会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 10. 发明授权
    • Method and apparatus for high sensitivity particulate detection in infrared detector assemblies
    • 用于红外检测器组件中高灵敏度微粒检测的方法和装置
    • US09476818B1
    • 2016-10-25
    • US14863016
    • 2015-09-23
    • Raytheon Company
    • Chadwick B. MartinRex M. KremerJesse C. Temkin
    • G01N15/14
    • G01J5/043G01J5/044G01J5/061G01J5/522G01J2005/066G01N21/94G01N2021/157
    • A detector assembly includes a dewar chamber having an aperture and an infrared radiation detector. The detector assembly also includes a mirror disposed adjacent the aperture of the dewar chamber, where the mirror has a reflective surface and an emitting region facing the aperture. The infrared radiation detector is configured to detect first radiation and second radiation from the mirror. The first radiation originates from at least one relatively cold surface in the dewar chamber and reflects off the reflective surface of the mirror. The second warm radiation originates from at least one relatively warm surface at or behind the emitting region. The infrared radiation detector is also configured to detect an artifact caused by a particle in the dewar chamber that blocks a portion of the first or second radiation.
    • 检测器组件包括具有孔的杜瓦瓶室和红外辐射检测器。 检测器组件还包括邻近杜瓦瓶室的孔布置的反射镜,其中反射镜具有反射表面和面向孔的发射区域。 红外辐射检测器被配置为检测来自反射镜的第一辐射和第二辐射。 第一辐射源自杜瓦瓶室中的至少一个相对较冷的表面并且反射离开反射镜的反射表面。 第二暖辐射源自发射区域之上或之后的至少一个相对温暖的表面。 红外辐射检测器还被配置为检测由杜瓦瓶室中的颗粒引起的伪影,其阻挡第一或第二辐射的一部分。