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    • 1. 发明授权
    • Structures and methods of replicating the same
    • 复制的结构和方法
    • US09370881B2
    • 2016-06-21
    • US11816257
    • 2006-02-27
    • John T. FourkasChristopher Lafratta
    • John T. FourkasChristopher Lafratta
    • B29C33/40B29C39/02B29C33/38B29C33/48B29C39/36B29C41/14
    • B29C39/026B29C33/3878B29C33/48B29C39/36B29C41/14
    • The invention features a method for producing replicas of a desired structure, a master and a mold obtained from it for use in such a method. The master includes a desired structure (200) to be reproduced and an additional structure (206, 208) that assists in removal of the master from a mold, e.g. by permitting portions of the mold on opposite sides of the additional structure to flex away from one another when the master is removed from the mold. The method includes immersing the master comprising the desired structure (200) and the additional structure (206, 208) in a molding material (142), solidifying the molding material (142) to make a mold, removing the master from the mold and using the mold to produce replicas of the desired structure (200). For example, the desired structure of the master may include a loop that defines a fluid flow pathway, and the additional structure includes a membrane configured to prevent the molding material from completely passing through the loop when the mold is made from the master.
    • 本发明的特征在于一种用于生产所需结构的副本的方法,一种从其获得的母版和模具,用于这种方法。 主人包括要再现的期望的结构(200)和辅助主模从模具中移除的附加结构(206,208)。 通过允许在将模具从模具中取出时,附加结构的相对侧上的模具的部分彼此远离。 该方法包括将包含所需结构(200)和附加结构(206,208)的母版浸入模制材料(142)中,固化模制材料(142)以制造模具,将模具从模具中移除并使用 该模具以产生所需结构(200)的副本。 例如,主体的期望结构可以包括限定流体流动路径的环,并且附加结构包括构造成当模具由主体制成时防止模制材料完全通过环的膜。
    • 2. 发明申请
    • STRUCTURES AND METHODS OF REPLICATING THE SAME
    • 结构及其替代方法
    • US20090020908A1
    • 2009-01-22
    • US11816257
    • 2006-02-27
    • John T. FourkasChristopher Lafratta
    • John T. FourkasChristopher Lafratta
    • B29C33/00
    • B29C39/026B29C33/3878B29C33/48B29C39/36B29C41/14
    • The invention features a method for producing replicas of a desired structure, a master and a mold obtained from it for use in such a method. The master includes a desired structure (200) to be reproduced and an additional structure (206, 208) that assists in removal of the master from a mold, e.g. by permitting portions of the mold on opposite sides of the additional structure to flex away from one another when the master is removed from the mold. The method includes immersing the master comprising the desired structure (200) and the additional structure (206, 208) in a molding material (142), solidifying the molding material (142) to make a mold, removing the master from the mold and using the mold to produce replicas of the desired structure (200). For example, the desired structure of the master may include a loop that defines a fluid flow pathway, and the additional structure includes a membrane configured to prevent the molding material from completely passing through the loop when the mold is made from the master.
    • 本发明的特征在于一种用于生产所需结构的副本的方法,一种从其获得的母版和模具,用于这种方法。 主人包括要再现的期望的结构(200)和辅助主模从模具中移除的附加结构(206,208)。 通过允许在将模具从模具中取出时,附加结构的相对侧上的模具的部分彼此远离。 该方法包括将包含所需结构(200)和附加结构(206,208)的母版浸入模制材料(142)中,固化模制材料(142)以制造模具,将模具从模具中移除并使用 该模具以产生所需结构(200)的副本。 例如,主体的期望结构可以包括限定流体流动路径的环,并且附加结构包括构造成当模具由主体制成时防止模制材料完全通过环的膜。
    • 3. 发明申请
    • Electrical Detection of Plasmon Resonances
    • 等离子体共振的电气检测
    • US20080285040A1
    • 2008-11-20
    • US11816252
    • 2006-02-27
    • John T. FourkasDaniel LimChristopher LafrattaMichael J. Naughton
    • John T. FourkasDaniel LimChristopher LafrattaMichael J. Naughton
    • G01N21/62G01R27/02
    • G01N21/554
    • A method includes detecting a plasmon resonance in a material based on a change in at least one electrical property of the material. For example, the material can be a sensor portion of an electrical circuit, wherein the method can further include: exposing the sensor portion to a test material; optically illuminating the sensor portion when the test material is present, and monitoring the change in the at least one electrical property of the sensor portion in response to the optical illumination. The monitored changed in the at least one electrical property of the sensor portion can provide information about the test material, such as the presence or absence of selected analytes and/or their binding affinities. In another example, the material is a part of a receiver for a plasmonic circuit. An apparatus for carrying out the method is also disclosed.
    • 一种方法包括基于材料的至少一种电性质的变化来检测材料中的等离子体共振。 例如,该材料可以是电路的传感器部分,其中该方法还可以包括:将传感器部分暴露于测试材料; 当存在测试材料时光学照射传感器部分,并响应于光学照明监测传感器部分的至少一个电特性的变化。 在传感器部分的至少一个电性能中监测的监测变化可以提供关于测试材料的信息,例如选择的分析物的存在或不存在和/或其结合亲和力。 在另一示例中,材料是等离子体激元电路的接收器的一部分。 还公开了一种用于执行该方法的装置。
    • 4. 发明授权
    • Spectroscopic imaging microscopy
    • 光谱成像显微镜
    • US08189191B2
    • 2012-05-29
    • US12239628
    • 2008-09-26
    • Michael R. WebbChristopher LafrattaDavid R. Walt
    • Michael R. WebbChristopher LafrattaDavid R. Walt
    • G01J3/28
    • G01J3/18G01J3/02G01J3/0208G01J3/0229G01J3/0237G01J3/0264G01J3/14G01J3/32G02B21/06G02B21/367
    • Disclosed herein are systems that include: (a) an objective lens system configured to collect light from a sample; (b) a first aperture positioned to allow a portion of the collected light received from the objective lens system to pass as input light; (c) a first lens positioned to transmit the input light received from the first aperture; (d) a dispersive element configured to spatially disperse the input light received from the first lens in a first plane; (e) a second lens positioned to transmit the spatially dispersed light; (f) a second aperture positioned to allow a portion of the spatially dispersed light received from the second lens to pass as detection light; and (g) a detector positioned to receive the detection light and configured to form at least one image of the sample.
    • 这里公开的系统包括:(a)被配置为收集来自样品的光的物镜系统; (b)第一孔,定位成允许从物镜系统接收的一部分收集的光作为输入光通过; (c)第一透镜,定位成透射从第一孔接收的输入光; (d)分散元件,被配置为在第一平面中将从第一透镜接收的输入光空间分散; (e)定位成透射空间分散的光的第二透镜; (f)第二孔,定位成允许从第二透镜接收的空间分散的光的一部分作为检测光通过; 和(g)定位成接收检测光并被配置成形成样品的至少一个图像的检测器。