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1. 发明授权

US10451410B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10451410B2
公开(公告)日：2019-10-22
申请号：US15567933
申请日：2016-04-22
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Atsuhiro Hibi , Yusuke Konno , Nobuhiro Furuya , Tomohiro Kuroiwa
IPC分类号： G06T7/60 , G01B11/02 , G01B11/25 , H04N5/247
摘要： [Object] To measure the surface height of a rigid body to be measured more accurately even if any one of three types of disturbance of translation in the height direction, rotation around the longitudinal-direction axis, and rotation around the width-direction axis has occurred during conveyance.[Solution] A shape measurement apparatus according to the present invention uses a shape-measuring light-section line that is a light-section line extending in the width direction of a rigid body to be measured and is used to calculate the surface shape of the rigid body to be measured, a first correcting light-section line that is parallel to the longitudinal direction of the rigid body to be measured and crosses the shape-measuring light-section line, and is used to correct the effect of disturbance acting on the rigid body to be measured, and a second correcting light-section line that is parallel to the longitudinal direction of the rigid body to be measured, crosses the shape-measuring light-section line, and exists in a width-direction position of the rigid body to be measured different from the first correcting light-section line. On the basis of the two kinds of correcting light-section lines, the magnitude of disturbance is estimated at the intersection points of the shape-measuring light-section line and the correcting light-section lines; and thereby shape data obtained from the shape-measuring light-section line are corrected.

2. 发明授权

US10605591B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10605591B2
公开(公告)日：2020-03-31
申请号：US15738499
申请日：2017-05-19
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Yusuke Konno , Takamichi Kobayashi , Toshio Akagi , Atsuhiro Hibi , Nobuhiro Furuya , Akihito Nakazaki
IPC分类号： G01B11/24 , G01N21/892 , G01B11/30 , G01B11/26 , G01N21/89
摘要： A shape measurement apparatus includes: a linear light source that includes a superluminescent diode and applies linear light spreading in a width direction of the strip-shaped body to a surface of the strip-shaped body; a screen on which reflected light of the linear light off the surface of the strip-shaped body is projected; an area camera that captures an image of the reflected light of the linear light projected on the screen; and an arithmetic processing apparatus that calculates the surface shape of the strip-shaped body using the captured image of the reflected light of the linear light captured by the area camera.

3. 发明授权

US10527410B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10527410B2
公开(公告)日：2020-01-07
申请号：US15767081
申请日：2017-01-19
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Toshio Akagi , Yusuke Konno , Atsuhiro Hibi , Nobuhiro Furuya , Takayuki Sonoda , Akihito Nakazaki
IPC分类号： G01B11/30 , G01B11/24 , G01N21/892
摘要： [Object] To provide a shape measurement apparatus that is capable of detecting minute roughness irregularity at high speed across the entire width on the entire surface of a measurement object.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light diagonally from an upstream side in a movement direction of the strip-shaped body; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire surface roughness distribution of the strip-shaped body on the basis of width distribution of a light strip of the reflected light of the linear light projected on the screen. The angle of incidence of the light source with respect to the strip-shaped body is set in accordance with target surface roughness of the surface of the strip-shaped body.

