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1. 发明申请

US20210407099A1 METHOD AND APPARATUS FOR DETECTING DEFECTS ON SUBSTRATE 有权
公开(公告)号：US20210407099A1
公开(公告)日：2021-12-30
申请号：US17141770
申请日：2021-01-05
申请人： Samsung Electronics Co., Ltd.
发明人： Sunghee Lee , Kyubaik Chang
IPC分类号： G06T7/155 , G06T7/00
摘要： A method for detecting a defect on a substrate, including receiving a first image, generating a second image, by converting the first image to grayscale levels, calculating a first gray level value, having a maximum number of pixels in the second image, and second and third gray level values, having a number of pixels in the second image equal to a predetermined fraction of the first gray level value, from a histogram of the number of pixels respective to the grayscale levels of the second image, converting the second image into a third image having pixels at a level lower than that of the first gray level value and a fourth image having pixels at a level equal to or higher than the first gray level value, generating fifth and sixth images by detecting edges by applying a Canny algorithm to the third and fourth images, respectively.

2. 发明授权

US09970906B2 Apparatus for analyzing active material of secondary battery and method of analyzing active material using the same 有权
公开(公告)号：US09970906B2
公开(公告)日：2018-05-15
申请号：US14734229
申请日：2015-06-09
申请人： Samsung Electronics Co., Ltd.
发明人： Jooho Lee , Changseung Lee , Jeoyoung Shim , Sunghee Lee , Woosung Jeon
IPC分类号： G01N29/12 , G01N29/24
CPC分类号： G01N29/12 , G01N29/2437 , G01N2291/0256 , G01N2291/2697
摘要： An apparatus for analyzing an active material of a secondary battery may include: a first electrode; a piezoelectric layer on the first electrode; a second electrode on the piezoelectric layer, configured to provide a voltage having a polarity opposite to a polarity of the first electrode; and/or an insulating layer on the second electrode and including a through hole exposing a portion of the second electrode. A method of analyzing an active material of a secondary battery may include: disposing an active material in a through hole of a bulk acoustic resonator, in which a first electrode, a piezoelectric layer, a second electrode, and an insulating layer are stacked; measuring a resonance frequency of the resonator by applying an electric signal to the first and second electrodes of the resonator; and/or measuring a weight of the active material in the through hole, based on the measured resonance frequency.

3. 发明授权

US11587235B2 Method and apparatus for detecting defects on substrate 有权
公开(公告)号：US11587235B2
公开(公告)日：2023-02-21
申请号：US17141770
申请日：2021-01-05
申请人： Samsung Electronics Co., Ltd.
发明人： Sunghee Lee , Kyubaik Chang
IPC分类号： G06T7/13 , G06T7/00 , G06T7/136 , G06T7/155
摘要： A method for detecting a defect on a substrate, including receiving a first image, generating a second image, by converting the first image to grayscale levels, calculating a first gray level value, having a maximum number of pixels in the second image, and second and third gray level values, having a number of pixels in the second image equal to a predetermined fraction of the first gray level value, from a histogram of the number of pixels respective to the grayscale levels of the second image, converting the second image into a third image having pixels at a level lower than that of the first gray level value and a fourth image having pixels at a level equal to or higher than the first gray level value, generating fifth and sixth images by detecting edges by applying a Canny algorithm to the third and fourth images, respectively.

4. 发明授权

US10211194B2 Semiconductor device and method of manufacturing the same 有权
公开(公告)号：US10211194B2
公开(公告)日：2019-02-19
申请号：US14656298
申请日：2015-03-12
申请人： Samsung Electronics Co., Ltd.
发明人： Kunmo Chu , Changyoul Moon , Sunghee Lee , Junsik Hwang
IPC分类号： H01L23/48 , H01L25/00 , H01L23/00 , H01L25/065 , H01L33/00
摘要： A semiconductor device includes a base substrate and a semiconductor chip on the base substrate, the semiconductor chip including a first layer structure and a second layer structure opposite to the first layer structure, at least one of the first and second layer structures including a semiconductor device portion, and a bonding structure between the first layer structure and the second layer structure, the bonding structure including a silver-tin (Ag—Sn) compound and a nickel-tin (Ni—Sn) compound.

