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1. 发明授权

US08410439B2 X-ray detector for electron microscope 有权
标题翻译：电子显微镜X射线探伤仪
公开(公告)号：US08410439B2
公开(公告)日：2013-04-02
申请号：US13312689
申请日：2011-12-06
申请人： Hanno Sebastian Von Harrach , Bert Freitag , Pleun Dona
发明人： Hanno Sebastian Von Harrach , Bert Freitag , Pleun Dona
IPC分类号： H01J37/256 , H01J37/24 , G01N23/04
CPC分类号： H01J37/244 , G01N23/225 , H01J37/26 , H01J37/28 , H01J2237/002 , H01J2237/2442 , H01J2237/28 , H01J2237/2802
摘要： Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt.
摘要翻译：布置在样品室内的环中的多个检测器提供了大的立体收集角。检测器优选地包括一个能够减少检测器上的冰的形成的快门和冷藏。通过提供围绕样品的检测器，提供了大的立体角以用于改进的检测，并且检测X射线，而不管样品倾斜的方向如何。

2. 发明授权

US07767979B2 Method for coupling and disconnecting a co-operative composite structure of a sample carrier and a sample holder 有权
标题翻译：用于耦合和断开样品载体和样品架的合作复合结构的方法
公开(公告)号：US07767979B2
公开(公告)日：2010-08-03
申请号：US11807876
申请日：2007-05-29
申请人： Pleun Dona
发明人： Pleun Dona
IPC分类号： G21K5/10 , B01L3/00
CPC分类号： H01J37/20 , H01J2237/2801
摘要： The invention relates to a composite structure of a sample carrier 20 and a sample holder 30 for use in a TEM, for example. The sample carrier is hereby separately embodied from the sample holder. Although such compositions are already known, the known compositions are very fragile constructions. The sample carrier according to the invention can be formed from a strip of metal, and is a simple and cheap element. Using resilient force, it clamps onto or into the sample holder. The portion of the sample holder to which the sample carrier couples also has a simple form. The sample carrier can couple to the sample holder in vacuum using a coupling tool.
摘要翻译：本发明涉及例如用于TEM的样品载体20和样品保持器30的复合结构。样品载体在此独立于样品架。虽然这些组合物是已知的，但是已知的组合物是非常脆弱的结构。根据本发明的样品载体可以由金属条形成，并且是简单且便宜的元件。使用弹性力，它夹在样品架上或进入样品架。样品载体耦合的样品架的部分也具有简单的形式。样品载体可以使用耦合工具在真空中耦合到样品架。

3. 发明授权

US08757873B2 Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus 有权
标题翻译：在带电粒子光学装置中测量样品载体的温度的方法
公开(公告)号：US08757873B2
公开(公告)日：2014-06-24
申请号：US13304181
申请日：2011-11-23
申请人： Stephanus Hubertus Leonardus van den Boom , Pleun Dona , Laurens Franz Taemsz Kwakman , Uwe Luecken , Hervé-William Rémigy , Hendrik Nicolaas Slingerland , Martin Verheijen , Gerbert Jeroen van de Water
发明人： Stephanus Hubertus Leonardus van den Boom , Pleun Dona , Laurens Franz Taemsz Kwakman , Uwe Luecken , Hervé-William Rémigy , Hendrik Nicolaas Slingerland , Martin Verheijen , Gerbert Jeroen van de Water
IPC分类号： G01K1/00 , G01K13/12 , G01K11/00 , G01K11/20 , G01K5/68 , H01J37/20 , H01J37/26
CPC分类号： G01K5/68 , G01K11/20 , H01J37/20 , H01J37/26 , H01J2237/2001 , H01J2237/24585
摘要： A method of determining the temperature of a sample carrier in a charged particle-optical apparatus, characterized in that the method comprises the observation of the sample carrier with a beam of charged particles, the observation giving information about the temperature of the sample carrier. The invention is based on the insight that a charged particle optical apparatus, such as a TEM, STEM, SEM or FIB, can be used to observe temperature related changes of a sample carrier. The changes may be mechanical changes (e.g. of a bimetal), crystallographic changes (e.g. of a perovskite), and luminescent changes (in intensity or decay time). In a preferred embodiment the sample carrier shows two bimetals, showing metals with different thermal expansion coefficients, bending in opposite directions. The distance between the two bimetals is used as a thermometer.
摘要翻译：一种确定带电粒子光学装置中的样品载体的温度的方法，其特征在于，所述方法包括用带电粒子束观察样品载体，所述观察给出关于样品载体的温度的信息。本发明基于如下观点：带电粒子光学装置如TEM，STEM，SEM或FIB可用于观察样品载体的温度相关变化。这些改变可以是机械变化（例如双金属），晶体学变化（例如钙钛矿）和发光变化（强度或衰变时间）。在优选实施例中，样品载体显示两个双金属，显示具有不同热膨胀系数的金属，在相反方向上弯曲。两个双金属片之间的距离用作温度计。