4. 发明授权

US09970750B2 Shape inspection apparatus for metallic body and shape inspection method for metallic body 有权
公开(公告)号：US09970750B2
公开(公告)日：2018-05-15
申请号：US15510827
申请日：2016-05-24
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Toshio Akagi , Yusuke Konno , Hironao Yamaji , Jun Umemura
IPC分类号： G01B11/24 , G01B11/25 , G01B11/245 , G01B11/26 , G01N21/892 , G01N21/86 , G01N21/89
CPC分类号： G01B11/2509 , G01B11/245 , G01B11/26 , G01N21/86 , G01N21/8903 , G01N21/8914 , G01N21/892 , G01N2021/8636 , G01N2021/8908 , G01N2021/8918 , G06T7/0004 , G06T7/521 , G06T7/586 , G06T2207/10024 , G06T2207/10152 , G06T2207/30136
摘要： [Object] To perform shape inspection of a metallic body in a simple way at higher speed with higher density.[Solution] An apparatus of the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of measurement results. The measurement apparatus includes a plurality of illumination light sources configured to emit strip-shaped illumination light having different peak wavelengths, and a plurality of monochrome line sensor cameras that have band-pass filters and are aligned vertically above a surface of the metallic body and set to capture images of the same portion of the metallic body by their respective shift lenses, the number of the monochrome line sensor cameras being the same as the number of the peak wavelengths of the emitted illumination light. At least two of the plurality of illumination light sources are provided in a manner that an angle formed by a normal direction to the surface of the metallic body and an optical axis of the first illumination light source is substantially equal to an angle formed by the normal direction and an optical axis of the second illumination light source and the two illumination light sources face each other with the line sensor cameras therebetween in a relative movement direction of the metallic body and the measurement apparatus.

5. 发明授权

US09903710B2 Shape inspection apparatus for metallic body and shape inspection method for metallic body 有权
公开(公告)号：US09903710B2
公开(公告)日：2018-02-27
申请号：US15514368
申请日：2016-06-01
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Yusuke Konno , Toshio Akagi , Hironao Yamaji , Jun Umemura
IPC分类号： G01B11/00 , G01B11/24 , G01C9/02 , H04N9/07 , H04N5/225
CPC分类号： G01B11/24 , G01B11/2509 , G01B11/26 , G01C9/02 , G01N21/86 , G01N21/8901 , G01N21/8914 , G01N21/892 , G01N2021/8636 , G01N2021/8908 , G01N2021/8918 , G06T7/0004 , G06T7/521 , G06T2207/10024 , G06T2207/10152 , G06T2207/30136 , H04N5/2256 , H04N9/07
摘要： To inspect the shape of a metallic body further accurately, regardless of surface roughness of the metallic body. A shape inspection apparatus for a metallic body according to the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light of the two illumination light beams from the metallic body separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of luminance values of the reflected light. The measurement apparatus includes a first illumination light source and a second illumination light source configured to irradiate the metallic body with strip-shaped illumination light having mutually different peak wavelengths, and a color line sensor camera configured to measure reflected light of first illumination light and reflected light of second illumination light, separately. The first illumination light source and the second illumination light source are provided in a manner that their optical axes form substantially equal angles with a direction of regular reflection of an optical axis of the color line sensor camera at a surface of the metallic body. A wavelength difference between a peak wavelength of the first illumination light and a peak wavelength of the second illumination light is equal to or more than 5 nm and equal to or less than 90 nm.

6. 发明授权

US10290113B2 Surface state monitoring apparatus for metallic body and surface state monitoring method for metallic body 有权
公开(公告)号：US10290113B2
公开(公告)日：2019-05-14
申请号：US15514311
申请日：2016-04-08
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Toshio Akagi , Yusuke Konno , Hironao Yamaji , Jun Umemura
IPC分类号： H04N7/18 , G06T7/507 , G01B11/30 , G01N21/892 , G01B11/24 , G01J3/50 , G06F17/11 , G06T7/40
摘要： [Object] To monitor, on a metallic body surface, a region that has a specific hue and a region that does not have the specific hue and has a surface whose roughness varies.[Solution] Included are: a measurement apparatus which includes a line sensor camera which is provided such that an optical axis of the line sensor camera is substantially parallel to a normal direction of a metallic body surface, and first, second, and third illumination light sources each configured to irradiate the metallic body surface with first, second, and third illumination light beams each having a strip shape, the measurement apparatus being configured to measure separately respective reflected light beams of the three illumination light beams that have been emitted; and an arithmetic processing apparatus configured to calculate surface state monitoring information on the basis of luminance values of the reflected light beams. The second and third illumination light sources are provided such that a second angle between an optical axis of the second illumination light source and the optical axis of the line sensor camera is substantially equal to a third angle between an optical axis of the third illumination light source and the optical axis of the line sensor camera, and the first illumination light source is provided such that a first angle between the optical axis of the line sensor camera and an optical axis of the first illumination light source is larger than the second angle. The arithmetic processing apparatus calculates information on a hue of the metallic body surface on the basis of a luminance value of the reflected light beam of the first illumination light beam and information on surface roughness of the metallic body on the basis of luminance values of the respective reflected light beams of the second and third illumination light beams.

