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    • 2. 发明授权
    • Method for production of solid-state imaging element, solid-state imaging element, and imaging apparatus
    • 固体摄像元件,固体摄像元件及成像装置的制造方法
    • US08697477B2
    • 2014-04-15
    • US13116539
    • 2011-05-26
    • Sanghoon HaHiroaki Ishiwata
    • Sanghoon HaHiroaki Ishiwata
    • H01L21/00
    • H01L27/14806H01L27/14616H01L27/14643H01L27/14689H01L31/03529H01L31/103H01L31/18Y02E10/50
    • Disclosed herein is a method for producing a solid-state imaging element which has pixels, each including a sensor section that performs photoelectric conversion and a charge transfer section that transfers charges generated by the sensor section. The method includes: forming an impurity region of the first conduction type and a second impurity region of the second conduction type on the impurity region of the first conduction type by ion implantation by using the same mask; forming on the surface of the semiconductor substrate a transfer gate constituting the charge transfer section which extends over the second impurity region of the second conduction type; forming a charge accumulating region of the first conduction type constituting the sensor section by ion implantation; and forming a first impurity region of the second conduction type, which has a higher impurity concentration than the second impurity region of the second conduction type, by ion implantation.
    • 本发明公开了一种具有像素的固体摄像元件的制造方法,每个像素包括执行光电转换的传感器部分和传送由传感器部分产生的电荷的电荷转移部分。 该方法包括:通过使用相同的掩模通过离子注入在第一导电类型的杂质区上形成第一导电类型的杂质区和第二导电类型的第二杂质区; 在所述半导体衬底的表面上形成构成所述电荷转移部的传输门,所述电荷转移部在所述第二导电类型的所述第二杂质区上延伸; 通过离子注入形成构成传感器部分的第一导电类型的电荷累积区域; 并且通过离子注入形成具有比第二导电类型的第二杂质区更高的杂质浓度的第二导电类型的第一杂质区。
    • 6. 发明申请
    • METHOD FOR PRODUCTION OF SOLID-STATE IMAGING ELEMENT, SOLID-STATE IMAGING ELEMENT, AND IMAGING APPARATUS
    • 固态成像元件,固态成像元件和成像装置的制造方法
    • US20110298078A1
    • 2011-12-08
    • US13116539
    • 2011-05-26
    • Sanghoon HaHiroaki Ishiwata
    • Sanghoon HaHiroaki Ishiwata
    • H01L31/02
    • H01L27/14806H01L27/14616H01L27/14643H01L27/14689H01L31/03529H01L31/103H01L31/18Y02E10/50
    • Disclosed herein is a method for producing a solid-state imaging element which has pixels, each including a sensor section that performs photoelectric conversion and a charge transfer section that transfers charges generated by the sensor section. The method includes: forming an impurity region of the first conduction type and a second impurity region of the second conduction type on the impurity region of the first conduction type by ion implantation by using the same mask; forming on the surface of the semiconductor substrate a transfer gate constituting the charge transfer section which extends over the second impurity region of the second conduction type; forming a charge accumulating region of the first conduction type constituting the sensor section by ion implantation; and forming a first impurity region of the second conduction type, which has a higher impurity concentration than the second impurity region of the second conduction type, by ion implantation.
    • 本发明公开了一种具有像素的固体摄像元件的制造方法,每个像素包括执行光电转换的传感器部分和传送由传感器部分产生的电荷的电荷转移部分。 该方法包括:通过使用相同的掩模通过离子注入在第一导电类型的杂质区上形成第一导电类型的杂质区和第二导电类型的第二杂质区; 在所述半导体衬底的表面上形成构成所述电荷转移部的传输门,所述电荷转移部在所述第二导电类型的所述第二杂质区上延伸; 通过离子注入形成构成传感器部分的第一导电类型的电荷累积区域; 以及通过离子注入形成具有比第二导电类型的第二杂质区更高的杂质浓度的第二导电类型的第一杂质区。
    • 10. 发明授权
    • Microcomputer including an upper and lower clip circuit
    • 微电脑包括上下夹电路
    • US06718357B2
    • 2004-04-06
    • US09755107
    • 2001-01-08
    • Sanghoon Ha
    • Sanghoon Ha
    • G06F738
    • H03M1/1235
    • A microcomputer is provided with an upper clip circuit for comparing digital values output from an analog-to-digital (AD) converting circuit 1 with a high level reference value A, and replacing a digital value larger than the reference value A with the reference value A; and a lower clip circuit for comparing digital values output from the upper clip circuit with a reference value B, and replacing a digital value smaller than the reference value B with the reference value B. Irregular signal waveforms can be removed by replacing the reference values A, B, thereby enhancing the reliability of operation results.
    • 微型计算机设置有用于将从模数(AD)转换电路1输出的数字值与高电平参考值A进行比较的上限幅电路,并用参考值替换大于参考值A的数字值 一个; 以及用于将从上限电路输出的数字值与参考值B进行比较的下限幅电路,并且用参考值B替换小于参考值B的数字值。可以通过替换参考值A来消除不规则信号波形 ,B,从而提高运行结果的可靠性。