4. 发明申请

US20110097706A1 MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID 有权
标题翻译：用于在流体中观察颗粒的微反应器
公开(公告)号：US20110097706A1
公开(公告)日：2011-04-28
申请号：US12912468
申请日：2010-10-26
申请人： Gerard Anne Nicolaas van Veen , Jacobus Peter Johannes Peters , Pleun Dona , Alan Frank De Jong
发明人： Gerard Anne Nicolaas van Veen , Jacobus Peter Johannes Peters , Pleun Dona , Alan Frank De Jong
IPC分类号： C12Q1/70 , G01N15/00 , G01N21/00 , C12M1/34 , G01N33/53 , G01N23/00 , G01N21/76 , G01N33/554 , G01N31/10
CPC分类号： B01J19/0093 , B01J2219/00783 , B01J2219/00824 , B01J2219/00831 , B01J2219/00833 , B01J2219/0086 , B01J2219/00905 , B01J2219/0097 , B01L3/502761 , B01L7/54 , B01L2200/0668 , B01L2300/0822 , B01L2400/0415 , B01L2400/0439 , B01L2400/0442 , B01L2400/0487 , G01N2021/058 , H01J37/20 , H01J37/26 , H01J2237/2004 , Y10T436/143333
摘要： The invention relates to a micro-reactor for observing small particles, cells, bacteria, viruses or protein molecules in a fluid. The micro-reactor shows a first channel formed between two layers for containing the fluid, with an inlet and an outlet, the two layers separated by a first distance. A likewise second channel with an inlet and an outlet is placed adjacent to the first channel. A gap connects the first channel and the second channel, at the gap at least one layer showing a window transparent to the method of inspection and at the window the two layers being separated by a very small distance of, for example, 1 μm or less.The micro-reactor may be used with an optical microscope (in which all particles are in focus), inspection with a Scanning Transmission Electron Microscope (in which the range of the electrons is limited), inspection with soft X-rays in the 250-500 eV range (also showing a limited range), etc. A method of using the micro-reactor includes applying a gradient over the gap, thereby causing the particles to cross the gap. The gradient may be static or dynamic, and may be a gradient in concentration, of a chemical or biological material, in pressure, in temperature, in electric potential, or in magnetic field. By detecting a property of the particles upstream in the first channel, e.g. using fluorescent labels on the particles, and then applying a pressure burst over the channels when the property meets certain preset criteria, only selected particles can be placed in the gap.
摘要翻译：本发明涉及用于观察流体中的小颗粒，细胞，细菌，病毒或蛋白质分子的微反应器。微反应器示出了在两层之间形成的用于容纳流体的第一通道，具有入口和出口，两层分开第一距离。具有入口和出口的同样的第二通道被放置成与第一通道相邻。间隙连接第一通道和第二通道，在间隙处，至少一层显示对于检查方法是透明的窗口，并且在窗口处，两层被隔开非常小的距离，例如1μm或更小。微反应器可以与光学显微镜一起使用（其中所有颗粒都在焦点中），用扫描透射电子显微镜（其中电子的范围被限制）进行检查，在250- 500eV范围（也显示有限范围）等。使用微反应器的方法包括在间隙上施加梯度，从而使颗粒穿过间隙。梯度可以是静态或动态的，并且可以是化学或生物材料在压力，温度，电位或磁场中的浓度梯度。通过检测第一通道上游的颗粒的性质，例如，在颗粒上使用荧光标记，然后当性能达到某些预设标准时，在通道上施加压力突发，只有选定的颗粒才能放置在间隙中。

