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1. 发明授权

US10451410B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10451410B2
公开(公告)日：2019-10-22
申请号：US15567933
申请日：2016-04-22
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Atsuhiro Hibi , Yusuke Konno , Nobuhiro Furuya , Tomohiro Kuroiwa
IPC分类号： G06T7/60 , G01B11/02 , G01B11/25 , H04N5/247
摘要： [Object] To measure the surface height of a rigid body to be measured more accurately even if any one of three types of disturbance of translation in the height direction, rotation around the longitudinal-direction axis, and rotation around the width-direction axis has occurred during conveyance.[Solution] A shape measurement apparatus according to the present invention uses a shape-measuring light-section line that is a light-section line extending in the width direction of a rigid body to be measured and is used to calculate the surface shape of the rigid body to be measured, a first correcting light-section line that is parallel to the longitudinal direction of the rigid body to be measured and crosses the shape-measuring light-section line, and is used to correct the effect of disturbance acting on the rigid body to be measured, and a second correcting light-section line that is parallel to the longitudinal direction of the rigid body to be measured, crosses the shape-measuring light-section line, and exists in a width-direction position of the rigid body to be measured different from the first correcting light-section line. On the basis of the two kinds of correcting light-section lines, the magnitude of disturbance is estimated at the intersection points of the shape-measuring light-section line and the correcting light-section lines; and thereby shape data obtained from the shape-measuring light-section line are corrected.

2. 发明授权

US10605591B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10605591B2
公开(公告)日：2020-03-31
申请号：US15738499
申请日：2017-05-19
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Yusuke Konno , Takamichi Kobayashi , Toshio Akagi , Atsuhiro Hibi , Nobuhiro Furuya , Akihito Nakazaki
IPC分类号： G01B11/24 , G01N21/892 , G01B11/30 , G01B11/26 , G01N21/89
摘要： A shape measurement apparatus includes: a linear light source that includes a superluminescent diode and applies linear light spreading in a width direction of the strip-shaped body to a surface of the strip-shaped body; a screen on which reflected light of the linear light off the surface of the strip-shaped body is projected; an area camera that captures an image of the reflected light of the linear light projected on the screen; and an arithmetic processing apparatus that calculates the surface shape of the strip-shaped body using the captured image of the reflected light of the linear light captured by the area camera.

3. 发明授权

US10527410B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10527410B2
公开(公告)日：2020-01-07
申请号：US15767081
申请日：2017-01-19
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Toshio Akagi , Yusuke Konno , Atsuhiro Hibi , Nobuhiro Furuya , Takayuki Sonoda , Akihito Nakazaki
IPC分类号： G01B11/30 , G01B11/24 , G01N21/892
摘要： [Object] To provide a shape measurement apparatus that is capable of detecting minute roughness irregularity at high speed across the entire width on the entire surface of a measurement object.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light diagonally from an upstream side in a movement direction of the strip-shaped body; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire surface roughness distribution of the strip-shaped body on the basis of width distribution of a light strip of the reflected light of the linear light projected on the screen. The angle of incidence of the light source with respect to the strip-shaped body is set in accordance with target surface roughness of the surface of the strip-shaped body.

4. 发明授权

US10281408B2 Inspection object imaging apparatus, inspection object imaging method, surface inspection apparatus, and surface inspection method 有权
公开(公告)号：US10281408B2
公开(公告)日：2019-05-07
申请号：US15564154
申请日：2016-12-19
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Yusuke Konno , Takamichi Kobayashi , Toshio Akagi , Atsuhiro Hibi , Nobuhiro Furuya , Akihito Nakazaki
IPC分类号： G01N21/88 , G01N21/892 , G01N21/94 , G01N21/952 , G01N21/359 , G01N21/00 , G01N15/06
摘要： An inspection object imaging apparatus includes: a light source configured to produce a light beam belonging to an infrared wavelength band and having a predetermined spread half-angle on a surface of an inspection object; a projection optical system to project the light beam on the surface of the inspection object at a predetermined projection angle; and an imaging unit. The imaging unit includes an imaging optical system configured to condense reflected light and branch the reflected light to two different directions, and a first image sensor and a second image sensor, the first image sensor positioned on the inspection object side with respect to a position of the imaging optical system that is conjugate with the surface of the inspection object, along an optical axis of the reflected light, and the second image sensor positioned on the reflected-light travel direction side with respect to the conjugate position.

5. 发明授权

US10274314B2 Shape inspection method, shape inspection apparatus, and program 有权
公开(公告)号：US10274314B2
公开(公告)日：2019-04-30
申请号：US15571609
申请日：2016-05-13
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Atsuhiro Hibi , Yusuke Konno , Nobuhiro Furuya , Tomohiro Kuroiwa
IPC分类号： G01B11/24 , G01B11/25 , G01B11/30 , G06T7/00
摘要： [Object] To provide a shape inspection method, a shape inspection apparatus, and a program capable of adjusting the brightness and the thickness of a light-section line in a light-section image more simply and objectively.[Solution] A shape inspection method according to the present invention includes: a light-section image generation step in which linear laser light is applied to an object surface from a laser light source and a light-section line based on the laser light on the object surface is imaged by an imaging apparatus, and thereby a light-section image that is a captured image used for a light-section method is generated; an indicator value calculation step in which a thickness indicator value indicating a thickness of the light-section line and a brightness indicator value indicating a brightness of the light-section line in the light-section image are calculated; a setting changing step in which setting of at least one of the laser light source and the imaging apparatus is changed so that each of the calculated thickness indicator value and the calculated brightness indicator value is within a prescribed range uniquely set in advance; and a shape inspection step in which image processing is performed on the light-section image after each of the thickness indicator value and the brightness indicator value is brought within the prescribed range, and thereby a shape of the object surface is inspected.

6. 发明授权

US10247544B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10247544B2
公开(公告)日：2019-04-02
申请号：US15559681
申请日：2016-12-20
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Atsuhiro Hibi , Yusuke Konno , Toshio Akagi , Nobuhiro Furuya , Tomohiro Kuroiwa , Akihito Nakazaki
IPC分类号： G01B11/24 , G01B11/30
摘要： [Object] To provide a shape measurement apparatus that is capable of measuring the amount of warpage in the width direction of a strip-shaped body with higher sensitivity.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light at a prescribed angle of incidence; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire the amount of warpage in a width direction of the strip-shaped body on the basis of a line length of the reflected light of the linear light imaged by the imaging unit.

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