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    • 1. 发明授权
    • Sector array addressing for ECC management
    • ECC管理的扇区阵列寻址
    • US08767440B2
    • 2014-07-01
    • US13892499
    • 2013-05-13
    • Ward ParkinsonThomas Trent
    • Ward ParkinsonThomas Trent
    • G11C11/00
    • G11C13/0033G11C11/22G11C13/0023
    • An addressing scheme for non-volatile memory arrays having short circuit defects that manages the demand for error correction. The scheme generally avoids simultaneous active driving of the row line and column line of the selected cell during write. Instead, only a single row or column line is actively driven at any one time and all other array lines are left floating. In addition, the number of memory cells accessed from a given row or column during a fetch may be limited. The benefits of the scheme include preventing short circuits from drawing excess currents through the array and limiting the frequency of read or write failures caused by short circuits to a manageable number. In one embodiment, the scheme maintains the demand for error correction to within the error correction capability of a flash controller. Exemplary embodiments include phase-change memory arrays.
    • 一种具有管理误差校正需求的短路缺陷的非易失性存储器阵列的寻址方案。 该方案通常避免在写入期间同时主动驱动所选单元的行线和列线。 相反,只有单行或列行在任何一个时间被主动驱动,所有其他的数组行都是浮动的。 此外,可以限制在取出期间从给定的行或列访问的存储器单元的数量。 该方案的优点包括防止短路引起阵列过剩的电流,并将由短路引起的读或写故障的频率限制在可管理的数量上。 在一个实施例中,该方案将对错误校正的需求保持在闪存控制器的纠错能力内。 示例性实施例包括相变存储器阵列。
    • 2. 发明申请
    • Sector Array Addressing for ECC Management
    • ECC管理的扇区阵列寻址
    • US20120069622A1
    • 2012-03-22
    • US12884413
    • 2010-09-17
    • Ward ParkinsonThomas Trent
    • Ward ParkinsonThomas Trent
    • G11C11/22G11C7/00G11C11/00
    • G11C13/0033G11C11/22G11C13/0023
    • An addressing scheme for non-volatile memory arrays having short circuit defects that manages the demand for error correction. The scheme generally avoids simultaneous active driving of the row line and column line of the selected cell during write. Instead, only a single row or column line is actively driven at any one time and all other array lines are left floating. In addition, the number of memory cells accessed from a given row or column during a fetch may be limited. The benefits of the scheme include preventing short circuits from drawing excess currents through the array and limiting the frequency of read or write failures caused by short circuits to a manageable number. In one embodiment, the scheme maintains the demand for error correction to within the error correction capability of a flash controller. Exemplary embodiments include phase-change memory arrays.
    • 一种具有管理误差校正需求的短路缺陷的非易失性存储器阵列的寻址方案。 该方案通常避免在写入期间同时主动驱动所选单元的行线和列线。 相反,只有单行或列行在任何一个时间被主动驱动,所有其他的数组行都是浮动的。 此外,可以限制在取出期间从给定的行或列访问的存储器单元的数量。 该方案的好处包括防止短路引起阵列过剩的电流,并将由短路导致的读或写故障的频率限制在可管理的数量上。 在一个实施例中,该方案将对错误校正的需求保持在闪存控制器的纠错能力内。 示例性实施例包括相变存储器阵列。
    • 3. 发明申请
    • Sector Array Addressing for ECC Management
    • ECC管理的扇区阵列寻址
    • US20130250648A1
    • 2013-09-26
    • US13892499
    • 2013-05-13
    • Ward ParkinsonThomas Trent
    • Ward ParkinsonThomas Trent
    • G11C13/00
    • G11C13/0033G11C11/22G11C13/0023
    • An addressing scheme for non-volatile memory arrays having short circuit defects that manages the demand for error correction. The scheme generally avoids simultaneous active driving of the row line and column line of the selected cell during write. Instead, only a single row or column line is actively driven at any one time and all other array lines are left floating. In addition, the number of memory cells accessed from a given row or column during a fetch may be limited. The benefits of the scheme include preventing short circuits from drawing excess currents through the array and limiting the frequency of read or write failures caused by short circuits to a manageable number. In one embodiment, the scheme maintains the demand for error correction to within the error correction capability of a flash controller. Exemplary embodiments include phase-change memory arrays.
    • 一种具有管理误差校正需求的短路缺陷的非易失性存储器阵列的寻址方案。 该方案通常避免在写入期间同时主动驱动所选单元的行线和列线。 相反,只有单行或列行在任何一个时间被主动驱动,所有其他的数组行都是浮动的。 此外,可以限制在取出期间从给定的行或列访问的存储器单元的数量。 该方案的好处包括防止短路引起阵列过剩的电流,并将由短路导致的读或写故障的频率限制在可管理的数量上。 在一个实施例中,该方案将对错误校正的需求保持在闪存控制器的纠错能力内。 示例性实施例包括相变存储器阵列。
    • 4. 发明授权
    • Sector array addressing for ECC management
    • ECC管理的扇区阵列寻址
    • US08441836B2
    • 2013-05-14
    • US12884413
    • 2010-09-17
    • Ward ParkinsonThomas Trent
    • Ward ParkinsonThomas Trent
    • G11C11/00
    • G11C13/0033G11C11/22G11C13/0023
    • An addressing scheme for non-volatile memory arrays having short circuit defects that manages the demand for error correction. The scheme generally avoids simultaneous active driving of the row line and column line of the selected cell during write. Instead, only a single row or column line is actively driven at any one time and all other array lines are left floating. In addition, the number of memory cells accessed from a given row or column during a fetch may be limited. The benefits of the scheme include preventing short circuits from drawing excess currents through the array and limiting the frequency of read or write failures caused by short circuits to a manageable number. In one embodiment, the scheme maintains the demand for error correction to within the error correction capability of a flash controller. Exemplary embodiments include phase-change memory arrays.
    • 一种具有管理误差校正需求的短路缺陷的非易失性存储器阵列的寻址方案。 该方案通常避免在写入期间同时主动驱动所选单元的行线和列线。 相反,只有单行或列行在任何一个时间被主动驱动,所有其他的数组行都是浮动的。 此外,可以限制在取出期间从给定的行或列访问的存储器单元的数量。 该方案的好处包括防止短路引起阵列过剩的电流,并将由短路导致的读或写故障的频率限制在可管理的数量上。 在一个实施例中,该方案将对错误校正的需求保持在闪存控制器的纠错能力内。 示例性实施例包括相变存储器阵列。