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    • 8. 发明授权
    • Functional built-in self test for a chip
    • 功能内置自检芯片
    • US09384108B2
    • 2016-07-05
    • US13693236
    • 2012-12-04
    • International Business Machines Corporation
    • Kevin M. McIlvainRobert B. TremaineGary Van Huben
    • G06F9/455G01R31/28G06F11/00G06F11/27
    • G06F11/27
    • According to one embodiment, a self-test system integrated on a chip is provided, the chip including a functional logic module for performing a selected application. The self-test system includes a primary interface a primary interface to the functional logic module, the primary interface configured to interface with a primary device, an input interface protocol generator for generating a pattern to be inserted into the primary interface and a secondary interface to the functional logic module, the secondary interface configured to interface with a secondary device. The system also includes an emulator engine coupled to the secondary interface, the emulator engine for testing a function of the functional logic module based on the inserted patterns, the function being configured to communicate with a secondary device coupled to the secondary interface, wherein the emulator engine tests the function when no secondary device is coupled to the chip.
    • 根据一个实施例,提供集成在芯片上的自检系统,该芯片包括用于执行所选应用的功能逻辑模块。 所述自检系统包括主界面,功能逻辑模块的主界面,被配置为与主设备接口的主界面,用于生成要插入到主界面中的模式的输入接口协议生成器,以及辅助接口 功能逻辑模块,辅助接口配置为与辅助设备进行接口。 该系统还包括耦合到辅助接口的仿真器引擎,用于基于所插入的模式来测试功能逻辑模块的功能的仿真器引擎,该功能被配置为与耦合到辅助接口的辅助设备进行通信,其中仿真器 引擎在没有辅助设备耦合到芯片时测试功能。