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    • 2. 发明申请
    • NITRIDE SEMICONDUCTOR LASER ELEMENT AND METHOD FOR MANUFACTURING SAME
    • 氮化物半导体激光元件及其制造方法
    • US20080056322A1
    • 2008-03-06
    • US11849734
    • 2007-09-04
    • Shingo MasuiTomonori Morizumi
    • Shingo MasuiTomonori Morizumi
    • H01S5/323H01L33/00
    • H01S5/34333B82Y20/00H01S5/0202H01S5/22H01S5/3203H01S2304/12
    • A nitride semiconductor laser element comprises a nitride semiconductor substrate and a nitride semiconductor layer laminated thereon, wherein the nitride semiconductor substrate has a high dislocation density region and a low dislocation density region containing lower dislocation than that of the high dislocation density region, and has at least one recess formed in at least the high dislocation density region, the nitride semiconductor layer has a first nitride semiconductor layer in which the grown film thickness in the lateral direction from the side faces of the recess in the substrate is greater than the grown film thickness in the heightwise direction from a region other than the recess, and a second nitride semiconductor layer that is disposed on the first nitride semiconductor layer and contains indium, and the first nitride semiconductor layer and second nitride semiconductor layer have recess over the recess in the nitride semiconductor substrate.
    • 氮化物半导体激光元件包括层叠在其上的氮化物半导体衬底和氮化物半导体层,其中氮化物半导体衬底具有高位错密度区域和低位错密度低位错位置,而位错密度区域位于高位错密度区域 至少一个凹部形成在至少高位错密度区域中,氮化物半导体层具有第一氮化物半导体层,其中从衬底的凹部的侧面沿横向生长的膜厚度大于生长的膜厚度 在除了凹部之外的区域的高度方向上,以及第二氮化物半导体层,其设置在第一氮化物半导体层上并且包含铟,并且第一氮化物半导体层和第二氮化物半导体层在氮化物的凹部上具有凹陷 半导体衬底。
    • 6. 发明授权
    • Nitride semiconductor laser element
    • 氮化物半导体激光元件
    • US08102891B2
    • 2012-01-24
    • US12716962
    • 2010-03-03
    • Tomonori MorizumiAtsuo MichiueHiroaki Takahashi
    • Tomonori MorizumiAtsuo MichiueHiroaki Takahashi
    • H01S5/00
    • H01S5/0281
    • A nitride semiconductor laser element includes a nitride semiconductor layer of a first conduction type, an active layer, and a nitride semiconductor layer of a second conduction type that is different from the first conduction type are laminated in that order, a cavity end face formed by the nitride semiconductor layers, and a protective film formed on the cavity end face. The nitride semiconductor layers of the first and second conduction types have layers containing Al, and the active layer has layer containing In. The protective film has a region in which an axial orientation of crystals is the same as that of the cavity end face on the nitride semiconductor layers of the first and second conduction types, and has another region in which an axial orientation of crystals is different from that of the cavity end face on the active layer.
    • 氮化物半导体激光元件包括依次层叠具有第一导电类型,有源层和与第一导电类型不同的第二导电类型的氮化物半导体层的氮化物半导体层,空腔端面由 氮化物半导体层和形成在腔体端面上的保护膜。 第一和第二导电类型的氮化物半导体层具有包含Al的层,并且活性层具有包含In的层。 保护膜具有其中晶体的轴向取向与第一和第二导电类型的氮化物半导体层上的空腔端面相同的区域,并且具有另一区域,其中晶体的轴向取向不同于 活性层上的腔端面。
    • 7. 发明授权
    • Nitride semiconductor laser element
    • 氮化物半导体激光元件
    • US07804872B2
    • 2010-09-28
    • US12132880
    • 2008-06-04
    • Tomonori Morizumi
    • Tomonori Morizumi
    • H01S5/00
    • H01S5/34333B82Y20/00H01S5/028H01S5/0282H01S5/166H01S5/22
    • A nitride semiconductor laser element comprises; a nitride semiconductor layer that includes a first nitride semiconductor layer, an active layer, and a second nitride semiconductor layer, and that has a cavity with end faces, and a first protective film that is in contact with at least one end face of the cavity, wherein the first protective film has a film structure in which bright and dark parts comprising a region in contact with the active layer and a region in contact with the first and second nitride semiconductor layers are observed under scanning transmission electron microscopy, or the first protective film has a film structure in which the crystallinity at a portion adjacent to the active layer is different from that at portions adjacent to the first and second nitride semiconductor layers.
    • 氮化物半导体激光元件包括: 包括第一氮化物半导体层,有源层和第二氮化物半导体层的氮化物半导体层,并且具有端面的空腔,以及与所述空腔的至少一个端面接触的第一保护膜 其中,所述第一保护膜具有膜结构,其中在扫描透射电子显微镜下观察到包括与所述有源层接触的区域的明暗部分和与所述第一和第二氮化物半导体层接触的区域,或所述第一保护膜 膜具有膜结构,其中与有源层相邻的部分的结晶度不同于与第一和第二氮化物半导体层相邻的部分处的结晶度。
    • 9. 发明授权
    • Nitride semiconductor laser element
    • 氮化物半导体激光元件
    • US07668218B2
    • 2010-02-23
    • US12033378
    • 2008-02-19
    • Atsuo MichiueTomonori MorizumiHiroaki Takahashi
    • Atsuo MichiueTomonori MorizumiHiroaki Takahashi
    • H01S5/00
    • H01S5/22B82Y20/00H01S5/0021H01S5/0282H01S5/0283H01S5/1082H01S5/2201H01S5/34333H01S2301/176H01S2304/04
    • The present invention provides a nitride semiconductor laser element, comprising: a nitride semiconductor structure having a first nitride semiconductor layer, a second nitride semiconductor layer, and an active layer provided between the first and second nitride semiconductor layers; a cavity end face provided to the nitride semiconductor structure; and a protective film having a hexagonal crystal structure, and having a first region provided on a first crystal surface of the nitride semiconductor structure in the cavity end face and a second region provided on a second crystal surface in the surface of at least one of the first and second nitride semiconductor layer, the first and second regions of the protective film are oriented in the same axial direction as that of the respective first and second crystal surfaces.
    • 本发明提供了一种氮化物半导体激光元件,包括:具有第一氮化物半导体层,第二氮化物半导体层和设置在第一和第二氮化物半导体层之间的有源层的氮化物半导体结构; 设置到所述氮化物半导体结构的腔端面; 以及具有六方晶系结构的保护膜,并且具有设置在所述空腔端面中的所述氮化物半导体结构的第一晶面上的第一区域和设置在所述第二晶体表面中的至少一个 第一和第二氮化物半导体层,保护膜的第一和第二区域被定向在与第一和第二晶体表面相同的轴向方向上。