5. 发明授权

US08080791B2 X-ray detector for electron microscope 有权
标题翻译：电子显微镜X射线探伤仪
公开(公告)号：US08080791B2
公开(公告)日：2011-12-20
申请号：US12494227
申请日：2009-06-29
申请人： Hanno Sebastian von Harrach , Bert Freitag , Pleun Dona
发明人： Hanno Sebastian von Harrach , Bert Freitag , Pleun Dona
IPC分类号： H01J37/244 , H01J37/26
CPC分类号： H01J37/244 , G01N23/225 , H01J37/26 , H01J37/28 , H01J2237/002 , H01J2237/2442 , H01J2237/28 , H01J2237/2802
摘要： Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt.
摘要翻译：布置在样品室内的环中的多个检测器提供了大的立体收集角。检测器优选地包括一个能够减少检测器上的冰的形成的快门和冷藏。通过提供围绕样品的检测器，提供了大的立体角以用于改进的检测，并且检测X射线，而不管样品倾斜的方向如何。

6. 发明申请

US20100108907A1 CHARGED-PARTICLE OPTICAL SYSTEM WITH DUAL LOADING OPTIONS 有权
标题翻译：带有双重加载选项的充电颗粒光学系统
公开(公告)号：US20100108907A1
公开(公告)日：2010-05-06
申请号：US12608380
申请日：2009-10-29
申请人： JOHANNES ANTONIUS MARIA VEN DEN OETELAAR , Jorn Hermkens , Pleun Dona , Frank Nederlof , Wim Wondergem
发明人： JOHANNES ANTONIUS MARIA VEN DEN OETELAAR , Jorn Hermkens , Pleun Dona , Frank Nederlof , Wim Wondergem
IPC分类号： G01N35/10
CPC分类号： H01J37/185 , H01J37/26 , H01J2237/184 , H01J2237/2001 , H01J2237/202 , H01J2237/204 , Y10S977/854
摘要： A charged-particle optical system (100) such as an electron microscope has a vacuum chamber (102) with a space (104) for accommodating a specific one (114) of multiple specimens in operational use. The charged-particle optical system has a loader (106) with a part (108) that is moveable into and out of the space. The part is configured for attaching a specimen carrier (110), brought from outside the system, to a first holder (112) or to detach the carrier from the first holder and to remove the carrier from inside the system. The carrier accommodates a first specimen. The system has an interface (116) in a wall of the chamber for removably accommodating the first holder (112) or a second holder (118) with a second specimen (120) mounted thereon.
摘要翻译：诸如电子显微镜的带电粒子光学系统（100）具有真空室（102），其具有用于在操作使用中容纳多个样品的特定一个（114）的空间（104）。带电粒子光学系统具有装载器（106），其具有能够进出空间的部分（108）。所述部件被构造用于将从所述系统外部引出的样本载体（110）附接到第一保持器（112）或将所述载体从所述第一保持器拆下并从所述系统内部移除所述载体。载体容纳第一标本。该系统在室的壁中具有接口（116），用于可拆卸地容纳第一保持器（112）或第二保持器（118），其上安装有第二样本（120）。

7. 发明申请

US20120074333A1 X-ray Detector for Electron Microscope 有权
标题翻译：电子显微镜X射线探测器
公开(公告)号：US20120074333A1
公开(公告)日：2012-03-29
申请号：US13312689
申请日：2011-12-06
申请人： Hanno Sebastian von Harrach , Bert Freitag , Pleun Dona
发明人： Hanno Sebastian von Harrach , Bert Freitag , Pleun Dona
IPC分类号： G01T1/16
CPC分类号： H01J37/244 , G01N23/225 , H01J37/26 , H01J37/28 , H01J2237/002 , H01J2237/2442 , H01J2237/28 , H01J2237/2802
摘要： Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt.
摘要翻译：布置在样品室内的环中的多个检测器提供了大的立体收集角。检测器优选地包括一个能够减少检测器上的冰的形成的快门和冷藏。通过提供围绕样品的检测器，提供了大的立体角以用于改进的检测，并且检测X射线，而不管样品倾斜的方向如何。

