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    • 2. 发明授权
    • Differential threshold voltage non-volatile memory and related methods
    • 差分门限电压非易失性存储器及相关方法
    • US08462565B2
    • 2013-06-11
    • US13083427
    • 2011-04-08
    • Sameer M. VenugopalDavid R. AlleeLawrence T. Clark
    • Sameer M. VenugopalDavid R. AlleeLawrence T. Clark
    • G11C7/00
    • G11C16/0466G11C16/10G11C16/26Y10T29/49117
    • Embodiments and examples of differential threshold voltage non-volatile memories and related methods are described herein. In one example, a method for providing an integrated circuit can comprise providing a memory cell coupled to a first bitline and to a second bitline, and at least one of (a) providing a read assist mechanism configured to couple to the memory cell via the first and second bitlines, or (b) providing a memory reset mechanism configured to couple to the memory cell via the first and second bitlines. Providing the memory cell can comprise providing a first transistor comprising a first threshold voltage, providing a second transistor comprising a second threshold voltage, and cross-coupling the first and second transistors of the memory cell together. A difference between the first and second threshold voltages can correspond to a logic state of the memory cell. Other embodiments, examples, and related methods are also disclosed herein.
    • 本文描述了差分阈值电压非易失性存储器及相关方法的实施例和示例。 在一个示例中,用于提供集成电路的方法可以包括提供耦合到第一位线和第二位线的存储器单元,以及(a)提供读取辅助机构中的至少一个,所述读取辅助机构被配置为经由所述第一位线耦合到所述存储器单元 第一和第二位线,或(b)提供被配置为经由第一和第二位线耦合到存储器单元的存储器复位机构。 提供存储器单元可以包括提供包括第一阈值电压的第一晶体管,提供包括第二阈值电压的第二晶体管,以及将存储器单元的第一和第二晶体管交叉耦合在一起。 第一和第二阈值电压之间的差异可以对应于存储器单元的逻辑状态。 本文还公开了其它实施例,示例和相关方法。
    • 10. 发明授权
    • Sequential state elements in triple-mode redundant (TMR) state machines
    • 三模冗余(TMR)状态机中的顺序状态元素
    • US09038012B2
    • 2015-05-19
    • US14304155
    • 2014-06-13
    • Lawrence T. ClarkNathan D. HindmanDan Wheeler Patterson
    • Lawrence T. ClarkNathan D. HindmanDan Wheeler Patterson
    • G06F17/50H03K19/173H03K19/003
    • G06F17/5072G06F17/505H03K19/00315
    • The disclosure relates generally to triple-redundant sequential state (TRSS) machines formed as integrated circuits on a semiconductor substrate, such as CMOS, and computerized methods and systems of designing the triple-redundant sequential state machines. Of particular focus in this disclosure are sequential state elements (SSEs) used to sample and hold bit states. The sampling and holding of bits states are synchronized by a clock signal thereby allowing for pipelining in the TRSS machines. In particular, the clock signal may oscillate between a first clock state and a second clock state to synchronize the operation of the SSE according to the timing provided by the clock states. The SSEs has a self-correcting mechanism to protect against radiation induced soft errors. The SSE may be provided in a pipeline circuit of a TRSS machine to receive and store a bit state of bit signal generated by combinational circuits within the pipeline circuit.
    • 本公开一般涉及形成为诸如CMOS的半导体衬底上的集成电路的三冗余顺序状态(TRSS)机器,以及设计三重冗余顺序状态机的计算机化方法和系统。 本公开中特别关注的是用于采样和保持位状态的顺序状态元素(SSE)。 位状态的采样和保持由时钟信号同步,从而允许在TRSS机器中流水线化。 具体地,时钟信号可以在第一时钟状态和第二时钟状态之间振荡,以根据由时钟状态提供的定时使SSE的操作同步。 SSEs具有自我纠正机制,可防止辐射诱发的软错误。 SSE可以设置在TRSS机器的管线电路中,以接收和存储由管线电路内的组合电路产生的位信号的位状态。