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    • 7. 发明授权
    • Drift mitigation for multi-bits phase change memory
    • 用于多位相变存储器的漂移减轻
    • US08854872B2
    • 2014-10-07
    • US13335237
    • 2011-12-22
    • Chung H. LamJing Li
    • Chung H. LamJing Li
    • G11C11/00
    • G11C13/0069G11C11/00G11C11/5628G11C11/5678G11C13/0004G11C13/004G11C13/0061G11C13/0064G11C2013/0057G11C2013/0076G11C2013/0092
    • An RC-based sensing scheme to effectively sense the cell resistance of a programmed Phase Change Material (PCM) memory cell. The sensing scheme ensures the same physical configuration of each cell (after programming): same amorphous volume, same trap density/distribution, etc. The sensing scheme is based on a metric: the RC based sense amplifier implements two trigger points. The measured time interval between these two points is used as the metric to determine whether the programmed cell state, e.g., resistance, is programmed into desired value. The RC-based sensing scheme is embedded into an iterative PCM cell programming technique to ensure a tight distribution of resistance at each level after programming; and ensure the probability of level aliasing is very small, leading to less problematic drift.
    • 一种基于RC的感测方案,可有效检测编程的相变材料(PCM)存储单元的单元电阻。 感测方案确保每个单元的相同物理配置(编程后):相同的无定形体积,相同的阱密度/分布等。感测方案基于度量:基于RC的感测放大器实现两个触发点。 将这两个点之间的测量时间间隔用作度量以确定编程的单元状态(例如电阻)是否被编程为期望值。 基于RC的感测方案被嵌入到迭代PCM单元编程技术中,以确保在编程之后每个级别的电阻分布紧密; 并确保层次混叠的概率非常小,导致较少的有问题的漂移。