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1. 发明申请

US20190128954A1 METHOD AND TEST SYSTEM FOR PROVIDING ACCURATE ANALOG SIGNALS 审中-公开
公开(公告)号：US20190128954A1
公开(公告)日：2019-05-02
申请号：US16087276
申请日：2016-04-29
申请人： Teradyne, Inc.
发明人： Zai-man Chen , Pei-Lai Zhang
IPC分类号： G01R31/28 , G01R35/00 , G01R31/26 , H01L21/66
CPC分类号： G01R31/2879 , G01R31/00 , G01R31/2601 , G01R31/2834 , G01R35/005 , H01L22/20
摘要： Automatic test equipment with multiple components to generate highly accurate and stable analog test signals and method for operating the test system in semiconductor manufacturing process are disclosed. Output analog signals from existing test systems often fail the stability and accuracy requirement with less than 10 mV variations for testing certain electronic devices, due in part to environmental condition variations such as temperature fluctuations. Traditional compensation mechanisms for temperature variations involve time consuming and disruptive calibration procedures. Disclosed here is a system and method that provides near real-time monitoring and compensation for temperature-induced variations via a digital control mechanism that compensates for environmental variations in a time scale of less than 10 milliseconds and maintains the AC output analog signal with 10 milliVolt accuracy.

2. 发明授权

US09851402B2 Systems and methods mitigating temperature dependence of circuitry in electronic devices 有权
公开(公告)号：US09851402B2
公开(公告)日：2017-12-26
申请号：US13960662
申请日：2013-08-06
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R31/00 , G01R31/319 , G01R31/28 , G01R35/00
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

3. 发明申请

US20170322259A1 LOAD TESTING APPARATUS AND CAP FOR LOAD TESTING APPARATUS 有权
公开(公告)号：US20170322259A1
公开(公告)日：2017-11-09
申请号：US15657574
申请日：2017-07-24
申请人： TATSUMI RYOKI CO., LTD
发明人： Toyoshi KONDO
IPC分类号： G01R31/34 , G01R31/28
CPC分类号： G01R31/34 , G01R31/2879 , G01R31/40
摘要： A load testing apparatus includes: a resistance unit including a plurality of resistors adapted to receive power supply from a test target power source and a wall adapted to hold both ends of each of the plurality of resistors; and a cover attached to a frame holding the resistance unit and adapted to protect the wall and a portion included in a terminal of the resistor and projecting and exposed from the wall. Each of the resistors includes a cap. The cap has an insulation property and is attached to the portion included in the terminal and projecting from the wall. The cover is made of a conductive material. The cap is arranged between the cover and the portion included in the terminal and projecting from the wall.

4. 发明申请

US20170299650A1 WEAR-OUT MONITOR DEVICE 审中-公开
公开(公告)号：US20170299650A1
公开(公告)日：2017-10-19
申请号：US15490584
申请日：2017-04-18
申请人： Analog Devices Global
发明人： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
IPC分类号： G01R31/28 , G01N27/04
CPC分类号： G01R31/2879 , G01R31/2874
摘要： The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

5. 发明授权

US09746520B2 Systems and methods mitigating temperature dependence of circuitry in electronic devices 有权
公开(公告)号：US09746520B2
公开(公告)日：2017-08-29
申请号：US13960566
申请日：2013-08-06
申请人： Jeffrey Allen King
发明人： Jeffrey Allen King
IPC分类号： G01R33/02 , G01R31/319 , G01R31/28 , G01R35/00
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

6. 发明授权

US09588169B1 Live circuit monitoring 有权
标题翻译：现场电路监控
公开(公告)号：US09588169B1
公开(公告)日：2017-03-07
申请号：US15356387
申请日：2016-11-18
申请人： LiveWire Innovation, Inc.
发明人： Lee Arthur Watkins , Niall Michael McNamara
IPC分类号： G01R31/11 , G01R31/02 , G01R31/08 , G01R31/28
CPC分类号： G01R31/11 , G01R19/17 , G01R31/021 , G01R31/025 , G01R31/08 , G01R31/083 , G01R31/085 , G01R31/086 , G01R31/2879
摘要： There are disclosed apparatus and methods for testing a live circuit powered from an alternating current (AC) voltage. A zero crossing detector detects zero crossings of the AC voltage. A spread spectrum time domain reflectometer (SSTDR) coupled to the zero crossing detector performs measurements of the live circuit, each measurement synchronized with a zero crossings of the AC voltage. A processor coupled to the SSTDR detects faults in the live circuit based on correlation data provided by the SSTDR.
摘要翻译：公开了用于测试由交流（AC）电压供电的带电电路的装置和方法。过零检测器检测交流电压的过零点。耦合到过零检测器的扩频时域反射计（SSTDR）执行带电电路的测量，每个测量与交流电压的过零点同步。耦合到SSTDR的处理器根据SSTDR提供的相关数据来检测实时电路中的故障。

