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1. 发明授权

US10295470B2 Microspectroscope 有权
公开(公告)号：US10295470B2
公开(公告)日：2019-05-21
申请号：US15560256
申请日：2016-03-22
申请人： JASCO Corporation
发明人： Kento Aizawa , Tsutomu Inoue , Masateru Usuki
IPC分类号： G01N21/65 , G01J3/08 , G01J3/44 , G02B21/00 , G01J3/06 , G01J3/28 , G01J3/02 , G01J3/10 , G01N21/64 , G01N21/59
摘要： To provide a microspectroscope that can perform a wide range mapping measurement with high sensitivity, at high speed, and with high wavelength resolution.The Raman spectroscope comprises: a unit for linearly irradiating excitation light; a movable stage for a sample; an objective lens for focusing Raman light from the linear irradiation region; an incident slit provided at the imaging position of Raman light; a spectrometer for diffusing the passing light; a CCD detector for detecting Raman spectral image; and a control device for controlling the mapping measurement by synchronizing the movable stage and the CCD detector. The control device controls the movable stage to move in the direction orthogonal to the longitudinal direction of the linear irradiation light and obtain one average spectrum. At the same time, the control device is configured to perform the cycle of the CCD detector while the stage is moving to obtain one average spectrum of the moving region of the linear irradiation region in one light detection cycle.

2. 发明授权

US11029208B2 Microspectroscope having automatic sample detection function 有权
公开(公告)号：US11029208B2
公开(公告)日：2021-06-08
申请号：US16783294
申请日：2020-02-06
申请人： JASCO Corporation
发明人： Kento Aizawa , Yoshiko Kubo , Norihito Fujiwara , Katsunori Morii
IPC分类号： G01J3/02 , G01J3/44 , G01J3/28 , G01N21/65
摘要： The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.
A microspectroscope 10 comprises: a light source 12 that emits an excitation light to a sample 20; a condensing lens 16 that emits the excitation light to a predetermined position of the sample 20 and condenses a reflected light or a transmitted light from the sample 20; a spectrometer 24 that detects a condensed light; and an analysis control unit 30 for analyzing a signal from the spectrometer 24; the microspectroscope 10 that uses an observation image of the sample 20 to perform spectrometry, wherein the analysis control unit 30 comprises: an image storage part 32 that converts the observation image to an all-in-focus image to store the all-in-focus image; and a control part 34 that makes the microspectroscope 10 to perform measurement, the image storage part 32 adds a detected information of a sample point that is a target of spectrometry to the all-in-focus image to create a sample search image data, and the control part 34 automatically detects the sample point by using the sample search image data.

3. 发明授权

US11635605B2 Microspectroscope having position correction function 有权
公开(公告)号：US11635605B2
公开(公告)日：2023-04-25
申请号：US16782716
申请日：2020-02-05
申请人： JASCO Corporation
发明人： Kento Aizawa , Yoshiko Kubo , Norihito Fujiwara , Katsunori Morii
IPC分类号： G01J3/06 , G01J3/44 , G01J3/02 , G02B21/00
摘要： The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.
A microspectroscope 10 comprises: a light source 12 that emits an excitation light to a sample 20; a condensing lens 16 that emits the excitation light to a predetermined position of the sample 20 and condenses a reflected light or a transmitted light from the sample 20; a spectrometer 24 that detects a condensed light; and an analysis control unit 30 for analyzing a signal from the spectrometer 24; the microspectroscope 10 that uses an observation image of the sample 20 to perform spectrometry, wherein the analysis control unit 30 comprises: an image storage part 32 that converts the observation image to an all-in-focus image to store the all-in-focus image; and a control part 34 that makes the microspectroscope 10 to perform measurement, and the control part 34 uses the all-in-focus image and performs a template matching as a matching action of the image to perform position correction to a position deviation of a sample point that is a target of spectrometry in the sample.

4. 发明授权

US11579089B2 Raman microscope having fluorescence observation function and filter unit 有权
公开(公告)号：US11579089B2
公开(公告)日：2023-02-14
申请号：US17119272
申请日：2020-12-11
申请人： JASCO CORPORATION
发明人： Kento Aizawa , Takeo Soejima , Tsutomu Inoue
IPC分类号： G01N21/64 , G01N21/65 , G02B21/16 , G02B21/12 , G01N21/88
摘要： A filter unit for a Raman microscope mounted with a dark-field objective lens unit includes a frame body, a plurality of UV-LED elements that is disposed around a window part of the frame body to emit UV light, and a long-pass filter that is supported to the frame body to cover the window part of the frame body and transmits a light having a wavelength longer than the wavelength of the UV light. The filter unit has a dark-field UV irradiation function, and is able to impart a fluorescence observation function to the Raman microscope.

5. 发明授权

US11248962B2 Foreign matter analysis Method, storage medium storing foreign matter analysis program, and foreign matter analysis apparatus 有权
公开(公告)号：US11248962B2
公开(公告)日：2022-02-15
申请号：US17142635
申请日：2021-01-06
申请人： JASCO CORPORATION
发明人： Kento Aizawa , Yoshiko Kubo , Erika Taira , Yuji Higuchi
IPC分类号： G01J3/45 , G01N21/359 , G02B21/00 , G01N21/65 , G01N21/27 , G01N21/3563
摘要： A method of analyzing foreign matter in a sample includes: measuring an optical spectrum for each of a plurality of measurement points of a measurement region on the sample by a microscopic spectroscope; calculating a feature value of each measured spectrum by a computer; determining whether each of the measurement points is on the foreign matter or not based on each feature value; retaining the spectrum of the measurement point that is determined to be on the foreign matter, and deleting the spectrum of the measurement point that is not determined to be on the foreign matter or storing the same to a storage unit; and executing multivariate analysis of the spectra of the plurality of the measurement points that are determined to be on the foreign matter or classifying the same with AI search.

6. 发明授权

US10234665B2 Infrared microscope 有权
公开(公告)号：US10234665B2
公开(公告)日：2019-03-19
申请号：US15954679
申请日：2018-04-17
申请人： JASCO Corporation
发明人： Kento Aizawa , Hiroshi Sugiyama , Jun Koshobu
IPC分类号： G02B21/00 , G01N21/35
摘要： The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk.The infrared microscope 10 comprises a light source 12, an irradiating unit 14 for irradiating the infrared light from the light source to a sample 16, a focusing unit 18 for focusing the infrared light transmitted through or reflected by the sample 16, and a detector 20 for detecting the focused infrared light. The irradiating unit 14 comprises a first aperture 24, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unit 18 comprises a second aperture 30, and the second aperture is disposed at an imaging position of the infrared light at the first aperture 24. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detector 20 to detect the infrared light as a detecting light. The second aperture 30 has holes that have the same size and arrangement as the first aperture 24.

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