8. 发明申请

US20100230609A1 SAMPLE CARRIER FOR SAMPLE HOLDER 有权
标题翻译：样品支架样品载体
公开(公告)号：US20100230609A1
公开(公告)日：2010-09-16
申请号：US12786974
申请日：2010-05-25
申请人： PLEUN DONA
发明人： PLEUN DONA
IPC分类号： H01J37/20
CPC分类号： H01J37/20 , H01J2237/2801
摘要： The invention relates to a composite structure of a sample carrier 20 and a sample holder 30 for use in a TEM, for example. The sample carrier is hereby separately embodied from the sample holder. Although such compositions are already known, the known compositions are very fragile constructions. The sample carrier according to the invention can be formed from a strip of metal, and is a simple and cheap element. Using resilient force, it clamps onto or into the sample holder. The portion of the sample holder to which the sample carrier couples also has a simple form. The sample carrier can couple to the sample holder in vacuum using a coupling tool.
摘要翻译：本发明涉及例如用于TEM的样品载体20和样品保持器30的复合结构。样品载体在此独立于样品架。虽然这些组合物是已知的，但是已知的组合物是非常脆弱的结构。根据本发明的样品载体可以由金属条形成，并且是简单且便宜的元件。使用弹性力，它夹在样品架上或进入样品架。样品载体耦合的样品架的部分也具有简单的形式。样品载体可以使用耦合工具在真空中耦合到样品架。

9. 发明申请

US20100148064A1 X-RAY DETECTOR FOR ELECTRON MICROSCOPE 有权
标题翻译：电子显微镜的X射线探测器
公开(公告)号：US20100148064A1
公开(公告)日：2010-06-17
申请号：US12494227
申请日：2009-06-29
申请人： Hanno Sebastian von Harrach , Bert Freitag , Pleun Dona
发明人： Hanno Sebastian von Harrach , Bert Freitag , Pleun Dona
IPC分类号： G01N23/225 , G01T1/24
CPC分类号： H01J37/244 , G01N23/225 , H01J37/26 , H01J37/28 , H01J2237/002 , H01J2237/2442 , H01J2237/28 , H01J2237/2802
摘要： Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector. By providing detectors surrounding the sample, a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample tilt.
摘要翻译：布置在样品室内的环中的多个检测器提供了大的立体收集角。检测器优选地包括一个能够减少检测器上的冰的形成的快门和冷藏。通过提供围绕样品的检测器，提供了大的立体角以用于改进的检测，并且检测X射线，而不管样品倾斜的方向如何。

10. 发明申请

US20080283768A1 Transfer mechanism for transferring a specimen 有权
标题翻译：转移标本的转移机制
公开(公告)号：US20080283768A1
公开(公告)日：2008-11-20
申请号：US11881031
申请日：2007-07-25
申请人： Erik Pieter van Gaasbeek , Pleun Dona , Gerbert Jeroen van de Water , Johannes Antonius Maria van den Oetelaar , Paul Johannes Leonardes Barends , Ian Johannes Bernardus van Hees
发明人： Erik Pieter van Gaasbeek , Pleun Dona , Gerbert Jeroen van de Water , Johannes Antonius Maria van den Oetelaar , Paul Johannes Leonardes Barends , Ian Johannes Bernardus van Hees
IPC分类号： G21K5/10
CPC分类号： H01J37/20
摘要： The invention relates to a transfer mechanism for transferring a specimen (2) from a first position in a first holder (40) to a second position in a second holder (10) and/or vice versa, each holder (10, 40) equipped to detachably hold the specimen, the transfer of the specimen between the holders taking place in a transfer position different from the second position, characterized in that when the specimen is transferred between the holders (10, 40) a mechanical guidance mechanism positions the holders with a mutual accuracy higher than the mutual accuracy in the second position, and said mechanical guidance mechanism not positioning at least one of the holders (10, 40) when the specimen is in the second position. The mechanical guidance mechanism may comprise extra parts (50). At least one of the holders (40) may be equipped to hold a multitude of specimens.
摘要翻译：本发明涉及一种用于将样本（2）从第一保持器（40）中的第一位置转移到第二保持器（10）中的第二位置和/或反之亦然的转移机构，每个保持器（10,40）装备有为了可拆卸地保持试样，试样在不同于第二位置的转移位置发生的保持器之间的转移，其特征在于，当试样在保持器（10,40）之间转移时，机械引导机构将保持器相对精度高于第二位置的相互精度，并且当样本处于第二位置时，所述机械引导机构不定位至少一个保持器（10,40）。机械引导机构可以包括额外的零件（50）。保持器（40）中的至少一个可以被装备成容纳多个标本。

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