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1. 发明授权

US11169100B2 Portable, hand held aluminum alloy XRF analyzer and method 有权
公开(公告)号：US11169100B2
公开(公告)日：2021-11-09
申请号：US15957448
申请日：2018-04-19
申请人： SciAps, Inc.
发明人： Donald W. Sackett
IPC分类号： G01N23/223
摘要： A portable hand held XRF analyzer and method wherein an X-ray source directs X-rays to a sample and a detector detects photons emitted by the sample. A controller subsystem controlling the X-ray source an I/O section and is responsive to the detector and I/O section. The controller subsystem is configured to present to the user, via the I/O section, a choice to invoke an aluminum alloy algorithm test. An aluminum alloy algorithm test is invoked if the operator chooses the aluminum alloy algorithm test. Then, the X-ray source is operated at a predetermined voltage level and predetermined current level and the detector output is analyzed to determine elements and their concentrations present in the sample. Preferably, if the analysis fails to detect one or more common aluminum alloy elements present in the sample and/or fails to specify a particular aluminum alloy, then the X-ray source is automatically operated at a higher voltage and lower current level to repeat the analysis step.

2. 发明申请

US20190302040A1 PORTABLE, HAND HELD ALUMINUM ALLOY XRF ANALYZER AND METHOD 审中-公开
公开(公告)号：US20190302040A1
公开(公告)日：2019-10-03
申请号：US15957448
申请日：2018-04-19
申请人： SciAps, Inc.
发明人： Donald W. Sackett
IPC分类号： G01N23/223
摘要： A portable hand held XRF analyzer and method wherein an X-ray source directs X-rays to a sample and a detector detects photons emitted by the sample. A controller subsystem controlling the X-ray source an I/O section and is responsive to the detector and I/O section. The controller subsystem is configured to present to the user, via the I/O section, a choice to invoke an aluminum alloy algorithm test. An aluminum alloy algorithm test is invoked if the operator chooses the aluminum alloy algorithm test. Then, the X-ray source is operated at a predetermined voltage level and predetermined current level and the detector output is analyzed to determine elements and their concentrations present in the sample. Preferably, if the analysis fails to detect one or more common aluminum alloy elements present in the sample and/or fails to specify a particular aluminum alloy, then the X-ray source is automatically operated at a higher voltage and lower current level to repeat the analysis step.

3. 发明授权

US10012603B2 Combined handheld XRF and OES systems and methods 有权
公开(公告)号：US10012603B2
公开(公告)日：2018-07-03
申请号：US14746130
申请日：2015-06-22
申请人： SciAps, Inc.
发明人： Donald W. Sackett
IPC分类号： G01N23/223 , G01N23/22 , G01N21/71 , G01N23/2208
CPC分类号： G01N23/223 , G01N21/718 , G01N23/2208 , G01N2223/045 , G01N2223/076 , G01N2223/402
摘要： A combined handheld XRF and LIBS system and method includes an XRF subsystem with an X-ray source operated at a fixed medium voltage and configured to deliver X-rays to a sample without passing through a mechanized filter and a detector for detecting fluoresced radiation from the sample. The LIBS subsystem includes a low power laser source for delivering a laser beam to the sample and a narrow wavelength range spectrometer subsystem for analyzing optical emissions from the sample. The X-ray source is operated at the fixed medium voltage to analyze the sample for a first group of elements, namely, transition and/or heavy metals. The low power laser source is operated to analyze the sample for a second group of elements the XRF subsystem cannot reliably detect, namely, C, Be, Li, Na, and/or B, and to analyze the sample for a third group of elements the XRF subsystem cannot reliably detect at the fixed voltage, namely, Al, Si, and/or Mg, or where the XRF subsystem would require higher tube voltage, namely Cd, Ag, In, Sn, Sb, and/or Ba; and/or rare earth elements.

4. 发明申请

US20160252397A1 LIBS ANALYZER SAMPLE PRESENCE DETECTION SYSTEM AND METHOD 有权
标题翻译： LIBS分析仪样品存在检测系统和方法
公开(公告)号：US20160252397A1
公开(公告)日：2016-09-01
申请号：US14632419
申请日：2015-02-26
申请人： SciAps, Inc.
发明人： David R. Day , Donald W. Sackett
IPC分类号： G01J3/443 , G01J3/10
CPC分类号： G01J3/443 , G01J3/027 , G01J3/10
摘要： A LIBS analyzer, preferably handheld, includes a laser configured to produce a plasma on a sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce a spectrum. A controller subsystem is configured to control energizing the laser and to analyze the resulting spectrum from each laser pulse to determine if the laser is aimed at a sample. If the analyzed spectrum reveals the laser is not aimed at the sample, the controller subsystem halts the laser puke sequence.
摘要翻译： LIBS分析仪，优选是手持式的，包括配置成在样品上产生等离子体的激光器和响应于从等离子体发射的辐射而被配置成产生光谱的光谱仪。控制器子系统被配置为控制对激光器通电并且从每个激光脉冲分析所得到的光谱以确定激光器是否瞄准样品。如果分析的光谱显示激光器不针对样品，则控制器子系统停止激光脉冲序列。

