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    • 2. 发明授权
    • Electronic circuit and method for state retention power gating
    • 电子电路和状态保持电源门控方法
    • US08598949B2
    • 2013-12-03
    • US13634730
    • 2010-06-11
    • Michael PrielLeonid FleshelAnton Rozen
    • Michael PrielLeonid FleshelAnton Rozen
    • G05F1/10
    • H03K3/00H03K3/012H03K19/0008
    • A method and a electronic circuit, the method includes: sending to a switching circuit, to a state retention power gating (SRPG) circuit and to a first power source a control signal indicating that the SRPG circuit should operate in a functional mode; coupling, by the switching circuit, a third power grid to a first power grid; supplying power from the first power source to the SRPG circuit via the first power grid, the switching circuit and the third power grid; supplying power from a second power source to a second circuit via a second power grid; sending to the switching circuit, to the SRPG circuit and to the first power source a control signal indicating that the SRPG circuit should operate in a state retention mode; coupling, by the switching circuit, the third power grid to the second power grid; supplying power from the second power source to the SRPG circuit via the second power grid, the switching circuit and the third power grid; supplying power from the second power source to the second circuit via the second power grid; and storing, by the SRPG state information.
    • 一种方法和电子电路,所述方法包括:向切换电路发送状态保持电源选通(SRPG)电路和向第一电源发送指示SRPG电路应以功能模式工作的控制信号; 由开关电路将第三电网耦合到第一电网; 通过第一电网,开关电路和第三电网从第一电源向SRPG电路供电; 经由第二电网从第二电源向第二电路供电; 向SRPG电路和第一电源发送指示SRPG电路在状态保持模式下工作的控制信号; 由开关电路将第三电网耦合到第二电网; 通过第二电网,开关电路和第三电网从第二电源向SRPG电路供电; 经由所述第二电网从所述第二电源向所述第二电路供电; 并通过SRPG状态信息存储。
    • 4. 发明申请
    • BYPASS CAPACITOR CIRCUIT AND METHOD OF PROVIDING A BYPASS CAPACITANCE FOR AN INTEGRATED CIRCUIT DIE
    • 旁路电容器电路和为集成电路提供旁路电容的方法
    • US20120236630A1
    • 2012-09-20
    • US13509922
    • 2009-11-30
    • Michael PrielLeonid FleshelAnton Rozen
    • Michael PrielLeonid FleshelAnton Rozen
    • G11C11/24H01L21/02H01L27/108
    • H01L23/5223G11C2029/5002H01L22/14H01L22/22H01L23/49589H01L23/5286H01L23/585H01L2924/0002H01L2924/00
    • A bypass capacitor circuit for an integrated circuit (IC) comprises one or more capacitive devices, each arranged in a segment of a seal ring area of a die, which comprises the IC. A method of providing a bypass capacitance for an IC comprises providing a semiconductor wafer device comprising a plurality of dies, each comprising an IC; arranging one or more capacitive devices in a seal ring area of at least one of the IC; dicing the semiconductor wafer device; in a test mode, for each of the one or more capacitive devices, enabling the capacitive device, determining an operability parameter value indicative of an operability of the capacitive device, and storing the operability parameter in a memory device; and in a normal operation mode, providing a bypass capacitance to the IC depending on a capacitance of one or more of the capacitive devices having an associated operability parameter value indicative of a non-defectiveness of the corresponding capacitive device.
    • 用于集成电路(IC)的旁路电容器电路包括一个或多个电容性器件,每个电容器件布置在包括IC的管芯的密封环区域的段中。 提供用于IC的旁路电容的方法包括提供包括多个芯片的半导体晶片装置,每个芯片包括IC; 在所述IC中的至少一个的密封环区域中布置一个或多个电容性装置; 切割半导体晶片器件; 在测试模式中,对于所述一个或多个电容性装置中的每一个,启用所述电容性装置,确定指示所述电容性装置的可操作性的可操作性参数值,以及将所述可操作性参数存储在存储装置中; 并且在正常操作模式中,根据具有指示对应的电容性器件的非缺陷性的相关联的可操作性参数值的一个或多个电容器件的电容,向IC提供旁路电容。
    • 6. 发明授权
    • Bypass capacitor circuit and method of providing a bypass capacitance for an integrated circuit die
    • 旁路电容电路和为集成电路管芯提供旁路电容的方法
    • US09431338B2
    • 2016-08-30
    • US13509922
    • 2009-11-30
    • Michael PrielLeonid FleshelAnton Rozen
    • Michael PrielLeonid FleshelAnton Rozen
    • G11C11/24H01L23/522H01L23/528H01L23/58H01L23/495G11C29/50H01L21/66
    • H01L23/5223G11C2029/5002H01L22/14H01L22/22H01L23/49589H01L23/5286H01L23/585H01L2924/0002H01L2924/00
    • A bypass capacitor circuit for an integrated circuit (IC) comprises one or more capacitive devices, each arranged in a segment of a seal ring area of a die, which comprises the IC. A method of providing a bypass capacitance for an IC comprises providing a semiconductor wafer device comprising a plurality of dies, each comprising an IC; arranging one or more capacitive devices in a seal ring area of at least one of the IC; dicing the semiconductor wafer device; in a test mode, for each of the one or more capacitive devices, enabling the capacitive device, determining an operability parameter value indicative of an operability of the capacitive device, and storing the operability parameter in a memory device; and in a normal operation mode, providing a bypass capacitance to the IC depending on a capacitance of one or more of the capacitive devices having an associated operability parameter value indicative of a non-defectiveness of the corresponding capacitive device.