5. 发明申请

US20150355845A1 MEMORY SYSTEMS THAT SUPPORT READ RECLAIM OPERATIONS AND METHODS OF OPERATING SAME TO THEREBY PROVIDE REAL TIME DATA RECOVERY 审中-公开
标题翻译：支持读取记录操作的记忆系统和操作方法，以提供实时数据恢复
公开(公告)号：US20150355845A1
公开(公告)日：2015-12-10
申请号：US14729518
申请日：2015-06-03
申请人： Samsung Electronics Co., Ltd.
发明人： Kwang-Jin Lee , Seonghun Kim , Jeong-Han Kim , Sunghee Lee , Sanggyu Jang , Hong Suk Choi
IPC分类号： G06F3/06
CPC分类号： G06F3/0679 , G06F3/0616 , G06F3/0659 , G06F12/0246 , G11C16/3418 , G11C16/349 , G11C16/3495 , G11C2211/5641
摘要： Methods of operating nonvolatile memory devices include counting a number of consecutive read operations performed on a first memory region within the nonvolatile memory device, and executing a page reclaim operation on the first memory region in response to detecting that a count in the number of consecutive read operations meets or exceeds a threshold count. A page reclaim operation may include checking an error bit level within a page of data stored in a multi-level cell block within the memory device. The page reclaim operation may further include moving page data from the multi-level cell block to a single-level cell block in the memory device and error correcting the page data during the moving.
摘要翻译：操作非易失性存储器件的方法包括对在非易失性存储器件内的第一存储器区域执行的连续读取操作的数量进行计数，以及响应于检测到连续读取数量的计数，对第一存储器区域执行页面回收操作操作满足或超过阈值计数。页面回收操作可以包括检查存储在存储器设备内的多级单元块中的数据页内的错误位级别。页面回收操作可以进一步包括将页面数据从多级单元块移动到存储器件中的单级单元块，并且在移动期间纠错页面数据。

6. 发明申请

US20230060315A1 METHOD AND ELECTRONIC DEVICE FOR MANAGING NETWORK RESOURCES AMONG APPLICATION TRAFFIC 有权
公开(公告)号：US20230060315A1
公开(公告)日：2023-03-02
申请号：US17896607
申请日：2022-08-26
申请人： SAMSUNG ELECTRONICS CO., LTD.
发明人： Madhan Raj KANAGARATHINAM , Gunjan Kumar Choudhary , Sunghee Lee , Sujith Rengan Jayaseelan , Sri Vinod Palacharla , Mritunjay Gupta , Ratnakar Rao Venkata Rayavarapu , Prakash Rao , Ramanathan Palaniappan , Siva Sabareesh , Jayendra Reddy Kovvuri , Mohan Rao Goli
IPC分类号： H04L43/02 , H04L43/04 , H04L43/0894 , H04M7/00
摘要： A method and an electronic device for managing network resources among application traffic are provided. The method comprises identifying a real time application that is running on the electronic device and consuming network resources, determining whether the real time application belongs to a prioritized class, based on the real time application belonging to the prioritized class, determining a User Identifier (UID) of the real time application, and prioritizing the network resources for the real time application based on the UID.

