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1. 发明申请

US20180156846A1 VOLTAGE SENSOR HOUSING AND ASSEMBLY INCLUDING THE SAME 审中-公开
公开(公告)号：US20180156846A1
公开(公告)日：2018-06-07
申请号：US15875217
申请日：2018-01-19
申请人： EATON CORPORATION
发明人： ABHIJEET VIKRAM KSHIRSAGAR , MARK ALLAN JUDS , GAYATRI SHASHIKANT DHARNE
IPC分类号： G01R19/00 , G01R29/12 , G01R15/16 , G01R1/18
CPC分类号： G01R19/0053 , G01R1/18 , G01R15/16 , G01R15/165 , G01R19/0046 , G01R19/0084 , G01R29/12
摘要： A voltage sensor housing includes a top portion including a conductive top portion composed of conductive material and non-conductive top portions composed of non-conductive material, a bottom portion composed of non-conductive material, side portions composed of non-conductive material, wherein the top portion the bottom portion and the side portions define an interior area structured to hold a voltage sensor, and conductive side portions composed of conductive material and being disposed adjacent to the side portions. The conductive top portion is electrically floating and the conductive side portions are electrically grounded.

2. 发明申请

US20180100876A1 ELECTROMAGNETIC SHIELD FOR TESTING INTEGRATED CIRCUITS 审中-公开
公开(公告)号：US20180100876A1
公开(公告)日：2018-04-12
申请号：US15838550
申请日：2017-12-12
申请人： STMicroelectronics S.r.l.
发明人： Alberto Pagani
IPC分类号： G01R1/18 , G01R31/28 , G01R1/073 , G01R1/067
CPC分类号： G01R1/18 , G01R1/06772 , G01R1/07307 , G01R31/2884 , G01R31/2886
摘要： A probe card includes a number probes. Each probe is adapted to contact a corresponding terminal of a circuit integrated in at least one die of a semiconductor material wafer during a test phase of the wafer. The probes include at least one probe adapted to provide and/or receive a radio frequency test signal to/from the corresponding terminal during the test phase. The probe card further includes at least one electromagnetic shield structure corresponding to the at least one probe adapted to provide and/or receive the radio frequency test signal for the at least partial shielding of an electromagnetic field irradiated by such at least one probe adapted to provide and/or receive the radio frequency test signal.

3. 发明授权

US09915686B2 Voltage sensor housing and assembly including the same 有权
公开(公告)号：US09915686B2
公开(公告)日：2018-03-13
申请号：US14583882
申请日：2014-12-29
申请人： EATON CORPORATION
发明人： Abhijeet Vikram Kshirsagar , Mark Allan Juds , Gayatri Shashikant Dharne
IPC分类号： G01R15/06 , G01R19/00 , G01R1/04 , G01R11/04 , G01R31/28 , G01R33/00 , H02K11/00 , H01L23/49 , G01R15/16 , G01R29/12 , G01R1/18
CPC分类号： G01R19/0053 , G01R1/18 , G01R15/16 , G01R15/165 , G01R19/0046 , G01R19/0084 , G01R29/12
摘要： A voltage sensor housing includes a top portion including a conductive top portion composed of conductive material and non-conductive top portions composed of non-conductive material, a bottom portion composed of non-conductive material, side portions composed of non-conductive material, wherein the top portion the bottom portion and the side portions define an interior area structured to hold a voltage sensor, and conductive side portions composed of conductive material and being disposed adjacent to the side portions. The conductive top portion is electrically floating and the conductive side portions are electrically grounded.

4. 发明申请

US20180031608A1 SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS 审中-公开
公开(公告)号：US20180031608A1
公开(公告)日：2018-02-01
申请号：US15725650
申请日：2017-10-05
申请人： Cascade Microtech, Inc.
发明人： Michael Teich , Karsten Stoll , Walter Matthias Clauss , Swen Schmiedchen
IPC分类号： G01R1/18 , G01R1/44 , G01R1/067
CPC分类号： G01R1/18 , G01N27/42 , G01N31/02 , G01R1/06711 , G01R1/07378 , G01R1/07392 , G01R1/44
摘要： Shielded probe systems are disclosed herein. The shielded probe systems are configured to test a device under test (DUT) and include an enclosure that defines an enclosure volume, a translation stage with a stage surface, a substrate-supporting assembly extending from the stage surface, an electrically conductive shielding structure, an isolation structure, and a thermal shielding structure. The substrate-supporting assembly includes an electrically conductive support surface, which is configured to support a substrate that includes the DUT. The electrically conductive shielding structure defines a shielded volume. The isolation structure electrically isolates the electrically conductive shielding structure from the enclosure and from the translation stage. The thermal shielding structure extends within the enclosure volume and at least partially between the enclosure and the substrate-supporting assembly.