7. 发明授权

US10281408B2 Inspection object imaging apparatus, inspection object imaging method, surface inspection apparatus, and surface inspection method 有权
公开(公告)号：US10281408B2
公开(公告)日：2019-05-07
申请号：US15564154
申请日：2016-12-19
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Yusuke Konno , Takamichi Kobayashi , Toshio Akagi , Atsuhiro Hibi , Nobuhiro Furuya , Akihito Nakazaki
IPC分类号： G01N21/88 , G01N21/892 , G01N21/94 , G01N21/952 , G01N21/359 , G01N21/00 , G01N15/06
摘要： An inspection object imaging apparatus includes: a light source configured to produce a light beam belonging to an infrared wavelength band and having a predetermined spread half-angle on a surface of an inspection object; a projection optical system to project the light beam on the surface of the inspection object at a predetermined projection angle; and an imaging unit. The imaging unit includes an imaging optical system configured to condense reflected light and branch the reflected light to two different directions, and a first image sensor and a second image sensor, the first image sensor positioned on the inspection object side with respect to a position of the imaging optical system that is conjugate with the surface of the inspection object, along an optical axis of the reflected light, and the second image sensor positioned on the reflected-light travel direction side with respect to the conjugate position.

8. 发明授权

US10274314B2 Shape inspection method, shape inspection apparatus, and program 有权
公开(公告)号：US10274314B2
公开(公告)日：2019-04-30
申请号：US15571609
申请日：2016-05-13
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Atsuhiro Hibi , Yusuke Konno , Nobuhiro Furuya , Tomohiro Kuroiwa
IPC分类号： G01B11/24 , G01B11/25 , G01B11/30 , G06T7/00
摘要： [Object] To provide a shape inspection method, a shape inspection apparatus, and a program capable of adjusting the brightness and the thickness of a light-section line in a light-section image more simply and objectively.[Solution] A shape inspection method according to the present invention includes: a light-section image generation step in which linear laser light is applied to an object surface from a laser light source and a light-section line based on the laser light on the object surface is imaged by an imaging apparatus, and thereby a light-section image that is a captured image used for a light-section method is generated; an indicator value calculation step in which a thickness indicator value indicating a thickness of the light-section line and a brightness indicator value indicating a brightness of the light-section line in the light-section image are calculated; a setting changing step in which setting of at least one of the laser light source and the imaging apparatus is changed so that each of the calculated thickness indicator value and the calculated brightness indicator value is within a prescribed range uniquely set in advance; and a shape inspection step in which image processing is performed on the light-section image after each of the thickness indicator value and the brightness indicator value is brought within the prescribed range, and thereby a shape of the object surface is inspected.

9. 发明授权

US10247544B2 Shape measurement apparatus and shape measurement method 有权
公开(公告)号：US10247544B2
公开(公告)日：2019-04-02
申请号：US15559681
申请日：2016-12-20
申请人： NIPPON STEEL & SUMITOMO METAL CORPORATION
发明人： Atsuhiro Hibi , Yusuke Konno , Toshio Akagi , Nobuhiro Furuya , Tomohiro Kuroiwa , Akihito Nakazaki
IPC分类号： G01B11/24 , G01B11/30
摘要： [Object] To provide a shape measurement apparatus that is capable of measuring the amount of warpage in the width direction of a strip-shaped body with higher sensitivity.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light at a prescribed angle of incidence; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire the amount of warpage in a width direction of the strip-shaped body on the basis of a line length of the reflected light of the linear light imaged by the imaging unit.

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