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    • 3. 发明申请
    • DUAL ENERGY IMAGING SYSTEM
    • 双能量成像系统
    • US20140198899A1
    • 2014-07-17
    • US13739871
    • 2013-01-11
    • Vitaliy ZiskinBoris Oreper
    • Vitaliy ZiskinBoris Oreper
    • G01N23/04
    • G01N23/04G01T1/2985G01V5/0041G01V5/005
    • An inspection system that makes dual energy measurements with a detector array that has selective placement of filter elements adjacent a subset of detectors in the array to provide at least two subsets of detector elements sensitive to X-rays of different energies. Dual energy measurements may be made on objects of interest within an item under inspection by forming a volumetric image using measurements from detectors in a first of the subsets and synthetic readings computed from measurements made with detectors in the array, including those that are filtered. The volumetric image may be used to identify the objects of interest to and source points that, for each object of interest, provide a low interference path to one of the detectors in the second of the subsets. Measurements made with radiation emanating from those source points are used for dual energy analysis of the objects of interest.
    • 一种检测系统,其利用检测器阵列进行双能量测量,所述检测器阵列具有与阵列中的检测器子集相邻的滤波器元件的选择性放置,以提供对不同能量的X射线敏感的检测器元件的至少两个子集。 可以通过使用来自第一子集中的检测器的测量形成体积图像,并且通过阵列中的检测器(包括被过滤的检测器)进行的测量计算的合成读数来形成体积图像,来对被检查物品内的感兴趣对象进行双能量测量。 体积图像可以用于识别感兴趣的对象和源点,对于每个感兴趣对象,在第二个子集中的一个检测器提供低干扰路径。 使用从这些源点发出的辐射进行的测量用于感兴趣对象的双能量分析。