5. 发明申请

US20170292974A1 SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS 有权
公开(公告)号：US20170292974A1
公开(公告)日：2017-10-12
申请号：US15094716
申请日：2016-04-08
申请人： Cascade Microtech, Inc.
发明人： Michael Teich , Karsten Stoll , Walter Matthias Clauss , Swen Schmiedchen
IPC分类号： G01R1/18 , G01R1/44 , G01R1/067
CPC分类号： G01R1/18 , G01N27/42 , G01N31/02 , G01R1/06711 , G01R1/07378 , G01R1/07392 , G01R1/44
摘要： Shielded probe systems are disclosed herein. The shielded probe systems are configured to test a device under test (DUT) and include an enclosure that defines an enclosure volume, a translation stage with a stage surface, a substrate-supporting stack extending from the stage surface, an electrically conductive shielding structure, an isolation structure, and a thermal shielding structure. The substrate-supporting stack includes an electrically conductive support surface and a temperature-controlled chuck. The electrically conductive shielding structure defines a shielded volume. The isolation structure electrically isolates the electrically conductive shielding structure from the enclosure and from the translation stage. The thermal shielding structure extends within the enclosure volume and at least partially between the enclosure and the substrate-supporting stack.

6. 发明申请

US20170285074A1 Integrated Voltage Sensor 审中-公开
公开(公告)号：US20170285074A1
公开(公告)日：2017-10-05
申请号：US15478682
申请日：2017-04-04
申请人： COOPER TECHNOLOGIES COMPANY
发明人： BRIAN ANDREW KORVES , WILLIAM ROBERT LUOMA , PAUL NEWCOMB STOVING , JOSEPH ALLEN CARMICHAEL
IPC分类号： G01R15/14 , H01C17/02 , H01C17/28 , H01C1/02 , H01C1/06
CPC分类号： G01R15/144 , G01R1/18 , G01R1/203 , G01R31/3274 , H01C1/02 , H01C1/06 , H01C17/02
摘要： A resistor assembly can include a resistor having a first end and a second end, and a conductive member, where the conductive member is coupled to the first end of the resistor. The resistor assembly can also include a shield cup and a housing, where the housing includes at least one housing wall having at least one aperture, and where the housing encloses at least a portion of the resistor and at least a portion of the shield cup. A volume of space between the at least one housing wall of the housing and the resistor can be substantially filled with an insulating material and at least the outside of the housing is substantially covered with the insulating material.

7. 发明授权

US09759746B2 Probe module 有权
公开(公告)号：US09759746B2
公开(公告)日：2017-09-12
申请号：US14558558
申请日：2014-12-02
申请人： MPI CORPORATION
发明人： Wei-Cheng Ku , Hao Wei , Shin-Lan Kao
IPC分类号： G01R31/20 , G01R3/00 , G01R1/067 , G01R1/18
CPC分类号： G01R3/00 , G01R1/06772 , G01R1/18
摘要： A probe module, which is provided between a tester and a DUT for transmitting electrical signals therebetween, includes a signal transmitting member, a plurality of probes, a positioning member, and a signal connector. The signal transmitting member has a circuit and two grounding. The probes are electrical connected to the circuit and the groundings of the signal transmitting member. The positioning member is made of an insulating material, and provided on the probes. The signal connector is adapted to be electrically connected to the tester, wherein the signal connector has a signal transmission portion and a grounding portion; the signal transmission portion is electrically connected to the circuit of the signal transmitting member, and the grounding portion is electrically connected to the at least one grounding of the signal transmitting member.