    • 用于集成电路(IC)的旁路电容器电路包括一个或多个电容性器件,每个电容器件布置在包括IC的管芯的密封环区域的段中。 提供用于IC的旁路电容的方法包括提供包括多个芯片的半导体晶片装置,每个芯片包括IC; 在所述IC中的至少一个的密封环区域中布置一个或多个电容性装置; 切割半导体晶片器件; 在测试模式中,对于所述一个或多个电容性装置中的每一个,启用所述电容性装置,确定指示所述电容性装置的可操作性的可操作性参数值,以及将所述可操作性参数存储在存储装置中; 并且在正常操作模式中,根据具有指示对应的电容性器件的非缺陷性的相关联的可操作性参数值的一个或多个电容器件的电容,向IC提供旁路电容。
    • 8. 发明申请
    • ELECTRONIC CIRCUIT AND METHOD FOR STATE RETENTION POWER GATING
    • 电子电路和状态保持功率增益的方法
    • US20130076421A1
    • 2013-03-28
    • US13634730
    • 2010-06-11
    • Michael PrielLeonid FleshelAnton Rozen
    • Michael PrielLeonid FleshelAnton Rozen
    • H03K3/00
    • H03K3/00H03K3/012H03K19/0008
    • A method and a electronic circuit, the method includes: sending to a switching circuit, to a state retention power gating (SRPG) circuit and to a first power source a control signal indicating that the SRPG circuit should operate in a functional mode; coupling, by the switching circuit, a third power grid to a first power grid; supplying power from the first power source to the SRPG circuit via the first power grid, the switching circuit and the third power grid; supplying power from a second power source to a second circuit via a second power grid; sending to the switching circuit, to the SRPG circuit and to the first power source a control signal indicating that the SRPG circuit should operate in a state retention mode; coupling, by the switching circuit, the third power grid to the second power grid; supplying power from the second power source to the SRPG circuit via the second power grid, the switching circuit and the third power grid; supplying power from the second power source to the second circuit via the second power grid; and storing, by the SRPG state information.
    • 一种方法和电子电路,所述方法包括:向切换电路发送状态保持电源选通(SRPG)电路和向第一电源发送指示SRPG电路应以功能模式工作的控制信号; 由开关电路将第三电网耦合到第一电网; 通过第一电网,开关电路和第三电网从第一电源向SRPG电路供电; 经由第二电网从第二电源向第二电路供电; 向SRPG电路和第一电源发送指示SRPG电路在状态保持模式下工作的控制信号; 由开关电路将第三电网耦合到第二电网; 通过第二电网,开关电路和第三电网从第二电源向SRPG电路供电; 经由所述第二电网从所述第二电源向所述第二电路供电; 并通过SRPG状态信息存储。
    • 10. 发明授权
    • System and a method for testing connectivity between a first device and a second device
    • 系统和用于测试第一设备和第二设备之间的连接性的方法
    • US07941721B2
    • 2011-05-10
    • US12550516
    • 2009-08-31
    • Michael PrielLeonid FleshelAnton Rozen
    • Michael PrielLeonid FleshelAnton Rozen
    • G06F11/00
    • G01R31/318538G01R31/318541
    • A device and a method for testing a connectivity between a first device and a second device, the method includes: writing, at a first frequency and in a serial manner, a first test word to a source boundary scan register; writing a content of the source boundary scan register, at a second frequency and in a parallel manner, to a target boundary scan register; wherein the second frequency is higher than the first frequency; reading the content of the target boundary scan register; wherein the source and target boundary scan registers are selected from a first boundary scan register of the first device and a second boundary scan register of the second device; and evaluating a connectivity between the first and second device in response to a relationship between the first test word and the content of the target boundary scan register.
    • 一种用于测试第一设备和第二设备之间的连接性的设备和方法,所述方法包括:以第一频率和串行方式将第一测试字写入源边界扫描寄存器; 将源边界扫描寄存器的内容以第二频率和并行方式写入目标边界扫描寄存器; 其中所述第二频率高于所述第一频率; 读取目标边界扫描寄存器的内容; 其中所述源和目标边界扫描寄存器从所述第一设备的第一边界扫描寄存器和所述第二设备的第二边界扫描寄存器中选择; 以及响应于所述第一测试字与所述目标边界扫描寄存器的内容之间的关系来评估所述第一和第二设备之间的连接性。