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    • 2. 发明授权
    • SRAM cell having a p-well bias
    • 具有p阱偏置的SRAM单元
    • US08891287B2
    • 2014-11-18
    • US13196010
    • 2011-08-02
    • Anand SeshadriTheodore W. Houston
    • Anand SeshadriTheodore W. Houston
    • G11C11/40G11C11/412G11C11/419
    • G11C11/412G11C11/419
    • A process of performing an SRAM single sided write operation including applying a positive bias increment to an isolated p-well containing a passgate in an addressed SRAM cell. A process of performing an SRAM single sided read operation including applying a negative bias increment to an isolated p-well containing a driver in an addressed SRAM cell. A process of performing an SRAM double sided write operation including applying a positive bias increment to an isolated p-well containing a passgate connected to a low data line in an addressed SRAM cell. A process of performing an SRAM double sided read operation including applying a negative bias increment to an isolated p-well containing a bit driver and applying a negative bias increment to an isolated p-well containing a bit-bar driver in an addressed SRAM cell.
    • 一种执行SRAM单面写入操作的过程,包括在寻址的SRAM单元中对包含通孔的隔离p阱施加正偏置增量。 执行SRAM单面读取操作的过程包括对包含寻址的SRAM单元中的驱动器的隔离p阱施加负偏置增量。 执行SRAM双面写入操作的过程包括向包含连接到寻址的SRAM单元中的低数据线的通路的隔离p阱施加正偏置增量。 执行SRAM双面读取操作的过程包括向包含比特驱动器的隔离p阱施加负偏置增量,并且在寻址的SRAM单元中向包含位线驱动器的隔离p阱施加负偏置增量。
    • 10. 发明申请
    • SRAM Cell for Single Sided Write
    • 用于单面写入的SRAM单元
    • US20120127783A1
    • 2012-05-24
    • US13363051
    • 2012-01-31
    • Theodore W. HoustonAnand Seshadri
    • Theodore W. HoustonAnand Seshadri
    • G11C11/40
    • G11C11/412
    • A first integrated circuit containing a single sided write SRAM cell array, each SRAM cell having a bit passgate and an auxiliary bit-bar driver transistor. A process of operating the first integrated circuit including a single sided read operation in which source nodes of the auxiliary drivers in both addressed cells and half-addressed cells are floated. A second integrated circuit containing an SRAM cell array, in which each SRAM cell includes a bit-side write passgate, a bit-bar-side read passgate and a bit-bar auxiliary driver transistor. A process of operating the second integrated circuit including a single sided read operation in which source nodes of the auxiliary drivers in both addressed cells and half-addressed cells are biased to a low bias voltage.
    • 包含单面写入SRAM单元阵列的第一集成电路,每个SRAM单元具有位通道和辅助位棒驱动晶体管。 包括单向读取操作的第一集成电路的处理,其中寻址单元和半寻址单元中的辅助驱动器的源节点浮动。 包含SRAM单元阵列的第二集成电路,其中每个SRAM单元包括位侧写入通道,位线侧读取通道和位线辅助驱动器晶体管。 包括单向读取操作的第二集成电路的处理,其中寻址单元和半寻址单元中的辅助驱动器的源节点被偏置到低偏置电压。