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1. 发明授权

US07888655B2 Transfer mechanism for transferring a specimen 有权
标题翻译：转移标本的转移机制
公开(公告)号：US07888655B2
公开(公告)日：2011-02-15
申请号：US11881031
申请日：2007-07-25
申请人： Erik Pieter van Gaasbeek , Pleun Dona , Gerbert Jeroen van de Water , Johannes Antonius Maria van den Oetelaar , Paul Johannes Leonardes Barends , Ian Johannes Bernardus van Hees
发明人： Erik Pieter van Gaasbeek , Pleun Dona , Gerbert Jeroen van de Water , Johannes Antonius Maria van den Oetelaar , Paul Johannes Leonardes Barends , Ian Johannes Bernardus van Hees
IPC分类号： G21K5/10
CPC分类号： H01J37/20
摘要： The invention relates to a transfer mechanism for transferring a specimen (2) from a first position in a first holder (40) to a second position in a second holder (10) and/or vice versa, each holder (10, 40) equipped to detachably hold the specimen, the transfer of the specimen between the holders taking place in a transfer position different from the second position, characterized in that when the specimen is transferred between the holders (10, 40) a mechanical guidance mechanism positions the holders with a mutual accuracy higher than the mutual accuracy in the second position, and said mechanical guidance mechanism not positioning at least one of the holders (10, 40) when the specimen is in the second position. The mechanical guidance mechanism may comprise extra parts (50). At least one of the holders (40) may be equipped to hold a multitude of specimens.
摘要翻译：本发明涉及一种用于将样本（2）从第一保持器（40）中的第一位置转移到第二保持器（10）中的第二位置和/或反之亦然的转移机构，每个保持器（10,40）装备有为了可拆卸地保持试样，试样在不同于第二位置的转移位置发生的保持器之间的转移，其特征在于，当试样在保持器（10,40）之间转移时，机械引导机构将保持器相对精度高于第二位置的相互精度，并且当样本处于第二位置时，所述机械引导机构不定位至少一个保持器（10,40）。机械引导机构可以包括额外的零件（50）。保持器（40）中的至少一个可以被装备成容纳多个标本。

2. 发明申请

US20080283768A1 Transfer mechanism for transferring a specimen 有权
标题翻译：转移标本的转移机制
公开(公告)号：US20080283768A1
公开(公告)日：2008-11-20
申请号：US11881031
申请日：2007-07-25
申请人： Erik Pieter van Gaasbeek , Pleun Dona , Gerbert Jeroen van de Water , Johannes Antonius Maria van den Oetelaar , Paul Johannes Leonardes Barends , Ian Johannes Bernardus van Hees
发明人： Erik Pieter van Gaasbeek , Pleun Dona , Gerbert Jeroen van de Water , Johannes Antonius Maria van den Oetelaar , Paul Johannes Leonardes Barends , Ian Johannes Bernardus van Hees
IPC分类号： G21K5/10
CPC分类号： H01J37/20
摘要： The invention relates to a transfer mechanism for transferring a specimen (2) from a first position in a first holder (40) to a second position in a second holder (10) and/or vice versa, each holder (10, 40) equipped to detachably hold the specimen, the transfer of the specimen between the holders taking place in a transfer position different from the second position, characterized in that when the specimen is transferred between the holders (10, 40) a mechanical guidance mechanism positions the holders with a mutual accuracy higher than the mutual accuracy in the second position, and said mechanical guidance mechanism not positioning at least one of the holders (10, 40) when the specimen is in the second position. The mechanical guidance mechanism may comprise extra parts (50). At least one of the holders (40) may be equipped to hold a multitude of specimens.
摘要翻译：本发明涉及一种用于将样本（2）从第一保持器（40）中的第一位置转移到第二保持器（10）中的第二位置和/或反之亦然的转移机构，每个保持器（10,40）装备有为了可拆卸地保持试样，试样在不同于第二位置的转移位置发生的保持器之间的转移，其特征在于，当试样在保持器（10,40）之间转移时，机械引导机构将保持器相对精度高于第二位置的相互精度，并且当样本处于第二位置时，所述机械引导机构不定位至少一个保持器（10,40）。机械引导机构可以包括额外的零件（50）。保持器（40）中的至少一个可以被装备成容纳多个标本。

