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    • 9. 发明授权
    • Scanning microscope and acousto-optical main beam splitter for a scanning microscope
    • US09933686B2
    • 2018-04-03
    • US14916520
    • 2014-09-03
    • LEICA MICROSYSTEMS CMS GMBH
    • Vishnu Vardhan Krishnamachari
    • G02F1/33G01J3/12G02B21/00G02B27/28G02F1/11
    • G02F1/33G01J3/1256G02B21/0032G02B21/0064G02B21/0068G02B27/283G02F1/116
    • The invention relates to an acousto-optic main beam splitter for a scanning microscope, which is embodied and intended to direct illuminating light having a preselected or preselectable illuminating light wavelength into an illumination beam path for illumination of a sample, and to direct detected light coming from a sample into a detection beam path. The acousto-optic main beam splitter is characterized in that a mechanical wave having an acoustic frequency associated with the illuminating light wavelength propagates, or multiple mechanical waves that have the same acoustic frequency associated with the illuminating light wavelength propagate, in the acousto-optic main beam splitter, both a portion of the detected light bundle having the illuminating light wavelength and a first linear polarization direction, and a portion of the detected light having the illuminating light wavelength and a second linear polarization direction perpendicular to the first linear polarization direction, being deflected out of the detected light bundle coming from a sample by interaction with the one mechanical wave or by interaction with the mechanical waves, and are thereby removed from the detected light bundle; and/or the acousto-optic main beam splitter being embodied to direct, by interaction with the one mechanical wave or by interaction with the mechanical waves, both the portion of illuminating light that has the preselected illuminating light wavelength and a first linear polarization direction, and the portion of illuminating light that has the preselected illuminating light wavelength and a second linear polarization direction that is different from, in particular perpendicular to, the first linear polarization direction, into an illumination beam path for illumination of a sample.