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1. 发明授权

US10955683B2 Imaging incident angle tracker 有权
公开(公告)号：US10955683B2
公开(公告)日：2021-03-23
申请号：US16186064
申请日：2018-11-09
申请人： Thorlabs, Inc.
发明人： Jeffrey S. Brooker , Hongzhou Ma , Shane Patton , Eric Lieser , Brett D'Alessio
IPC分类号： G02B27/14 , G02B27/09 , G02B26/08 , G02B21/26 , G02B21/24 , G02B21/06
摘要： An imaging incident angle tracking device, including: a light source; a first and second beam splitters or dichroic mirrors; a position sensitive detector; wherein the first and second beam splitters or dichroic mirrors are configured to direct light from the light source to a window surface through an objective lens; the first and second beam splitters or dichroic mirrors is further configured to direct the light reflected from the window surface and through the objective lens into the position sensitive detector. A positioning system, including: a baseplate; a platform; a plurality of strut assemblies connecting the baseplate and the platform; wherein each of the strut assembly includes: a linear actuator; a first flexure assembly and a second flexure assembly at the first and second ends of the strut assembly; the first and second flexure assemblies are rigid along and flexibly bendable orthogonal to the length of the strut assembly.

2. 发明申请

US20200249457A1 HIGH DYNAMIC RANGE IMAGING 审中-公开
公开(公告)号：US20200249457A1
公开(公告)日：2020-08-06
申请号：US16778095
申请日：2020-01-31
申请人： Thorlabs, Inc.
发明人： Jeffrey S. Brooker
IPC分类号： G02B21/36 , G02B27/10 , G02B21/16 , G01N21/64 , G02B5/30 , G02B26/10
摘要： A system for generating a series of reducing intensity laser pulses from an ultrafast pulsed laser source. The reducing intensity series of pulses is equally temporally spaced between pulses from the laser source. The repeating series of reducing intensity laser pulses is fed to a microscope for imaging. The microscope is capable of detecting the fluorescence from a sample generated by each pulse in the series. The data is processed using knowledge of the pulse intensity, location on the test sample, and amount of fluorescence measured to create an increased dynamic range of the image relative to what can be obtained in a normal two-photon imaging system.

3. 发明申请

US20190146230A1 IMAGING INCIDENT ANGLE TRACKER 审中-公开
公开(公告)号：US20190146230A1
公开(公告)日：2019-05-16
申请号：US16186064
申请日：2018-11-09
申请人： Thorlabs, Inc.
发明人： Jeffrey S. Brooker , Hongzhou Ma , Shane Patton , Eric Lieser , Brett D'Alessio
IPC分类号： G02B27/14 , G02B26/08 , G02B27/09
摘要： An imaging incident angle tracking device, including: a light source; a first and second beam splitters or dichroic mirrors; a position sensitive detector; wherein the first and second beam splitters or dichroic mirrors are configured to direct light from the light source to a window surface through an objective lens; the first and second beam splitters or dichroic mirrors is further configured to direct the light reflected from the window surface and through the objective lens into the position sensitive detector. A positioning system, including: a baseplate; a platform; a plurality of strut assemblies connecting the baseplate and the platform; wherein each of the strut assembly includes: a linear actuator; a first flexure assembly and a second flexure assembly at the first and second ends of the strut assembly; the first and second flexure assemblies are rigid along and flexibly bendable orthogonal to the length of the strut assembly.

4. 发明授权

US11499597B2 Piezoelectric braking device 有权
公开(公告)号：US11499597B2
公开(公告)日：2022-11-15
申请号：US16776888
申请日：2020-01-30
申请人： Thorlabs, Inc.
发明人： Jeffrey S. Brooker , Shane Patton , Munkhtsooj Saikhanchimeg
IPC分类号： F16D63/00 , G02B21/26 , H02N2/04 , F16D121/28
摘要： A braking device including: a piezoelectric element; and a braking portion. The braking portion is configured to be fixed to a member when the piezoelectric element is in a first state, and to be slidable along the member when the piezoelectric element is in a second state. The piezoelectric element changes from one state to another state when a voltage is applied.

5. 发明申请

US20200249464A1 OPTICAL DEVICE FOR LIGHT DELIVERY 审中-公开
公开(公告)号：US20200249464A1
公开(公告)日：2020-08-06
申请号：US16777313
申请日：2020-01-30
申请人： Thorlabs, Inc.
发明人： Jeffrey S. Brooker , Hongzhou MA
IPC分类号： G02B26/08 , G02B27/00 , G02B21/18
摘要： An optical device includes: first and second optical paths; a light reflective surface; and a linkage system. The first optical path is defined along a first optical axis. The second optical path is defined along a second optical axis. The light reflective surface is defined between the first and second optical paths. The first and second axes define first and second tilt angles from a normal line of the reflective surface, respectively. The linkage system connects the first and second optical paths with the light reflective surface such that the first tilt angle remains the same as the second tilt angle during movement of the first optical path relative to the second optical path.