7. 发明授权

US11523363B2 Electronic device and method for registering ownership 有权
公开(公告)号：US11523363B2
公开(公告)日：2022-12-06
申请号：US17258507
申请日：2019-07-11
申请人： Samsung Electronics Co., Ltd.
发明人： Sunghee Lee , Junhak Lim , Taehun Lim
IPC分类号： H04W60/00
摘要： An electronic device comprises: at least one communication circuit configured to provide communication with a first external electronic device or a second external electronic device; at least one processor operatively connected to the at least one communication circuit; and a memory including device registration request information and operatively connected to the at least one processor, wherein the memory may store instructions configured to cause, when executed, at least one processor to: transmit, to the first external electronic device, a device registration request including at least device registration request information for registering the electronic device to the second external electronic device when a first communication is connected with the first external electronic device through the at least one communication circuit; receive a response to the device registration request from the first external electronic device; receive, from the second external electronic device, device registration update information that is updated on the basis of the registration request of the electronic device, based on the response, when a second communication is connected with the second external electronic device through the at least one communication circuit; and store the received device registration update information in the memory.

8. 发明授权

US11368365B2 Methods and systems for determining ICN capability of a node/server 有权
公开(公告)号：US11368365B2
公开(公告)日：2022-06-21
申请号：US17079292
申请日：2020-10-23
申请人： Samsung Electronics Co., Ltd.
发明人： Madhan Raj Kanagarathinam , Shiva Souhith Gantha , Anshuman Nigam , Karthikeyan Arunachalam , Sunghee Lee , Sujith Rengan Jayaseelan
IPC分类号： G06F15/173 , H04L41/0866 , H04L61/4511 , H04L41/12
摘要： Methods and systems for determining ICN capability of a node/server. The ICN capability is determined based on DNS resource records or TCP options. The DNS resource records are DNS queries that are sent to a DNS server, for determining the ICN capability of the server. The DNS query includes a content to indicate the intent to determine the ICN capability. If the server is having ICN capability, a DNS response is received from the DNS server, which includes the content that is identical to the content in the DNS query. A server is selected, amongst multiple servers, for transferring ICN packets, based on locations and priorities of the multiple servers, indicated in DNS responses, and an order of issuance of DNS queries to the DNS server. TCP options in the header of TCP packets are used for determining ICN capability of the nodes/servers and parameters pertaining to the ICN capability.

9. 发明授权

US10249604B2 Semiconductor device and method of manufacturing the same 有权
公开(公告)号：US10249604B2
公开(公告)日：2019-04-02
申请号：US14656298
申请日：2015-03-12
申请人： Samsung Electronics Co., Ltd.
发明人： Kunmo Chu , Changyoul Moon , Sunghee Lee , Junsik Hwang
IPC分类号： H01L23/48 , H01L25/00 , H01L23/00 , H01L25/065 , H01L33/00
摘要： A semiconductor device includes a base substrate and a semiconductor chip on the base substrate, the semiconductor chip including a first layer structure and a second layer structure opposite to the first layer structure, at least one of the first and second layer structures including a semiconductor device portion, and a bonding structure between the first layer structure and the second layer structure, the bonding structure including a silver-tin (Ag—Sn) compound and a nickel-tin (Ni—Sn) compound.

10. 发明申请

US20150003607A1 SECURE CONNECTION METHOD AND APPARATUS OF ELECTRONIC DEVICE 审中-公开
标题翻译：电子设备的安全连接方法和装置
公开(公告)号：US20150003607A1
公开(公告)日：2015-01-01
申请号：US14316681
申请日：2014-06-26
申请人： Samsung Electronics Co., Ltd.
发明人： Jongmu Choi , Sunghee Lee , Changsoon Kim
IPC分类号： H04L9/08
摘要： A secure connection method and apparatus is provided for establishing secure connections among a plurality of electronic devices forming a group network. The data communication method includes generating, when creating or joining a group network, an encryption key using a password entered by a user. The data communication method also includes generating an identifier of the group network. The data communication method further includes generating a hash function predefined among the electronic devices of the group network. The data communication method includes performing data communication using the encryption key.
摘要翻译：提供了一种用于在形成组网的多个电子设备之间建立安全连接的安全连接方法和装置。数据通信方法包括在使用用户输入的密码时，在创建或加入组网络时生成加密密钥。数据通信方法还包括生成组网的标识符。数据通信方法还包括生成在组网的电子设备之间预定义的散列函数。数据通信方法包括使用加密密钥进行数据通信。

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