3. 发明授权

US08757873B2 Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus 有权
标题翻译：在带电粒子光学装置中测量样品载体的温度的方法
公开(公告)号：US08757873B2
公开(公告)日：2014-06-24
申请号：US13304181
申请日：2011-11-23
申请人： Stephanus Hubertus Leonardus van den Boom , Pleun Dona , Laurens Franz Taemsz Kwakman , Uwe Luecken , Hervé-William Rémigy , Hendrik Nicolaas Slingerland , Martin Verheijen , Gerbert Jeroen van de Water
发明人： Stephanus Hubertus Leonardus van den Boom , Pleun Dona , Laurens Franz Taemsz Kwakman , Uwe Luecken , Hervé-William Rémigy , Hendrik Nicolaas Slingerland , Martin Verheijen , Gerbert Jeroen van de Water
IPC分类号： G01K1/00 , G01K13/12 , G01K11/00 , G01K11/20 , G01K5/68 , H01J37/20 , H01J37/26
CPC分类号： G01K5/68 , G01K11/20 , H01J37/20 , H01J37/26 , H01J2237/2001 , H01J2237/24585
摘要： A method of determining the temperature of a sample carrier in a charged particle-optical apparatus, characterized in that the method comprises the observation of the sample carrier with a beam of charged particles, the observation giving information about the temperature of the sample carrier. The invention is based on the insight that a charged particle optical apparatus, such as a TEM, STEM, SEM or FIB, can be used to observe temperature related changes of a sample carrier. The changes may be mechanical changes (e.g. of a bimetal), crystallographic changes (e.g. of a perovskite), and luminescent changes (in intensity or decay time). In a preferred embodiment the sample carrier shows two bimetals, showing metals with different thermal expansion coefficients, bending in opposite directions. The distance between the two bimetals is used as a thermometer.
摘要翻译：一种确定带电粒子光学装置中的样品载体的温度的方法，其特征在于，所述方法包括用带电粒子束观察样品载体，所述观察给出关于样品载体的温度的信息。本发明基于如下观点：带电粒子光学装置如TEM，STEM，SEM或FIB可用于观察样品载体的温度相关变化。这些改变可以是机械变化（例如双金属），晶体学变化（例如钙钛矿）和发光变化（强度或衰变时间）。在优选实施例中，样品载体显示两个双金属，显示具有不同热膨胀系数的金属，在相反方向上弯曲。两个双金属片之间的距离用作温度计。

4. 发明申请

US20070252090A1 Particle-optical apparatus with temperature switch 有权
标题翻译：带温度开关的粒子光学仪器
公开(公告)号：US20070252090A1
公开(公告)日：2007-11-01
申请号：US11796975
申请日：2007-04-30
申请人： Gerbert Jeroen van de Water , Petrus Martinus Hoeks
发明人： Gerbert Jeroen van de Water , Petrus Martinus Hoeks
IPC分类号： G01N21/01
CPC分类号： H01J37/20 , H01J2237/2001
摘要： The invention relates to a thermal switch for particle-optical apparatus. In, for example, a cryo-TEM (transmission electron microscope), a sample 34 that is placed at an extremity 20 of a sample holder 7 can be maintained at, for example, the temperature of liquid nitrogen. There is a need to be able to inspect a sample at, for example, room temperature in a simple manner, without heating the microscope as a whole from the cryogenic temperature to room temperature. By using the thermal switch 40, this becomes possible. To this end, the thermal switch changes the thermal path between a cold source 22 in the apparatus and the extremity 20 of the sample holder 7, whereby, in one position, position 46a, a connection is made from the extremity 20 to the cold source 22, and, in the other position, position 46b, a connection is made to a portion 44 of the apparatus that is maintained at room temperature.
摘要翻译：本发明涉及一种用于粒子光学装置的热开关。例如，在冷冻TEM（透射电子显微镜）中，放置在样品保持器7的末端20的样品34可以保持在例如液氮的温度。需要能够以简单的方式在例如室温下检查样品，而不将整个显微镜从低温至室温加热。通过使用热敏开关40，这成为可能。为此，热开关改变设备中的冷源22和样品保持器7的末端20之间的热路径，由此在一个位置中，位置46 从末端20到冷源22，并且在另一位置，位置46 ，连接到设备的保持在室温的部分44。

