and the source select transistors are turned off during the erase and programming phases. A first control voltage is applied to the control gates of the NVM transistors during the erase phase, and a second control voltage is applied to the control gates of the NVM transistors during the program phase. Under these conditions, the average required number of Fowler-Nordheim tunneling operations is reduced.
    • 非易失性存储器(NVM)系统包括一组NVM单元,每个NVM单元包括:NVM晶体管; 将NVM晶体管耦合到对应的位线的存取晶体管; 以及将NVM晶体管耦合到公共源的源极选择晶体管。 NVM单元由包括擦除阶段和程序阶段的两相操作来写入。 在擦除和编程阶段期间,将一组常见的位线电压施加到位线。 接入晶体管导通,并且在擦除和编程阶段期间,源选择晶体管截止。 在擦除阶段期间,将第一控制电压施加到NVM晶体管的控制栅极,并且在编程阶段期间将第二控制电压施加到NVM晶体管的控制栅极。 在这些条件下,Fowler-Nordheim隧道掘进作业的平均要求数量减少了。
    • 6. 发明授权
    • Scalable electrically eraseable and programmable memory
    • 可扩展的电可擦除和可编程存储器
    • US07528436B2
    • 2009-05-05
    • US11470245
    • 2006-09-05
    • Sorin S. GeorgescuAdam Peter CosminGeorge Smarandoiu
    • Sorin S. GeorgescuAdam Peter CosminGeorge Smarandoiu
    • H01L29/76
    • G11C16/0433H01L27/105H01L27/11526H01L27/11529
    • A non-volatile memory including one or more EEPROM cell pairs. Each EEPROM cell pair includes three transistors and stores two data bits, effectively providing a 1.5 transistor EEPROM cell. An EEPROM cell pair includes a first non-volatile memory transistor, a second non-volatile memory transistor and a source access transistor. The source access transistor includes: a first source region continuous with a source region of the first non-volatile memory transistor; a second source region continuous with a source region of the second non-volatile memory transistor, and a drain region that extends downward through a first well region to contact a second well region. The first, second and third semiconductor regions and the second well region have a first conductivity type, and the first well region has a second conductivity type, opposite the first conductivity type.
    • 包括一个或多个EEPROM单元对的非易失性存储器。 每个EEPROM单元对包括三个晶体管,并存储两个数据位,有效地提供一个1.5晶体管EEPROM单元。 EEPROM单元对包括第一非易失性存储晶体管,第二非易失性存储晶体管和源极存取晶体管。 源极存取晶体管包括:与第一非易失性存储晶体管的源极区域连续的第一源极区域; 与第二非易失性存储晶体管的源极区域连续的第二源极区域和向下延伸穿过第一阱区域以接触第二阱区域的漏极区域。 第一,第二和第三半导体区域和第二阱区域具有第一导电类型,并且第一阱区域具有与第一导电类型相反的第二导电类型。
    • 8. 发明授权
    • Stress reduction for non-volatile memory cell
    • 非易失性记忆体的压力降低
    • US5434815A
    • 1995-07-18
    • US184227
    • 1994-01-19
    • George SmarandoiuSteven J. SchumannTsung-Ching Wu
    • George SmarandoiuSteven J. SchumannTsung-Ching Wu
    • G11C17/00G11C16/02G11C16/04G11C16/06G11C16/08G11C7/00
    • G11C16/08
    • Non-volatile semiconductor core memory performance is enhanced by reduced stress on core memory cells. Stress is reduced by selectable application of bias voltages to the sense line under control of the word line. The word line is connected to an inverting device in turn connected to a transistor effective for grounding the gate of a variable threshold programmable transistor in the memory cell. Power down of the word line is reflected in synchronous power-down of the sense line. Additionally, with power down, the sense amplifier for the particular core memory cell is disconnected from a master latch circuit, which in turn is connected to a slave latch circuit for applying the previous sense amplifier output to an input/output buffer, in order to secure the data sensed in core memory during read operation. The invention further permits reduced word line voltages during erase operation on the sense line and the variable threshold programmable transistor.
    • 非易失性半导体核心存储器性能通过减少核心存储器单元的应力来增强。 在字线控制下,通过选择性地向感测线施加偏置电压来减小应力。 字线连接到反相器件,反相器件又连接到有效地将存储器单元中的可变阈值可编程晶体管的栅极接地的晶体管。 字线的掉电反映在感测线的同步掉电中。 此外,在断电时,用于特定核心存储器单元的读出放大器与主锁存电路断开,主锁存电路又连接到从锁存电路,用于将先前的读出放大器输出施加到输入/输出缓冲器,以便 在读取操作期间保护在核心存储器中感测的数据。 本发明还允许在感测线和可变阈值可编程晶体管的擦除操作期间减少字线电压。