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    • 5. 发明申请
    • Stabilized Proline Transporter
    • 稳定的脯氨酸转运蛋白
    • US20080032386A1
    • 2008-02-07
    • US11629683
    • 2005-06-17
    • Fumihiko OmuraNobuyuki FukuiHiroto Kondo
    • Fumihiko OmuraNobuyuki FukuiHiroto Kondo
    • C07H21/04C07K16/00C12C11/00C12N1/00C12N15/00
    • C07K14/395C12C12/004C12C12/006
    • The present invention relates to a stabilized proline transporter Put4 obtained by gene mutation and a gene encoding the same, as well as a Saccharomyces yeast strain which is obtained by yeast transformation with the gene and is capable of efficiently using proline in a source material such as wort. The stabilized mutated proline transporter Put4 can be used to achieve efficient use of nitrogen sources such as poorly assimilable proline contained in source materials (e.g., wort) for alcohol beverages. Fermentation using yeast capable of taking up a wide variety and large amounts of nitrogen sources facilitates carbon source assimilation and allows improvement of productivity for alcohol beverages. Moreover, the use of poorly assimilable nitrogen sources leads to resource savings and enables environmentally friendly production of alcohol beverages.
    • 本发明涉及通过基因突变获得的稳定的脯氨酸转运蛋白Put4和编码该基因突变的基因,以及通过用该基因进行酵母转化而获得的酵母菌酵母菌株,并且能够有效地使用源材料中的脯氨酸 麦芽汁 稳定的突变脯氨酸转运蛋白Put4可用于实现氮源的有效利用,例如酒精饮料的原料(例如麦芽汁)中所含的不良可同化的脯氨酸。 使用能够吸收多种和大量氮源的酵母的发酵有助于碳源同化,并且可以提高酒精饮料的生产率。 此外,使用不良的可吸收的氮源导致资源节约并且能够环保地生产酒精饮料。
    • 10. 发明授权
    • Axis determination apparatus, film-thickness measurement apparatus, deposition apparatus, axis determination method, and film-thickness measurement method
    • 轴确定装置,膜厚测量装置,沉积装置,轴线确定方法和膜厚测量方法
    • US06753964B2
    • 2004-06-22
    • US10002000
    • 2001-12-05
    • Kai ChenFumihiko OmuraAkihito MinamitsuShizuo Nakamura
    • Kai ChenFumihiko OmuraAkihito MinamitsuShizuo Nakamura
    • G01B1100
    • H01L21/681
    • A film-thickness measurement apparatus of the present invention includes a lifter, a support mount, a light-emitting device, and a light-receiving device. With the center of a wafer staying in alignment with that of the support mount, the lifter places the wafer onto the surface of the support mount to determine the center of the wafer. While the wafer is being rotated about the center of the wafer, the light-emitting device irradiates the circumferential portion of the wafer with a laser beam, thereby allowing the position of a notch to be detected depending on whether or not the laser beam passes through the notch. This makes it possible to detect the positions of the notch and the center of the wafer to determine the center axis line of the surface of the wafer, thereby allowing the coordinates of a given position on the surface of the wafer to be defined in accordance with the center axis line and the center of the wafer. The thickness of the thin film on the surface of the wafer at the predetermined positions can then be determined.
    • 本发明的薄膜厚度测量装置包括升降机,支撑架,发光装置和光接收装置。 随着晶片的中心保持与支撑安装座的中心对准,升降器将晶片放置在支撑座的表面上以确定晶片的中心。 当晶片围绕晶片的中心旋转时,发光器件用激光束照射晶片的圆周部分,从而根据激光束是否通过来检测凹口的位置 缺口 这使得可以检测晶片的凹口和中心的位置以确定晶片的表面的中心轴线,从而允许根据晶片的表面限定晶片表面上的给定位置的坐标 中心轴线和晶圆的中心。 然后可以确定晶片在预定位置的表面上的薄膜的厚度。