7. 发明申请

US20170010322A1 INTEGRATED TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING 有权
标题翻译：集成时间依赖电介质断开可靠性测试
公开(公告)号：US20170010322A1
公开(公告)日：2017-01-12
申请号：US15258535
申请日：2016-09-07
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Jifeng Chen , Dirk Pfeiffer , Thomas M. Shaw , Peilin Song , Franco Stellari
IPC分类号： G01R31/28 , G01R31/311
CPC分类号： G01R31/2855 , G01R31/281 , G01R31/2817 , G01R31/2858 , G01R31/2879 , G01R31/311
摘要： Systems for reliability testing include a picometer configured to measure a leakage current across a device under test (DUT); a camera configured to measure optical emissions from the DUT based on a timing of the measurement of the leakage current; and a test system configured to apply a stress voltage to the DUT and to correlate the leakage current with the optical emissions using a processor to determine a time and location of a defect occurrence within the DUT by locating instances of increased noise in the leakage current that correspond in time with instances of increased optical emissions.
摘要翻译：用于可靠性测试的系统包括配置成测量被测器件（DUT）上的漏电流的波长计; 配置为基于所述泄漏电流的测量的定时来测量来自所述DUT的光发射的照相机; 以及被配置为向DUT施加应力电压并且使用处理器将泄漏电流与光发射相关联的测试系统，以通过定位泄漏电流中增加的噪声的实例来确定DUT内的缺陷发生的时间和位置，在时间上对应于增加的光发射的情况。

8. 发明申请

US20170003342A1 DEVICES AND METHODS FOR TESTING INTEGRATED CIRCUITS 审中-公开
标题翻译：用于测试集成电路的设备和方法
公开(公告)号：US20170003342A1
公开(公告)日：2017-01-05
申请号：US14847236
申请日：2015-09-08
申请人： Intel Corporation
发明人： Han-Yao TSAI
IPC分类号： G01R31/28 , G01R1/04
CPC分类号： G01R31/2887 , G01R1/0433 , G01R31/2879 , G01R31/2884 , G01R31/2886
摘要： An integrated circuit includes a first power unit, a second power unit, and a selection switch. The first power unit generates a first output voltage and is coupled to a first load pin. The first load pin is coupled to a first load. The second power unit generates a second output voltage and is coupled to a second load pin. The second load pin is coupled to a second load. The selection switch outputs either the first output voltage or the second output voltage to a voltage pin according to a selection signal.
摘要翻译：集成电路包括第一功率单元，第二功率单元和选择开关。第一功率单元产生第一输出电压并耦合到第一负载引脚。第一负载销耦合到第一负载。第二功率单元产生第二输出电压并且耦合到第二负载引脚。第二负载销耦合到第二负载。选择开关根据选择信号将第一输出电压或第二输出电压输出到电压引脚。

9. 发明授权

US09423460B2 Systems and methods mitigating temperature dependence of circuitry in electronic devices 有权
公开(公告)号：US09423460B2
公开(公告)日：2016-08-23
申请号：US13960581
申请日：2013-08-06
申请人： Analog Test Engines, Inc.
发明人： Jeffrey Allen King
IPC分类号： G01R31/319 , G01R31/28 , G01R35/00
CPC分类号： G01R31/3191 , G01R31/2879 , G01R35/005
摘要： Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

10. 发明授权

US09411008B2 Method and device for determining test sets of operating parameter values for an electronic component 有权
标题翻译：用于确定电子部件的操作参数值的测试集的方法和装置
公开(公告)号：US09411008B2
公开(公告)日：2016-08-09
申请号：US14495962
申请日：2014-09-25
申请人： Infineon Technologies AG
发明人： Georg Pelz , Thomas Nirmaier
IPC分类号： G01R31/28 , G01R31/26 , H01L21/66
CPC分类号： G01R31/2601 , G01R31/2879 , G01R31/2894 , H01L22/14 , H01L22/20
摘要： A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.
摘要翻译：一种用于确定电子部件的操作参数值的测试集合的方法，所述方法包括：确定第一组中间集合，每个中间集合包含电子部件的第一数量的操作参数的组合; 确定第二组参考集合，其中所述第二集合包含集合的并集，每个集合包括用于各个中间集合的参数的参数值的所有可能组合; 从一组预定义集合中选择具有第二数量的测试集的第三集合，其中每个预定义集合包括来自所述预定参数集的所有参数的参数值的不同组合，使得所述第二集合是每个集合包括相应测试集合的所有参数的第一数量的参数值的所有可能组合。

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