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    • 6. 发明授权
    • On chip ZQ calibration resistor trimming
    • 片上ZQ校准电阻修剪
    • US09563213B2
    • 2017-02-07
    • US14966891
    • 2015-12-11
    • SanDisk Technologies Inc.
    • Sravanti AddepalliSridhar Yadala
    • H03K19/003H03K17/16G05F1/46G11C16/06H03K19/00
    • G05F1/463G11C5/147G11C7/04G11C16/06G11C2207/2254H03K19/0005
    • Techniques for trimming an on chip ZQ calibration resistor are disclosed. The on chip ZQ calibration resistor alleviates the need for an external ZQ calibration resistor. The on chip ZQ calibration resistor allows for a faster ZQ calibration. The trimming of on chip ZQ calibration resistor may be used to account for process variation. A correction mechanism may be used to account for temperature variation. Some of the circuitry that is used for ZQ calibration is also used for trimming the on-chip calibration resistor. This circuitry may include operational amplifiers, current mirrors, transistors, etc. The dual use of the circuitry can eliminate offset errors in an operational amplifier. The dual use can eliminate current mirror mismatch. Therefore, the trimming accuracy may be improved. The dual use also reduces the amount of circuitry that is needed for trimming the on chip ZQ calibration resistor. Thus, transistor count and chip size is reduced.
    • 公开了用于修整片上ZQ校准电阻器的技术。 片上ZQ校准电阻缓解了对外部ZQ校准电阻的需求。 片上ZQ校准电阻允许更快的ZQ校准。 片上ZQ校准电阻的修整可用于考虑工艺变化。 可以使用校正机制来解释温度变化。 用于ZQ校准的一些电路也用于微调片上校准电阻。 该电路可以包括运算放大器,电流镜,晶体管等。电路的双重用途可以消除运算放大器中的偏移误差。 双重用途可以消除电流镜的不匹配。 因此,可以提高修整精度。 双重用途还减少了修整片上ZQ校准电阻所需的电路数量。 因此,晶体管数量和芯片尺寸减小。
    • 7. 发明授权
    • Search for impedance calibration
    • 搜索阻抗校准
    • US09531382B1
    • 2016-12-27
    • US14842032
    • 2015-09-01
    • SanDisk Technologies Inc.
    • Hitoshi MiwaSravanti AddepalliSridhar Yadala
    • H03K19/003H03K19/00
    • H03K19/0005H03K19/003
    • A non-volatile storage system includes an impedance code calibration circuit. The device has a first variable impedance circuit and a second variable impedance circuit coupled to a calibration node. The device has a control circuit configured to access a previous impedance code for a previous impedance calibration and to divide the previous impedance code into a main impedance code and a remainder impedance code. The control circuit is configured to perform a search for a new impedance code starting with the main impedance code applied to the first variable impedance circuit while maintaining the remainder impedance code to the second variable impedance circuit. The control circuit is configured to add the final impedance code for the first variable impedance circuit with the remainder impedance code to produce a new impedance code for the impedance calibration.
    • 非易失性存储系统包括阻抗代码校准电路。 该装置具有耦合到校准节点的第一可变阻抗电路和第二可变阻抗电路。 该装置具有控制电路,该控制电路被配置为访问先前阻抗校准的先前阻抗代码,并将先前的阻抗代码分成主阻抗代码和余数阻抗代码。 控制电路被配置为执行从施加到第一可变阻抗电路的主阻抗代码开始的新阻抗代码,同时将剩余阻抗代码保持到第二可变阻抗电路。 控制电路被配置为将第一可变阻抗电路的最终阻抗代码与剩余阻抗代码相加以产生用于阻抗校准的新阻抗代码。
    • 8. 发明申请
    • On Chip ZQ Calibration Resistor Trimming
    • 片上ZQ校准电阻修剪
    • US20160182044A1
    • 2016-06-23
    • US14966891
    • 2015-12-11
    • SanDisk Technologies Inc.
    • Sravanti AddepalliSridhar Yadala
    • H03K19/00G11C16/06
    • G05F1/463G11C5/147G11C7/04G11C16/06G11C2207/2254H03K19/0005
    • Techniques for trimming an on chip ZQ calibration resistor are disclosed. The on chip ZQ calibration resistor alleviates the need for an external ZQ calibration resistor. The on chip ZQ calibration resistor allows for a faster ZQ calibration. The trimming of on chip ZQ calibration resistor may be used to account for process variation. A correction mechanism may be used to account for temperature variation. Some of the circuitry that is used for ZQ calibration is also used for trimming the on-chip calibration resistor. This circuitry may include operational amplifiers, current mirrors, transistors, etc. The dual use of the circuitry can eliminate offset errors in an operational amplifier. The dual use can eliminate current mirror mismatch. Therefore, the trimming accuracy may be improved. The dual use also reduces the amount of circuitry that is needed for trimming the on chip ZQ calibration resistor. Thus, transistor count and chip size is reduced.
    • 公开了用于修整片上ZQ校准电阻器的技术。 片上ZQ校准电阻缓解了对外部ZQ校准电阻的需求。 片上ZQ校准电阻允许更快的ZQ校准。 片上ZQ校准电阻的修整可用于考虑工艺变化。 可以使用校正机制来解释温度变化。 用于ZQ校准的一些电路也用于微调片上校准电阻。 该电路可以包括运算放大器,电流镜,晶体管等。电路的双重用途可以消除运算放大器中的偏移误差。 双重用途可以消除电流镜的不匹配。 因此,可以提高修整精度。 双重用途还减少了修整片上ZQ校准电阻所需的电路数量。 因此,晶体管数量和芯片尺寸减小。
    • 10. 发明申请
    • CLOCK FREEZING TECHNIQUE FOR CHARGE PUMPS
    • 充电泵的时钟冷冻技术
    • US20160380532A1
    • 2016-12-29
    • US14752007
    • 2015-06-26
    • SANDISK TECHNOLOGIES INC.
    • Gooty Sukumar ReddySridhar YadalaSaurabh Verma
    • H02M3/07G11C16/30
    • H02M3/07G11C5/145G11C7/22G11C11/5621G11C16/30G11C16/32
    • Methods and systems for generating voltages greater than a supply voltage are described. A charge pump system may generate a boosted output voltage greater than the supply voltage using one or more charge pump stages that are arranged in series between the supply voltage and the boosted output voltage. The charge pump system may include clock freezing circuitry that eliminates glitches in clock signals used for driving the one or more charge pump stages. In one example, the clock freezing circuitry may freeze a clock signal that drives a charge pump stage (i.e., prevent the clock signal from switching) when a feedback flag of the charge pump system is in a disable state (e.g., is low). When the feedback flag is in an enable state (e.g., is high), then the clock signal may toggle between a high state and a low state.
    • 描述用于产生大于电源电压的电压的方法和系统。 电荷泵系统可以使用在电源电压和升压的输出电压之间串联布置的一个或多个电荷泵级来产生大于电源电压的升压输出电压。 电荷泵系统可以包括时钟冻结电路,其消除用于驱动一个或多个电荷泵级的时钟信号的毛刺。 在一个示例中,当电荷泵系统的反馈标志处于禁用状态(例如,低)时,时钟冻结电路可以冻结驱动电荷泵级的时钟信号(即,防止时钟信号切换)。 当反馈标志处于使能状态(例如,高电平)时,时钟信号可以在高状态和低电平状态之间切换。