5. 发明授权

US07420184B2 Particle-optical apparatus with temperature switch 有权
标题翻译：带温度开关的粒子光学仪器
公开(公告)号：US07420184B2
公开(公告)日：2008-09-02
申请号：US11796975
申请日：2007-04-30
申请人： Gerbert Jeroen van de Water , Petrus Martinus Hoeks
发明人： Gerbert Jeroen van de Water , Petrus Martinus Hoeks
IPC分类号： H01J37/20
CPC分类号： H01J37/20 , H01J2237/2001
摘要： The invention relates to a thermal switch for particle-optical apparatus. In, for example, a cryo-TEM (transmission electron microscope), a sample 34 that is placed at an extremity 20 of a sample holder 7 can be maintained at, for example, the temperature of liquid nitrogen. There is a need to be able to inspect a sample at, for example, room temperature in a simple manner, without heating the microscope as a whole from the cryogenic temperature to room temperature. By using the thermal switch 40, this becomes possible. To this end, the thermal switch changes the thermal path between a cold source 22 in the apparatus and the extremity 20 of the sample holder 7, whereby, in one position, position 46a, a connection is made from the extremity 20 to the cold source 22, and, in the other position, position 46b, a connection is made to a portion 44 of the apparatus that is maintained at room temperature.
摘要翻译：本发明涉及一种用于粒子光学装置的热开关。例如，在冷冻TEM（透射电子显微镜）中，放置在样品保持器7的末端20的样品34可以保持在例如液氮的温度。需要能够以简单的方式在例如室温下检查样品，而不将整个显微镜从低温至室温加热。通过使用热敏开关40，这成为可能。为此，热开关改变设备中的冷源22和样品保持器7的末端20之间的热路径，由此在一个位置中，位置46 从末端20到冷源22，并且在另一位置，位置46 ，连接到设备的保持在室温的部分44。

6. 发明授权

US07034316B2 Sample carrier for carrying a sample to be irradiated with an electron beam 有权
标题翻译：用于携带用电子束照射的样品的样品载体
公开(公告)号：US07034316B2
公开(公告)日：2006-04-25
申请号：US10870617
申请日：2004-06-17
申请人： Raymond Wagner , Gerbert Jeroen van de Water
发明人： Raymond Wagner , Gerbert Jeroen van de Water
IPC分类号： G01N1/28
CPC分类号： H01J37/20
摘要： Sample carriers for use in Transmission Electron Microscopes (TEMs) and freely commercially available have the form of a gauze with a strengthening edge. The thickness of these known sample carriers is of the order of magnitude of 20 μm, and is uniform across the entire sample holder. The tiny thickness of these fragile sample carriers makes manipulation difficult. There is a desire to realize automatic introduction and removal of sample carriers in a TEM, seeing as this would make it possible to use the TEM continuously, without human intervention.The invention describes a robust sample carrier whereby—both in the case of manual and automatic manipulation—deformation of and/or damage to the sample carrier is avoided. This is achieved by employing a strengthening edge portion 2 with a thickness 6 larger than the thickness 5 of the middle portion 1 of the sample carrier. The ability to use the sample carrier in analyses in which tilting is important is hereby not impeded.
摘要翻译：用于透射电子显微镜（TEM）和自由市售的样品载体具有强化边缘的纱布的形式。这些已知样品载体的厚度为20μm的数量级，并且在整个样品架上均匀。这些脆弱的样品载体的微小厚度使操作困难。期望在TEM中实现样品载体的自动引入和去除，因为这将使得可以连续使用TEM而无需人为干预。本发明描述了一种坚固的样品载体，其中 - 在手动和自动操作的情况下 - 避免了样品载体的变形和/或损坏。这是通过采用具有比样品载体的中间部分1的厚度5大的厚度6的加强边缘部分2来实现的。因此，在倾斜重要的分析中使用样品载体的能力不受阻碍。

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