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    • 4. 发明授权
    • Ultraviolet light sensor circuit
    • 紫外光传感器电路
    • US09590110B2
    • 2017-03-07
    • US14476775
    • 2014-09-04
    • SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
    • Takeshi Osada
    • H01L29/786H03F1/30H01L27/12
    • H01L29/7869H01L27/1225H01L27/1255H03F1/304
    • A sensor circuit with high sensitivity to ultraviolet light. Ultraviolet light is detected using a transistor containing an oxide semiconductor. When the transistor is irradiated with ultraviolet light or light including ultraviolet light, the drain current of the transistor depends on the intensity of the ultraviolet light. Data on the intensity of ultraviolet light is obtained by measuring the drain current of the transistor. Since the band gap of an oxide semiconductor is wider than that of silicon, the sensitivity to light with a wavelength in the ultraviolet region can be increased. Furthermore, an increase in dark current caused by temperature rise in the sensor circuit can be suppressed, resulting in a wider allowable ambient temperature range of the sensor circuit.
    • 对紫外线具有高灵敏度的传感器电路。 使用含有氧化物半导体的晶体管检测紫外线。 当用紫外线或包括紫外线的光照射晶体管时,晶体管的漏极电流取决于紫外光的强度。 通过测量晶体管的漏极电流来获得关于紫外光强度的数据。 由于氧化物半导体的带隙比硅更宽,所以可以提高对紫外线区域的波长的光的敏感度。 此外,可以抑制由传感器电路中的温度升高引起的暗电流的增加,导致传感器电路的允许环境温度范围更宽。