6. 发明授权

US10615564B2 Sinusoidal phase modulation of mode-locked lasers 有权
公开(公告)号：US10615564B2
公开(公告)日：2020-04-07
申请号：US15986518
申请日：2018-05-22
申请人： Thorlabs, Inc.
发明人： Jeffrey S. Brooker , William Radtke , Hongzhou Ma , Eric Lieser
IPC分类号： H01S3/107 , H01S3/10 , H03K4/92 , G02F1/03 , H01S3/11
CPC分类号： H01S3/107 , H01S3/10053 , H03K4/92 , G02F1/03 , H01S3/1109
摘要： A mode-locked laser comprising circuitry configured to drive an electro-optic modulator (EOM) in the mode-locked laser with a drive waveform, the drive waveform being a phase-coherent sinusoidal waveform at a frequency equal to a repetition rate of the mode-locked laser, a phase-coherent pulsed waveform at a frequency equal to the repetition rate of the mode-locked laser, or a phase-coherent sinusoidal waveform at a frequency equal to half of the repetition rate of the mode-locked laser.

7. 发明授权

US09989749B2 Microscopy system with auto-focus adjustment by low-coherence interferometry 有权
公开(公告)号：US09989749B2
公开(公告)日：2018-06-05
申请号：US15680962
申请日：2017-08-18
申请人： Thorlabs, Inc.
发明人： Alex Cable , Jörn Wollenzin , Ross Johnstone , Kirk Gossage , Jeffrey S. Brooker , Jason Mills , James Jiang , Dierck Hillmann
IPC分类号： G02B21/24 , G02B7/28 , G01B9/02 , G02B21/00 , G02B21/26
CPC分类号： G02B21/245 , G01B9/02059 , G01B9/02063 , G01B9/02077 , G01B9/0209 , G02B7/28 , G02B21/0004 , G02B21/26
摘要： Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

8. 发明授权

US09488820B2 Autofocus system 有权
标题翻译：自动对焦系统
公开(公告)号：US09488820B2
公开(公告)日：2016-11-08
申请号：US14682581
申请日：2015-04-09
申请人： Thorlabs, Inc.
发明人： Alex Ezra Cable , Jeffrey S. Brooker
IPC分类号： G02B7/28 , G02B21/24 , G02B21/06 , G02B21/26 , G02B6/10 , G02B21/36
CPC分类号： G02B21/245 , G02B6/102 , G02B7/28 , G02B21/06 , G02B21/26 , G02B21/361
摘要： An autofocus apparatus is capable of detecting the position of a sample on a microscope. The sample may consist of a specimen mounted between a microscope slide and coverslip or specimens within a well plate. The device tracks the position of a sample by identifying refractive index boundaries through Fresnel reflections. A change in refractive index can correspond to the top and bottom of a coverslip, the top of a slide, the bottom of a well plate or the bottom of a well within a well plate. Using optical coherence tomography (OCT) these reflections are used to form a depth scan of the sample which gives the positions of these surfaces relative to the objective. The device functions as an autofocus system by compensating for any variation of the position of the sample from the focal plane of the objective.
摘要翻译：自动对焦装置能够在显微镜上检测样品的位置。样品可以由安装在显微镜载玻片和盖玻片之间的样品或孔板内的样品组成。器件通过菲涅耳反射识别折射率边界跟踪样品的位置。折射率的变化可以对应于盖玻片的顶部和底部，滑动件的顶部，孔板的底部或孔板中的孔的底部。使用光学相干断层扫描（OCT），这些反射用于形成样品的深度扫描，其给出这些表面相对于物镜的位置。该装置用作自动对焦系统，通过补偿样品与物镜焦平面的位置的任何变化。

9. 发明申请

US20180342847A1 SINUSOIDAL PHASE MODULATION OF MODE-LOCK LASERS 审中-公开
公开(公告)号：US20180342847A1
公开(公告)日：2018-11-29
申请号：US15986518
申请日：2018-05-22
申请人： Thorlabs, Inc.
发明人： Jeffrey S. Brooker , William Radtke , Hongzhou Ma , Eric Lieser
IPC分类号： H01S3/107 , H01S3/11 , H01S3/10 , H03K4/92
摘要： A mode-locked laser comprising circuitry configured to drive an electro-optic modulator (EOM) in the mode-locked laser with a drive waveform, the drive waveform being a phase-coherent sinusoidal waveform at a frequency equal to a repetition rate of the mode-locked laser, a phase-coherent pulsed waveform at a frequency equal to the repetition rate of the mode-locked laser, or a phase-coherent sinusoidal waveform at a frequency equal to half of the repetition rate of the mode-locked laser.

10. 发明申请

US20170343787A1 MICROSCOPY SYSTEM WITH AUTO-FOCUS ADJUSTMENT BY LOW-COHERENCE INTERFEROMETRY 有权
公开(公告)号：US20170343787A1
公开(公告)日：2017-11-30
申请号：US15680962
申请日：2017-08-18
申请人： Thorlabs, Inc.
发明人： Alex CABLE , Jörn Wollenzin , Ross Johnstone , Kirk Gossage , Jeffrey S. Brooker , Jason Mills , James Jiang , Dierck Hillmann
IPC分类号： G02B21/24 , G02B7/28 , G01B9/02 , G02B21/00 , G02B21/26
CPC分类号： G02B21/245 , G01B9/02059 , G01B9/02063 , G01B9/02077 , G01B9/0209 , G02B7/28 , G02B21/0004 , G02B21/26
摘要： Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

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