8. 发明授权

US09671455B2 Product testing system for a semiconductor device 有权
公开(公告)号：US09671455B2
公开(公告)日：2017-06-06
申请号：US14322712
申请日：2014-07-02
申请人： FUJITSU LIMITED
发明人： Kenichi Kawasaki
IPC分类号： G01R31/00 , G01R31/28 , G01R1/18 , G01R1/067 , G01R31/317 , G01R31/327
CPC分类号： G01R31/2856 , G01R1/06705 , G01R1/18 , G01R31/001 , G01R31/2801 , G01R31/31721 , G01R31/3277
摘要： A semiconductor device includes: a first circuit; a first power switch provided either between a power supply potential terminal and a power supply potential node of the first circuit or between a reference potential terminal and a reference potential node of the first circuit; a power switch control circuit configured to control a voltage of a control terminal of the first power switch; a test terminal; and a first test control circuit configured to control connection of the test terminal and the control terminal of the first power switch.

9. 发明申请

US20170067938A1 VOLTAGE DETECTING PROBE AND MEASURING DEVICE 审中-公开
标题翻译：电压检测探头和测量装置
公开(公告)号：US20170067938A1
公开(公告)日：2017-03-09
申请号：US15244553
申请日：2016-08-23
申请人： HIOKI DENKI KABUSHIKI KAISHA
发明人： Shin KASAI
IPC分类号： G01R15/06 , G01R15/16
CPC分类号： G01R15/06 , G01R1/06722 , G01R1/06738 , G01R1/06766 , G01R1/06788 , G01R1/07 , G01R1/18 , G01R1/30 , G01R15/12 , G01R15/16 , H01R13/2421
摘要： A voltage detecting probe includes a first shield with an insertion concave formed at a front end; a second shield that has a base end of the first shield inserted thereinto; and a detection electrode formed of a conductive cylindrical member, covered with an insulating covering, and housed inside the first shield. The first shield or detection electrode moves along an axis when an operation lever is moved. When the insulating covering on the front end contacts a measured wire inserted into the insertion concave, the detection electrode and wire become capacitively coupled. The operation lever includes a pillar portion inserted through a guide hole in the second shield and connected to the first shield or detection electrode. A third shield, which is attached to the pillar portion, moves with the operation lever, and shields the guide hole, is disposed inside and/or outside the second shield.
摘要翻译：电压检测探头包括：在前端形成有插入凹槽的第一屏蔽件; 第二屏蔽件，其具有插入其中的第一屏蔽件的基端; 以及由导电圆柱形构件形成的覆盖有绝缘覆盖物并且容纳在第一屏蔽件内的检测电极。当操作杆移动时，第一屏蔽或检测电极沿轴线移动。当前端的绝缘覆盖物接触插入到插入凹部中的测量导线时，检测电极和导线变得电容耦合。操作杆包括插入第二屏蔽件中的引导孔并连接到第一屏蔽或检测电极的柱部分。附接到柱部的第三屏蔽件与操作杆一起移动并遮蔽引导孔，设置在第二屏蔽件的内部和/或外部。

10. 发明申请

US20170067936A1 UNIVERSAL HOLDING APPARATUS 有权
标题翻译：通用控制装置
公开(公告)号：US20170067936A1
公开(公告)日：2017-03-09
申请号：US14844426
申请日：2015-09-03
申请人： Rohde & Schwarz Asia Pte Ltd.
发明人： ChunGuan Tay , Rajashekar Durai , Sheheen Muhamed , CheeShen Lau , Shiwei Pang
IPC分类号： G01R1/04
CPC分类号： G01R1/0408 , G01R1/18
摘要： Universal holding apparatus for holding a device under test, DUT, said universal holding apparatus comprising: a base plate configured to mount at least two DUT holders for holding the device under test each DUT-holder having at least one pad, wherein the at least two DUT-holders are positionable on said base plate to clamp said device under test, DUT, between them, wherein the pad of at least one of said DUT-holders for holding the device under test, DUT, is slidable to adjust a clamping distance between the DUT-holders for engaging said device under test, DUT.
摘要翻译：用于保持被测设备的通用保持装置DUT，所述通用保持装置包括：基板，被配置为安装至少两个DUT保持器，用于保持被测器件，每个DUT保持器具有至少一个焊盘，其中至少两个 DUT保持件可定位在所述基板上，以将被测设备（DUT）夹在其间，其中用于保持被测设备的DUT中的至少一个DUT保持器的焊盘可以被滑动以调整夹持距离用于接合被测器件的DUT保持器。

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