5. 发明申请

US20150377805A1 COMBINED HANDHELD XRF AND OES SYSTEMS AND METHODS 有权
标题翻译：组合手持XRF和OES系统和方法
公开(公告)号：US20150377805A1
公开(公告)日：2015-12-31
申请号：US14746130
申请日：2015-06-22
申请人： SciAps, Inc.
发明人： Donald W. Sackett
IPC分类号： G01N23/22 , G01N23/223 , G01N21/71
CPC分类号： G01N23/223 , G01N21/718 , G01N23/2208 , G01N2223/045 , G01N2223/076 , G01N2223/402
摘要： A combined handheld XRF and LIBS system and method includes an XRF subsystem with an X-ray source operated at a fixed medium voltage and configured to deliver X-rays to a sample without passing through a mechanized filter and a detector for detecting fluoresced radiation from the sample. The LIBS subsystem includes a low power laser source for delivering a laser beam to the sample and a narrow wavelength range spectrometer subsystem for analyzing optical emissions from the sample. The X-ray source is operated at the fixed medium voltage to analyze the sample for a first group of elements, namely, transition and/or heavy metals. The low power laser source is operated to analyze the sample for a second group of elements the XRF subsystem cannot reliably detect, namely, C, Be, Li, Na, and/or B, and to analyze the sample for a third group of elements the XRF subsystem cannot reliably detect at the fixed voltage, namely, Al, Si, and/or Mg, or where the XRF subsystem would require higher tube voltage, namely Cd, Ag, In, Sn, Sb, and/or Ba; and/or rare earth elements.
摘要翻译：组合的手持式XRF和LIBS系统和方法包括具有以固定中等电压操作的X射线源的XRF子系统，并且被配置为在不经过机械化过滤器的情况下将X射线传送到样品，并且检测器用于检测来自样品。 LIBS子系统包括用于向样品传送激光束的低功率激光源和用于分析样品的光发射的窄波长范围光谱仪子系统。 X射线源以固定的中压工作，以分析第一组元素即转变和/或重金属的样品。操作低功率激光源来分析XRF子系统不能可靠地检测到的第二组元素，即C，Be，Li，Na和/或B的样品，并分析第三组元素的样品 XRF子系统不能在固定电压即Al，Si和/或Mg下进行可靠的检测，或者XRF子系统需要较高的管电压即Cd，Ag，In，Sn，Sb和/或Ba; 和/或稀土元素。

6. 发明申请

US20170219429A1 LiBS Analyzer Sample Presence Detection System and Method 有权
公开(公告)号：US20170219429A1
公开(公告)日：2017-08-03
申请号：US15484767
申请日：2017-04-11
申请人： SciAps, Inc.
发明人： David R. Day , Donald W. Sackett
IPC分类号： G01J3/02 , G01J3/443 , G01J3/10 , G01N21/71
CPC分类号： G01J3/443 , G01J3/027 , G01J3/10 , G01N21/718 , G01N2201/06113 , G01N2201/069
摘要： A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.

7. 发明授权

US09651424B2 LIBS analyzer sample presence detection system and method 有权
公开(公告)号：US09651424B2
公开(公告)日：2017-05-16
申请号：US14800888
申请日：2015-07-16
申请人： SciAps, Inc.
发明人： David R. Day , Donald W. Sackett
IPC分类号： G01J3/30 , G01J3/443 , G01J3/10 , G01J3/02
CPC分类号： G01J3/443 , G01J3/027 , G01J3/10 , G01N21/718 , G01N2201/06113 , G01N2201/069
摘要： A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.

8. 发明授权

US09970815B2 LiBS analyzer sample presence detection system and method 有权
公开(公告)号：US09970815B2
公开(公告)日：2018-05-15
申请号：US15484767
申请日：2017-04-11
申请人： SciAps, Inc.
发明人： David R. Day , Donald W. Sackett
IPC分类号： G01J3/30 , G01J3/02 , G01N21/71 , G01J3/443 , G01J3/10
CPC分类号： G01J3/443 , G01J3/027 , G01J3/10 , G01N21/718 , G01N2201/06113 , G01N2201/069
摘要： A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.

9. 发明授权

US09664565B2 LIBS analyzer sample presence detection system and method 有权
公开(公告)号：US09664565B2
公开(公告)日：2017-05-30
申请号：US14632419
申请日：2015-02-26
申请人： SciAps, Inc.
发明人： David R. Day , Donald W. Sackett
IPC分类号： G01J3/30 , G01J3/443 , G01J3/10 , G01J3/02
CPC分类号： G01J3/443 , G01J3/027 , G01J3/10
摘要： A LIBS analyzer, preferably handheld, includes a laser configured to produce a plasma on a sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce a spectrum. A controller subsystem is configured to control energizing the laser and to analyze the resulting spectrum from each laser pulse to determine if the laser is aimed at a sample. If the analyzed spectrum reveals the laser is not aimed at the sample, the controller subsystem halts the laser puke sequence.

10. 发明申请

US20160252398A1 LIBS ANALYZER SAMPLE PRESENCE DETECTION SYSTEM AND METHOD 有权
标题翻译： LIBS分析仪样品存在检测系统和方法
公开(公告)号：US20160252398A1
公开(公告)日：2016-09-01
申请号：US14800888
申请日：2015-07-16
申请人： SciAps, Inc.
发明人： David R. Day , Donald W. Sackett
IPC分类号： G01J3/443 , G01J3/10
CPC分类号： G01J3/443 , G01J3/027 , G01J3/10 , G01N21/718 , G01N2201/06113 , G01N2201/069
摘要： A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.
摘要翻译： LIBS分析仪和方法包括配置成在样品上的焦点处的样品上产生等离子体的激光器，以及响应于从等离子体发射的辐射并被配置为产生输出光谱的光谱仪。定位探测器以检测由激光产生的低强度预发射辐射并从焦点反射出样品。将低强度预燃射辐射的强度与预定的最小值进行比较，并且如果低强度预燃射辐射的强度小于预定的最小值，则停止激光泵的顺序。

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